X-ray diffraction analysis for thin films of PbTiO3-La2/3TiO3 prepared by the sol-gel method

1994 ◽  
Vol 9 (8) ◽  
pp. 2133-2137 ◽  
Author(s):  
Hideki Yoshioka
Keyword(s):  
Thin Films ◽  
Perovskite Phase ◽  
Sol Gel ◽  
Diffraction Method ◽  
Dip Coating ◽  
X Ray Diffraction ◽  
X Ray ◽  
Coating Methods ◽  
Diffraction Patterns ◽  
System 1

Thin films in the system (1 - x) PbTiO3−xLa2/3TiO3 were prepared by the sol-gel and dip-coating methods. Phases deposited in the films and the lattice parameters as a function of the composition were investigated by the x-ray diffraction method. The solid solutions with a perovskite structure were formed as a single phase with x up to 0.9. For the composition of x = 1.0, metastable La-Ti-O perovskite phase with a small amount of the impurity phase, La2Ti2O7, was obtained. Simulation of x-ray diffraction patterns based on the defect structure model shows that the structure of the La-Ti-O perovskite phase includes randomly distributed cation vacancies at the A-site, namely (La2/3□1/3)TiO3.

Magnetoresistance Effects for the Inhomogeneous Perovskite System of Ag Doped La0.833Na0.167MnO3

2011 ◽  
Vol 110-116 ◽  
pp. 553-558
Author(s):  
Jian Wu
Keyword(s):  
Perovskite Phase ◽  
Inhomogeneous System ◽  
X Ray Diffraction ◽  
Magnetoresistance Effect ◽  
Two Phase ◽  
X Ray ◽  
Magnetoresistance Ratio ◽  
Diffraction Patterns ◽  
System 1 ◽  
Relative Change

The transport properties of the inhomogeneous system (1/4) Ag2O-La0.833Na0.167MnO3(LNMO/Ag) have been systematically studied. X-ray diffraction patterns show that the LNMO/Ag sample is the two-phase composite and consists of a magnetic La0.833Na0.167MnO3(LNMO) perovskite phase and a nonmagnetic Ag metal phase. The resistivity of the sample decreases dramatically with Ag added into the pure perovskite LNMO manganites. For the LNMO/Ag sample, the Curie temperatureTCis 331 ± 2 K and slightly higher than that of the LNMO sample (323 ± 2 K). Due to the dope of Ag metal, the room temperature magnetoresistance effect is enhanced significantly (from 7% for the pure LNMO manganites to 23% for the LNMO/Ag sample under a relative lower field of 0.5 T and from 37.5% for the LNMO sample to 41 % for the LNMO/Ag sample under a high field of 6 T at the temperature of 330 K. In the low temperature regime, the magnetoresistance ratio of the LNMO/Ag sample is smaller than that of the LNMO sample, which is contrary to the magnetoresistance effect in high temperature. The effects are discussed qualitatively by use of a model which is based on the relative change among the intrinsic magnetoresistance effect and the extrinsic magnetoresistance effect.

Crystallization of barium titanate thin films synthesized via sol-gel processing

1995 ◽  
Vol 53 ◽  
pp. 258-259
Author(s):  
M. C. Gust ◽  
N. D. Evans ◽  
M. L. Mecartney
Keyword(s):  
Thin Films ◽  
Barium Titanate ◽  
Sol Gel ◽  
X Ray Diffraction ◽  
Independent Films ◽  
X Ray ◽  
Fine Grained ◽  
Diffraction Patterns ◽  
Gel Processing ◽  
Alkoxide Precursors

Sol-gel processing of oxide thin films offers the potential to generate different microstructures by varying process parameters such as water of hydrolysis, chemical precursor, or substrate. For this work, barium titanate (BaTiO3) thin films were prepared by the sol-gel method in order to try and generate different microstructures for dielectric measurements. However, for BaTiOs prepared using alkoxide precursors, the final microstructures of the films were found to be almost process independent. Films using different precursors, different substrates, and different amounts of water of hydrolysis all showed similar TEM microstructures. All the films after final heat treatment were polycrystalline, nanoporous, and randomly oriented BaTiO3; they were also fine-grained, with an average uniform grain size of 25-50 nm (Fig. 1). This fine-grained microstructure has also been observed in other studies of sol-gel derived BaTiO3 thin films. In addition to BaTiO3, electron diffraction patterns showed the presence of trace amounts of rutile TiO2 that were not observed by x-ray diffraction (XRD).

