Comparative study on growth characteristics and electrical properties of ZrO2 films grown using pulsed plasma-enhanced chemical vapor deposition and plasma-enhanced atomic layer deposition for oxide thin film transistors
2017 ◽
Vol 35
(3)
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pp. 031510
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2016 ◽
Vol 51
(11)
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pp. 5082-5091
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2016 ◽
Vol 34
(3)
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pp. 892-897
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2014 ◽
Vol 61
(1)
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pp. 73-78
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Keyword(s):
Keyword(s):
2018 ◽
Vol 439
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pp. 632-637
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Keyword(s):
2019 ◽
Vol 16
(12)
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pp. 1900127
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2017 ◽
Vol 9
(27)
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pp. 22676-22684
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1994 ◽
Vol 141
(4)
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pp. 1040-1045
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