Performance evaluation of double gate III-V heterojunction tunnel FETs with SiO2/HfO2 Gate oxide structure
2017 ◽
Vol 64
(3)
◽
pp. 960-968
◽
Keyword(s):
2018 ◽
Vol 65
(1)
◽
pp. 331-338
◽
Keyword(s):
2017 ◽
Vol 56
(5)
◽
pp. 054201
◽
2016 ◽
Vol 63
(8)
◽
pp. 3291-3299
◽
Keyword(s):