Thermal Annealing-Activated Crystallinity Metastasis of Al:ZnO Thin Films

2015 ◽  
Vol 1109 ◽  
pp. 181-185 ◽  
Author(s):  
Mohd Firdaus Malek ◽  
Mohamad Hafiz Mamat ◽  
M.Z. Musa ◽  
M. Rusop
Keyword(s):  
Thin Films ◽  
Thermal Annealing ◽  
Annealing Temperature ◽  
Sol Gel ◽  
Xrd Analysis ◽  
Dip Coating ◽  
X Ray Diffraction ◽  
X Ray ◽  
Dip Coating Technique ◽  
Multilayered Thin Films

Multilayered thin films of aluminum-doped ZnO (Al:ZnO) have been deposited by the sol-gel dip coating technique. Experimental results indicated that the thermal annealing temperature affected the crystallinity of the Al:ZnO films. X-ray diffraction (XRD) analysis showed that thin films were preferentially orientated along the c-axis plane. The preferred orientation along (0 0 2) plane becomes more pronounced as the thermal annealing being increased. The film thickness ranges between 180 and 690 nm. In our experiments, the most optimum condition of Al:ZnO annealing temperature was both 500 oC.

BaTiO3 Thin Films Prepared By Dip-Coating Process

1994 ◽  
Vol 341 ◽  
Author(s):  
Nelcy Della ◽  
Santina Mohallem
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
Dip Coating ◽  
Molar Ratio ◽  
X Ray Diffraction ◽  
Titanium Alkoxides ◽  
X Ray ◽  
Withdrawal Speed ◽  
Sol Gel Process ◽  
Tetragonal Batio

AbstractThin films of pure barium titanate have been prepared by the sol-gel process from organomettalic sols containing titanium alkoxides and barium acetate (molar ratio [Ba]/[Ti]=l). It leads to transparent, homogeneous and adherent coatings. The influence of various parameters such as chemical concentration, viscosity, withdrawal speed and temperature of densification on film thickness is described. The films were characterized by X-ray diffraction during their heat treatment. Their crystallization temperature was observed to be around 450°C. No variations in the optical properties were observed during the crystallization, and it occurred without the appearance of cracks or pinholes. Tetragonal BaTiO3 structure was observed, and the ferroeletric properties were investigated as functions of thickness and grain size.

X-ray photoelectron spectroscopy studies of silicon suboxides obtained by the sol-gel method

1997 ◽  
Vol 12 (1) ◽  
pp. 100-105 ◽  
Author(s):  
S. Santucci ◽  
E. Cordeschi ◽  
L. Lozzi ◽  
M. Passacantando ◽  
P. Picozzi ◽  
...  
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Sol Gel ◽  
Dip Coating ◽  
Silicon Substrates ◽  
Ion Sputtering ◽  
X Ray ◽  
Coating Methods ◽  
Spectroscopy Studies ◽  
Compositional Properties

Silicon suboxides thin films obtained by sol-gel and dip-coating methods, starting from a sol containing different percentages of TEOS (tetraethoxysilane) and MTEOS (methyltriethoxysilane), were grown onto silicon substrates. The samples were annealed at 100, 300, and 500 °C, and the electronic and compositional properties of the surface were studied by x-ray photoelectron spectroscopy (XPS) detecting the Si “Auger parameter” and the valence band. The effects produced by an ion-sputtering treatment of the samples were also studied.

Preparation of Perovskite Conductive LaNiO3 Films by Sol-Gel Techniques

2006 ◽  
Vol 933 ◽  
Author(s):  
Pei-Ying Lai ◽  
Jen-Sue Chen
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Raw Materials ◽  
Perovskite Phase ◽  
Sol Gel ◽  
Metallic Thin Films ◽  
X Ray Diffraction ◽  
Electrical Measurements ◽  
Metallic Oxide ◽  
X Ray

ABSTRACTMetallic thin films of LaNiO3 (LNO) have been prepared by the sol-gel method using lanthanum nitrate [La(NO3)3·6H2O] and nickel acetate [Ni(CH3COO)2·4H2O] as raw materials. X-ray diffraction, scanning electron microscopy, X-ray photoelectron spectroscopy, and electrical measurements were used to characterize the multilayer LNO thin films. The perovskite phase appears after annealing at temperatures above 600 °C. LNO thin films are n-type metallic oxide. The lowest resistivity is 621 °Ω-cm after annealing at 600 °C, and the carrier concentration is 6.09×1022/cm3.

