Direct observations of the growth of sputtered silver and gold films on (111) silicon substrates

1974 ◽  
Vol 11 (1) ◽  
pp. 136-139 ◽  
Author(s):  
J. S. Maa ◽  
J. I. Lee ◽  
Thos. E. Hutchinson
1995 ◽  
Vol 142 (5) ◽  
pp. 1629-1633 ◽  
Author(s):  
Yuval Golan ◽  
Lev Margulis ◽  
Sophie Matlis ◽  
Israel Rubinstein

1976 ◽  
Vol 31 (2) ◽  
pp. 190-195 ◽  
Author(s):  
W. Fischer ◽  
P. Wißmann

Abstract The texture of 400 Å thick gold films was investigated by plotting the intensities obtained with the help of a texture analyser in a pole figure diagramm. The films had been evaporated under UHV conditions on (111)-, (110)-and (100)-oriented silicon substrates.The gold films always show a preferred (111)-orientation. This preferred orientation, however, may manifest itself in a (111) fibre texture or a single crystal structure due to different orientation and heating pretreatment of the substrate. Quantitative statements are given on crystal misorienta-tion and azimuthal alignment. The sixfold symmetry of the pole figures can be traced back to the influence of twin stacking faults.


1976 ◽  
Vol 31 (2) ◽  
pp. 183-189 ◽  
Author(s):  
W. Fischer ◽  
P. Wißmann

Abstract Gold films of 400 Å thickness were evaporated under UHV-conditions on (111)-, (110)-and (100)-oriented silicon substrates and were subsequently investigated by x-ray diffraction. Mainly the influence of orientation and cleanliness of the substrate on film structure was studied.Informations on the orientation and size of the crystallites as well as on lattice distortions were obtained by analysing intensity, angular displacement and width of the diffraction peaks. It is found that the gold films show a preferred (111)-orientation in all cases; only the degree of orienta-tion changes with the pretreatment of the substrate. The size of the (111)-oriented crystallites cor-responds to the film thickness, and a noticeable density of intrinsic stacking faults can be detected.


2006 ◽  
Vol 924 ◽  
Author(s):  
Ye Sun Sun ◽  
T. John Balk

ABSTRACTNanoporous gold (NPG) thin films offer an opportunity to investigate the effects of nanoscale geometric confinement on the mechanical properties of metals. In the present study, NPG films supported by substrates were fabricated by dealloying Au-Ag films on Kapton and silicon. The microstructural evolution of NPG at various stages of dealloying was observed and analyzed by scanning electron microscopy (SEM) and transmission electron microscopy (TEM). Cracking occurred at grain boundaries during dealloying and is believed to result from pre-existing tensile stress in the film. Stress evolution of NPG films on silicon substrates during dealloying was measured with the wafer curvature technique and revealed an overall shift toward compressive stress.


Author(s):  
J. F. DeNatale ◽  
D. G. Howitt

The electron irradiation of silicate glasses containing metal cations produces various types of phase separation and decomposition which includes oxygen bubble formation at intermediate temperatures figure I. The kinetics of bubble formation are too rapid to be accounted for by oxygen diffusion but the behavior is consistent with a cation diffusion mechanism if the amount of oxygen in the bubble is not significantly different from that in the same volume of silicate glass. The formation of oxygen bubbles is often accompanied by precipitation of crystalline phases and/or amorphous phase decomposition in the regions between the bubbles and the detection of differences in oxygen concentration between the bubble and matrix by electron energy loss spectroscopy cannot be discerned (figure 2) even when the bubble occupies the majority of the foil depth.The oxygen bubbles are stable, even in the thin foils, months after irradiation and if van der Waals behavior of the interior gas is assumed an oxygen pressure of about 4000 atmospheres must be sustained for a 100 bubble if the surface tension with the glass matrix is to balance against it at intermediate temperatures.


Author(s):  
L.E. Murr

Ledges in grain boundaries can be identified by their characteristic contrast features (straight, black-white lines) distinct from those of lattice dislocations, for example1,2 [see Fig. 1(a) and (b)]. Simple contrast rules as pointed out by Murr and Venkatesh2, can be established so that ledges may be recognized with come confidence, and the number of ledges per unit length of grain boundary (referred to as the ledge density, m) measured by direct observations in the transmission electron microscope. Such measurements can then give rise to quantitative data which can be used to provide evidence for the influence of ledges on the physical and mechanical properties of materials.It has been shown that ledge density can be systematically altered in some metals by thermo-mechanical treatment3,4.


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