Nanoscale Observations on the Degradation Phenomena of Phase-Change Nonvolatile Memory Devices Using Ge2Sb2Te5
2007 ◽
Vol 46
(No. 4)
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pp. L99-L102
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2007 ◽
Vol 254
(1)
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pp. 316-320
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Keyword(s):
2009 ◽
Vol 53
(5)
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pp. 557-561
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Keyword(s):
Keyword(s):
2005 ◽
Vol 26
(7)
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pp. 507-509
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Keyword(s):
2013 ◽
Vol 706-708
◽
pp. 103-107