Sensitivity of Non-Uniform Beams in Depositing Mass Process
This paper deals with the mass deposition influence on the natural frequencies of nonuniform cantilever resonator sensors of linear and parabolic thickness. Resonator sensitivity, defined as fraction of change in frequency per fraction of change in thickness deposition and relative density, was found. A constant thickness mass deposition on all four lateral surfaces of the cantilever of rectangular cross-section was assumed. Euler-Bernoulli theory was used, so only slender beams were considered. Mass deposition on the free end surface of the beams was neglected. The film thickness was considered very small compared to any beam dimension. The film had no contribution to the beam stiffness, only to the mass. Results show that for the same thickness deposition, the sensitivity in the first mode of beams of linear thickness is 2.5 to 3.5 higher when compared to uniform beams. For beams of parabolic thickness variation the relative sensitivity ranges between 1.5 and 2.1.