Characterization of orientation-selective-epitaxial CeO2 layers on Si(100) substrates by x-ray diffraction and cross-sectional transmission electron microscopy
2007 ◽
Vol 25
(4)
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pp. 1128-1132
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2012 ◽
Vol 174-177
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pp. 508-511
2008 ◽
pp. 129-147
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2018 ◽
Vol 490
◽
pp. 84-88
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2005 ◽
Vol 23
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pp. 293-296
2005 ◽
Vol 22
(10)
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pp. 2700-2703
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2001 ◽
Vol 16
(10)
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pp. 2805-2809
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1995 ◽
Vol 130
(1)
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pp. 89-103
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