Effect of the La3+-Doping Concentration on the Properties of TiO2 Thin Films by Sol-Gel Process

2014 ◽  
Vol 1082 ◽  
pp. 451-454
Author(s):  
Tao Bai ◽  
Shi Gen Zhu
Keyword(s):  
Thin Films ◽  
Doping Concentration ◽  
Sol Gel ◽  
Dip Coating ◽  
Significant Weight Loss ◽  
Titanium Tetraisopropoxide ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sol Gel Process ◽  
Rare Earth La

Various rare earth (La3+) doped titaniumdioxide(TiO2) thin films (La3+-doped TiO2) have been successfully prepared on a glass substrate by a sol–gel dip coating route using titanium tetraisopropoxide and lanthanum chloride as the initial materials. After the La3+-doped TiO2 thin films were calcined at 500°C for 1h, the effect of La3+-doping on the properties of films were investigated using X-ray diffraction (XRD), scanning electron microscopy (SEM) and thermogravimetric- differential scanning calorimeter techniques (TG/DTG). The XRD results showed that all La3+-doped TiO2 thin films contained only a single crystalline phase of anatase TiO2 after calcining at 500°C for 1h. Moreover, the XRD results also revealed that the crystallinity and crystalline size decreased with increased La3+-doping. SEM micrographs showed that all La3+- doped TiO2 thin films have smooth surfaces containing granular nanocrystallines and are without cracks. TG/DTG measurement showed that there was a significant weight loss of the TiO2 precursor calcined in the temperature range from ambient to 660 °C, which was due to the volatilizing of water and organic and the phase transformation.

Highly Oriented Superconducting Bi ‐ Sr ‐ Ca ‐ Cu ‐ Oxide Thin Films by the Solution Sol ‐ Gel Process

1989 ◽  
Vol 169 ◽  
Author(s):  
P. Ravindranathan ◽  
S. Komarneni ◽  
A. S. Bhalla ◽  
R. Roy
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
Superconducting Phase ◽  
Copper Oxides ◽  
X Ray Diffraction ◽  
X Ray ◽  
Spin Casting ◽  
Sol Gel Process ◽  
Diffraction Patterns ◽  
Mgo Substrate

AbstractHighly oriented Bi2Sr2CaCu2O8+x films were prepared on MgO and SrTiO3 substrates by the solution sol ‐ gel (SSG) method. The tetra phasic sol containing bismuth, strontium, calcium and copper oxides was coated on the substrate by spin casting and calcined at 870*C for 10 minutes. X‐ ray diffraction patterns of the films showed the formation of the superconducting phase with preferential orientation along the C‐ axis. The microwave absorbtion data as a funtion of temperature revealed the onset temperature to be 90*K for the film coated on MgO substrate.

Lower crystallization temperature of sol-gel PbTiO3 on Ti/Pt-coated substrates

1999 ◽  
Vol 14 (6) ◽  
pp. 2369-2372 ◽  
Author(s):  
R. E. Avila ◽  
T. P. Velilla ◽  
P. J. Retuert
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Refractive Index ◽  
Sintering Temperature ◽  
Perovskite Phase ◽  
Sol Gel ◽  
Second Phase ◽  
X Ray Diffraction ◽  
Range Analysis ◽  
X Ray

PbTiO3 (PT) thin films have been deposited by sol-gel on Pt/Si, SiO2/Si, Pt/Ti/SiO2/Si, and Ti/Pt/Ti/SiO2/Si and annealed for 45 min in the 400–670 °C range. Analysis by x-ray diffraction (XRD) and spectroscopic ellipsometry shows that the Ti overlayer promotes early crystallization in the tetragonal perovskite phase, reducing the presence of a second phase, tentatively identified as pyrochlore, starting by 450 %C. The refractive index and extinction coefficient (n, k) of the PT film increase rapidly with the sintering temperature in the range of 450–570 °C and saturate by 570 °C to values of n varying from 2.4 to 2.9, and k from 0.03 to 0.3, over the 1.65–2.95 eV range. Most of the increase of n is related to thin film densification.

Determining the C60 molecular arrangement in thin films by means of X-ray diffraction

2011 ◽  
Vol 44 (5) ◽  
pp. 983-990 ◽  
Author(s):  
Chris Elschner ◽  
Alexandr A. Levin ◽  
Lutz Wilde ◽  
Jörg Grenzer ◽  
Christian Schroer ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Information ◽  
Grazing Incidence ◽  
Test Material ◽  
C60 Fullerene ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
X Ray ◽  
Molecular Arrangement ◽  
Diffraction Patterns

The electrical and optical properties of molecular thin films are widely used, for instance in organic electronics, and depend strongly on the molecular arrangement of the organic layers. It is shown here how atomic structural information can be obtained from molecular films without further knowledge of the single-crystal structure. C60 fullerene was chosen as a representative test material. A 250 nm C60 film was investigated by grazing-incidence X-ray diffraction and the data compared with a Bragg–Brentano X-ray diffraction measurement of the corresponding C60 powder. The diffraction patterns of both powder and film were used to calculate the pair distribution function (PDF), which allowed an investigation of the short-range order of the structures. With the help of the PDF, a structure model for the C60 molecular arrangement was determined for both C60 powder and thin film. The results agree very well with a classical whole-pattern fitting approach for the C60 diffraction patterns.

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