Preparation of Perovskite Conductive LaNiO3 Films by Sol-Gel Techniques

Raw Materials ◽

Perovskite Phase ◽

Sol Gel ◽

Metallic Thin Films ◽

X Ray Diffraction ◽

Electrical Measurements ◽

Metallic Oxide ◽

X Ray

ABSTRACTMetallic thin films of LaNiO3 (LNO) have been prepared by the sol-gel method using lanthanum nitrate [La(NO3)3·6H2O] and nickel acetate [Ni(CH3COO)2·4H2O] as raw materials. X-ray diffraction, scanning electron microscopy, X-ray photoelectron spectroscopy, and electrical measurements were used to characterize the multilayer LNO thin films. The perovskite phase appears after annealing at temperatures above 600 °C. LNO thin films are n-type metallic oxide. The lowest resistivity is 621 °Ω-cm after annealing at 600 °C, and the carrier concentration is 6.09×1022/cm3.

Magnetic Properties of Bulk Zn0.95-XMnXFe0.05O2 Prepared by Sol-Gel Method and Subsequent Hot Pressing

10.4028/www.scientific.net/amr.268-270.356 ◽

2011 ◽

Vol 268-270 ◽

pp. 356-359 ◽

Cited By ~ 1

Author(s):

Wen Song Lin ◽

C. H. Wen ◽

Liang He

Keyword(s):

Magnetic Properties ◽

Raw Materials ◽

Sol Gel ◽

Secondary Phase ◽

X Ray Diffraction ◽

Gel Method ◽

X Ray ◽

Sol Gel Method ◽

Doped Zno

Mn, Fe doped ZnO powders (Zn0.95-xMnxFe0.05O2, x≤0.05) were synthesized by an ameliorated sol-gel method, using Zn(CH3COO)2, Mn(CH3COO)2and FeCl2as the raw materials, with the addition of vitamin C as a kind of chemical reducer. The resulting powder was subsequently compacted under pressure of 10 MPa at the temperature of 873K in vacuum. The crystal structure and magnetic properties of Zn0.95-xMnxFe0.05O2powder and bulk samples have been investigated by X-ray diffraction (XRD) and vibrating sample magnetometer (VSM). X-ray photoelectron spectroscopy (XPS) was used to study chemical valence of manganese, iron and zinc in the samples. The x-ray diffraction (XRD) results showed that Zn0.95-xMnxFe0.05O (x≤0.05) samples were single phase with the ZnO-like wurtzite structure. No secondary phase was found in the XRD spectrum. X-ray photoelectron spectroscopy (XPS) showed that Fe and Mn existed in Zn0.95-xMnxFe0.05O2samples in Fe2+and Mn2+states. The results of VSM experiment proved the room temperature ferromagnetic properties (RTFP) of Mn, Fe co-doped ZnO samples.

X-ray diffraction analysis for thin films of PbTiO3-La2/3TiO3 prepared by the sol-gel method

Journal of Materials Research ◽

10.1557/jmr.1994.2133 ◽

1994 ◽

Vol 9 (8) ◽

pp. 2133-2137 ◽

Cited By ~ 6

Author(s):

Hideki Yoshioka

Keyword(s):

Thin Films ◽

Perovskite Phase ◽

Sol Gel ◽

Diffraction Method ◽

Dip Coating ◽

X Ray Diffraction ◽

X Ray ◽

Coating Methods ◽

Diffraction Patterns ◽

System 1

Thin films in the system (1 - x) PbTiO3−xLa2/3TiO3 were prepared by the sol-gel and dip-coating methods. Phases deposited in the films and the lattice parameters as a function of the composition were investigated by the x-ray diffraction method. The solid solutions with a perovskite structure were formed as a single phase with x up to 0.9. For the composition of x = 1.0, metastable La-Ti-O perovskite phase with a small amount of the impurity phase, La2Ti2O7, was obtained. Simulation of x-ray diffraction patterns based on the defect structure model shows that the structure of the La-Ti-O perovskite phase includes randomly distributed cation vacancies at the A-site, namely (La2/3□1/3)TiO3.

Structural, Magnetic and Magneto-tranport Properties of Reactive-sputtered Fe3O4 Thin Films

MRS Proceedings ◽

10.1557/proc-1250-g03-02 ◽

2010 ◽

Vol 1250 ◽

Author(s):

Xinghua Wang ◽

Sarjoosing Goolaup ◽

Peng Ren ◽

Wen Siang Lew

Keyword(s):

Thin Films ◽

Single Phase ◽

Native Oxide ◽

X Ray Diffraction ◽

Verwey Transition ◽

Electrical Measurements ◽

Metal Insulator ◽

X Ray ◽

Sample Measurement

AbstractThin films of magnetite (Fe3O4) are grown on a single-crystal Si/SiO2 (100) substrate with native oxide using DC reactive sputtering technique at room tempreture (RT) and 300C. The x-ray diffraction(XRD) result shows the thermal energy during deposition enhances the crystallization of the Fe3O4 and x-ray photoelectron spectroscopy confirms the film deposited at 300C is single-phase Fe3O4 while the film deposited at RT is mostly ν-Fe2O3. The electrical measurements show that the resistivity of the Fe3O4 film increases exponentially with decreasing temperature, and exhibit a sharp metal-insulator transition at around 100 K, indicating the Verwey transition feature. The saturation magnetization Ms of Fe3O4 film measured by vibrating sample measurement (VSM) at RT was found to be 445 emu/cm3.

