DLTS Study of Room-Temperature Defect Annealing in High-Purity n-Type Si
2008 ◽
Vol 368-372
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pp. 683-685
1976 ◽
Vol 10
(2)
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pp. 189-194
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1990 ◽
Vol 2
(2)
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pp. 273-279
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Keyword(s):
1974 ◽
Vol 96
(4)
◽
pp. 255-260
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Keyword(s):
2016 ◽
Vol 656
◽
pp. 55-66
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2014 ◽
Vol 89
◽
pp. 88-93