Nanoscale observations of the operational failure for phase-change-type nonvolatile memory devices using Ge2Sb2Te5 chalcogenide thin films
2007 ◽
Vol 254
(1)
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pp. 316-320
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2009 ◽
Vol 53
(5)
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pp. 557-561
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2008 ◽
pp. 75-77
2009 ◽
Vol 48
(4)
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pp. 04C169
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2007 ◽
Vol 46
(No. 4)
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pp. L99-L102
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Keyword(s):
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2017 ◽
Vol 27
(21)
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pp. 1700461
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1998 ◽
Vol 21
(1-4)
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pp. 319-329
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2015 ◽
Vol 17
(44)
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pp. 29978-29984
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