Preparation and Electrical Properties of Bi0.9Nd0.1Fe0.925Mn0.075O3 Thin Films

10.4028/www.scientific.net/amr.557-559.1933 ◽

2012 ◽

Vol 557-559 ◽

pp. 1933-1936

Author(s):

Ning Yan ◽

Sheng Hong Yang ◽

Yue Li Zhang

Keyword(s):

Thin Films ◽

Remanent Polarization ◽

Ferroelectric Properties ◽

Sol Gel ◽

X Ray Diffraction ◽

Electrical Measurements ◽

X Ray ◽

Low Leakage ◽

Bifeo3 Thin Films ◽

Low Leakage Current

Pure BiFeO3(BFO) and Bi0.9Nd0.1Fe0.925Mn0.075O3(BNFM) thin films were deposited on Pt(111)/Ti/SiO2/Si substrate by sol-gel method. X-ray diffraction analysis showed that all the films were single perovskite structure and a phase transition appeared in Nd–Mn codoped BiFeO3 thin films. Electrical measurements indicated that the ferroelectric properties of BFO thin films were significantly improved by Nd and Mn codoping. BNFM films exhibit a low leakage current and a good P-E hysteresis loop. The remanent polarization (Pr) value of 74μC/cm2has been obtained in BNFM films, while the coercive field (Ec) is 184kV/cm.

Synthesis & characterization of nanostructure VO2 thin film

Journal of Physics Conference Series ◽

10.1088/1742-6596/2070/1/012098 ◽

2021 ◽

Vol 2070 (1) ◽

pp. 012098

Author(s):

P K Ojha ◽

S K Mishra

Keyword(s):

Thin Films ◽

Vanadium Dioxide ◽

Sol Gel ◽

Cost Effective ◽

Metallic Phase ◽

Strongly Correlated ◽

X Ray Diffraction ◽

X Ray ◽

Sol Gel Process

Abstract Vanadium dioxides are strongly correlated systems which undergo an insulator-metal transition (IMT) from a low-temperature semiconducting phase to a high-temperature metallic phase. Among them, Vanadium dioxide (VO2) undergoes IMT close to room temperature, accompanied by a structural transition resulting change of several orders of magnitude in the electrical and optical properties. Here, we present the synthesis of VO2 by sol-gel process which employs cost-effective precursors to synthesize pure phase of VO2 thin films. The synthesized thin films were characterized using an X-ray diffraction (XRD) to confirm phase purity and high resolution scanning electron microscope (HR-SEM) to study the crystallite and particle size for the synthesized films. The film’s surface was analyzed by X-ray photoelectron spectroscopy (XPS) to determine the valence state and chemical composition of vanadium dioxide.

Properties of SiO2CuOx Films for Nitrogen Dioxide Detection

10.4028/www.scientific.net/amr.834-836.112 ◽

2013 ◽

Vol 834-836 ◽

pp. 112-116 ◽

Cited By ~ 2

Author(s):

Tatiana Myasoedova ◽

G.E. Yalovega ◽

V.V. Petrov ◽

O.V. Zabluda ◽

V.A. Shmatko ◽

...

Keyword(s):

Thin Films ◽

Nitrogen Dioxide ◽

Sol Gel ◽

Structure And Properties ◽

X Ray Diffraction ◽

X Ray ◽

Gel Technique ◽

Operating Temperatures

SiOxCuOythin films were prepared by the deposition on to the Si/SiO2substrates from the alcoholic solutions employing the sol-gel technique. The various analytic techniques were applied to characterize structure and properties of the films under study . The both X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) studies showed the presence CuO as well as CuO2phases and formation of a dual-oxide CuSiO3with the average crystallites sizes of 35-50 nm. The conductance of the films was rather sensitive to the presence of 1-20 ppm NO2concentration at the operating temperatures in the range of 20–200◦C.

Poly(vanadium–molybdenum acid) xerogel thin films fabricated by the sol-gel process and their humidity-sensing properties

Journal of Materials Research ◽

10.1557/jmr.2000.0380 ◽

2000 ◽

Vol 15 (12) ◽

pp. 2653-2657 ◽

Cited By ~ 4

Author(s):

Maosong Tong ◽

Guorui Dai ◽

Yuanda Wu ◽

Xiuli He ◽

Wei Yan ◽

...

