Nanoscale observations of the operational failure for phase-change-type nonvolatile memory devices using Ge2Sb2Te5 chalcogenide thin films

2007 ◽  
Vol 254 (1) ◽  
pp. 316-320 ◽  
Author(s):  
Sung-Min Yoon ◽  
Kyu-Jeong Choi ◽  
Nam-Yeal Lee ◽  
Seung-Yun Lee ◽  
Young-Sam Park ◽  
...  
2007 ◽  
Vol 46 (No. 4) ◽  
pp. L99-L102 ◽  
Author(s):  
Sung-Min Yoon ◽  
Kyu-Jeong Choi ◽  
Nam-Yeal Lee ◽  
Seung-Yun Lee ◽  
Young-Sam Park ◽  
...  

2020 ◽  
Vol MA2020-02 (23) ◽  
pp. 1684-1684
Author(s):  
Valerio Adinolfi ◽  
Ryan Clarke ◽  
Mario Laudato ◽  
Scott Jewhurst ◽  
Martin McBriarty ◽  
...  

2017 ◽  
Vol 27 (21) ◽  
pp. 1700461 ◽  
Author(s):  
Hyeonggeun Yu ◽  
Ching-Chang Chung ◽  
Nate Shewmon ◽  
Szuheng Ho ◽  
Joshua H. Carpenter ◽  
...  

2015 ◽  
Vol 17 (44) ◽  
pp. 29978-29984 ◽  
Author(s):  
Yanmei Sun ◽  
Fengjuan Miao ◽  
Rui Li ◽  
Dianzhong Wen

Nonvolatile memory devices, based on electrical conductance tuning in thin films of poly(4-vinyl phenol) (PVP) and 2-(4-tert-butylphenyl)-5-(4-biphenylyl)-1,3,4-oxadiazole (PBD) composites, are fabricated.


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