Novel Method of Intrinsic Characteristic Extraction in Lightly Doped Drain Metal Oxide Semiconductor Field Effect Transistors for Accurate Device Modeling
2004 ◽
Vol 43
(3)
◽
pp. 918-924
◽
1991 ◽
Vol 30
(Part 2, No. 4A)
◽
pp. L535-L537
◽
1997 ◽
Vol 36
(Part 1, No. 6A)
◽
pp. 3448-3459
◽
1994 ◽
Vol 33
(Part 1, No. 1B)
◽
pp. 606-611
◽
1998 ◽
Vol 16
(2)
◽
pp. 628
◽
2018 ◽
Vol 57
(6S1)
◽
pp. 06HD03
◽
Keyword(s):
2020 ◽
Vol 8
◽
pp. 9-14
◽