Keyword(s):

Thin Films ◽

Thermogravimetric Analysis ◽

Sol Gel ◽

X Ray Diffraction ◽

Humidity Sensing ◽

X Ray ◽

Sensing Properties ◽

Sol Gel Process ◽

Humidity Sensing Properties

Thermogravimetric analysis, x-ray photoelectron spectroscopy, and x-ray diffraction results and the humidity sensing properties of poly(vanadium–molybdenum acid) H2V9.5Mo2.5O32.0 · 8.8H2O xerogel thin films, which were fabricated by the sol-gel process, are described in this paper. The conductance and the capacitance of the thin films strongly depend on the relative humidity. Different electrodes have different influences on the humidity-sensing properties of the thin films.

The Structural and Morphology of (La0.7Sr0.3)MnO3 Thin Films Prepared by Pulsed Laser Deposition

10.4028/www.scientific.net/amr.150-151.908 ◽

2010 ◽

Vol 150-151 ◽

pp. 908-911 ◽

Cited By ~ 1

Author(s):

Wei Rao ◽

Jun Yu

Keyword(s):

Thin Films ◽

Pulsed Laser Deposition ◽

Perovskite Phase ◽

Pulsed Laser ◽

Laser Deposition ◽

X Ray Diffraction ◽

X Ray ◽

Force Microscopy ◽

Atomic Force

(La0.7Sr0.3)MnO3 (LSMO) thin films were prepared on Si (100) substrate by pulsed laser deposition (PLD). Both structure and surface morphology of the films were investigated by X-ray diffraction (XRD) and atomic force microscopy (AFM). Furthermore, the chemical states and chemical composition of the films were determined by X-ray photoelectron spectroscopy (XPS) near the surface. The results indicate that the films grown on Si (100) substrates have a single pseudo cubic perovskite phase structure with a high (100) orientation. The XPS results show that La, Sr and Mn exist mainly in the forms of perovskite structure and a SrO layer was found on outermost surface.

Lower crystallization temperature of sol-gel PbTiO3 on Ti/Pt-coated substrates

Journal of Materials Research ◽

10.1557/jmr.1999.0316 ◽

1999 ◽

Vol 14 (6) ◽

pp. 2369-2372 ◽

Cited By ~ 1

Author(s):

R. E. Avila ◽

T. P. Velilla ◽

P. J. Retuert

Keyword(s):

Thin Film ◽

Thin Films ◽

Refractive Index ◽

Sintering Temperature ◽

Perovskite Phase ◽

Sol Gel ◽

Second Phase ◽

X Ray Diffraction ◽

Range Analysis ◽

X Ray

PbTiO3 (PT) thin films have been deposited by sol-gel on Pt/Si, SiO2/Si, Pt/Ti/SiO2/Si, and Ti/Pt/Ti/SiO2/Si and annealed for 45 min in the 400–670 °C range. Analysis by x-ray diffraction (XRD) and spectroscopic ellipsometry shows that the Ti overlayer promotes early crystallization in the tetragonal perovskite phase, reducing the presence of a second phase, tentatively identified as pyrochlore, starting by 450 %C. The refractive index and extinction coefficient (n, k) of the PT film increase rapidly with the sintering temperature in the range of 450–570 °C and saturate by 570 °C to values of n varying from 2.4 to 2.9, and k from 0.03 to 0.3, over the 1.65–2.95 eV range. Most of the increase of n is related to thin film densification.

X-Ray Photoelectron Spectroscopy of (La0.7Sr0.3)MnO3Thin Films Prepared by Pulsed Laser Deposition

10.4028/www.scientific.net/amr.284-286.2191 ◽

2011 ◽

Vol 284-286 ◽

pp. 2191-2197 ◽

Cited By ~ 2

Author(s):

Hui Fang Xiong ◽

Tie Dong Cheng ◽

X.G. Tang ◽

Jian Chen ◽

Qiu Xiang Liu

Keyword(s):

Thin Films ◽

Pulsed Laser Deposition ◽

Perovskite Phase ◽

Pulsed Laser ◽

Laser Deposition ◽

X Ray Diffraction ◽

X Ray ◽

Force Microscopy ◽

Atomic Force

(La0.7Sr0.3)MnO3 (LSMO) thin films were grown on Si (100) substrate by using pulsed laser deposition (PLD) process. Both structure and surface morphology of the films were investigated by X-ray diffraction (XRD) and atomic force microscopy (AFM). Furthermore, the chemical states and chemical composition of the films were determined by X-ray photoelectron spectroscopy (XPS) near the surface. From XRD, the results indicate that the films grown on Si (100) substrates have a single pseudocubic perovskite phase structure with a high (100) orientation. The XPS results show that La, Sr and Mn exist mainly in the forms of perovskite structure and a SrO layer was found on outermost surface. The films resistivity emeasured under room temperature is 6.4´10-4 W×cm.