On the Correct Extraction of Interface Trap Density of MOS Devices With High-Mobility Semiconductor Substrates
2008 ◽
Vol 55
(2)
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pp. 547-556
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1999 ◽
Vol 39
(4)
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pp. 497-505
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2007 ◽
Vol 28
(3)
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pp. 232-234
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2018 ◽
Vol 139
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pp. 7-11
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2007 ◽
Vol 259
(2)
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pp. 889-894
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