scholarly journals Preparation and characterization of SrBi2Nb2O9 thin films made by polymeric precursors

1998 ◽  
Vol 13 (10) ◽  
pp. 2932-2935 ◽  
Author(s):  
S. M. Zanetti ◽  
E. R. Leite ◽  
E. Longo ◽  
J. A. Varela
Keyword(s):  
Thin Films ◽  
Intermediate Phase ◽  
Perovskite Phase ◽  
Incident Angle ◽  
Precursor Solution ◽  
Fluorite Phase ◽  
Polymeric Precursor ◽  
Heat Treated ◽  
Free Grazing

A polymeric precursor solution was employed in preparing SrBi2Nb2O9 (SBN) powder and thin films dip coated onto Si(100) substrate. XRD results show that the SBN perovskite phase forms at temperatures as low as 600 °C through an intermediate fluorite phase. This fluorite phase is observed for samples heat-treated at temperatures of 400 and 500 °C. After heat treatment at temperatures ranging from 300 to 800 °C, thin films were shown to be crack free. Grazing incident angle XRD characterization shows the occurrence of the fluorite intermediate phase for films also. The thickness of films, measured by MEV, was in the order of 80–100 nm.

PREPARATION AND STRUCTURE CHARACTERIZATION OF BiFeO3-SrBi2Nb2O9 THIN FILMS ON SILICON BY SOL-GEL PROCESSING

2002 ◽  
Vol 16 (28n29) ◽  
pp. 4455-4459
Author(s):  
HAOSHUANG GU ◽  
WANQIANG CAO ◽  
JUNMIN XUE ◽  
JOHN WANG
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
Precursor Solution ◽  
Monomethyl Ether ◽  
Structure Characterization ◽  
Layered Perovskite ◽  
Heat Treated ◽  
Average Grain Size ◽  
Gel Processing

A new system 0.1 BiFeO 3-0.9 SrBi 2 Nb 2 O 9 thin films have been successfully prepared by an ethanolamine-modified sol-gel technique. The precursor solution was synthesized from compounds, Bi(NO 3)3· 5H 2 O , Sr(NO 3)2, Fe(NO 3)3· 9H 2 O and Nb(OC 2 H 5)5 in solution ethylene glycol monomethyl ether. The thin films were deposited on Si single crystal by spinning coating, and heat-treated at temperatures ranging from 400°C to 700°C. Crystallization of thin films occurred at about 500 ~ 600°C and the films exhibit a pure phase of layered perovskite ferroelectric structure. The grain of films is well distributed and the average grain size of the film is about 100nm.

Formation of SrBi2Ta2O9: Part I. Synthesis and characterization of a novel “sol-gel” solution for production of ferroelectric SrBi2Ta2O9 thin films

1996 ◽  
Vol 11 (9) ◽  
pp. 2274-2281 ◽  
Author(s):  
Timothy J. Boyle ◽  
Catherine D. Buchheit ◽  
Mark A. Rodriguez ◽  
Husam N. Al-Shareef ◽  
Bernadette A. Hernandez ◽  
...  
Keyword(s):  
Thin Films ◽  
Perovskite Phase ◽  
Sol Gel ◽  
Hysteresis Loops ◽  
Precursor Solution ◽  
Analytical Techniques ◽  
Layered Perovskite ◽  
Solution Preparation ◽  
The Individual

We have developed a simple and rapid method for the synthesis of a precursor solution used in the production of SBT powders and thin films of the layered-perovskite phase SrBi2Ta2O9 (SBT). Precursor solution preparation takes less than 30 min and involves the generation of two solutions: (a) Bi(O2CMe)3 dissolved in pyridine and (b) Ta(OCH2Me)5 added to Sr(O2CMe)2 and then solubilized by HO2CMe. After stirring separately for 10 min, these solutions are combined, stirred for an additional 10 min, and used without any further modifications. The individual solutions and ternary mixture were studied using a variety of analytical techniques. Films of the layered-perovskite phase were formed at temperatures as low as 700 °C. Ferroelectric testing of SBT films, fired at 750 °C, reveals standard hysteresis loops with no fatigue for up to 4 × 109 cycles.

Characterization and Dissolution Behavior in a Physiological Solution of Heat-Treated CaTiO3 Thin Films with Different Thicknesses

2007 ◽  
Vol 127 ◽  
pp. 209-214
Author(s):  
Naofumi Ohtsu ◽  
Kesami Saito ◽  
Katsuhiko Asami ◽  
Takao Hanawa ◽  
Hisamichi Kimura
Keyword(s):  
Thin Films ◽  
Heat Treatment ◽  
Incident Angle ◽  
Titanium Substrate ◽  
Physiological Solution ◽  
Dissolution Behavior ◽  
Nacl Solution ◽  
Heat Treated ◽  
Perovskite Type

Characterization of heat-treated CaTiO3 thin films of 10, 20, 30 and 50 nm in thickness and their change after immersion in a simulated body fluid were investigated by grazing incident angle X-ray diffractometry and Auger electron spectroscopy (AES). The CaTiO3 films were prepared on titanium substrate by sputter-deposition of CaTiO3 target followed by heating in an electric furnace at 873 K in air for 7.2 ks. The CaTiO3 films were immersed in 0.8% NaCl solution for 14 d. All the films before heat treatment were non-crystallized films and after heat treatment, only the 50-nm film was crystallized to perovskite-type CaTiO3. In AES in-depth profiles after heating, Ca diffusion was not observed in the 50-nm film, whereas Ca diffusion toward the Ti substrate was observed in the 10-, 20- and 30-nm films. After immersion for 14 d, the vicinity of surface of the 10, 20 and 30 nm thick CaTiO3 films were dissolved into the NaCl solution, while the 50-nm thick CaTiO3 film was scarcely dissolved. Since dissolution from biomaterials in a human body has possibility to harm, the CaTiO3 film should be deposited more than 50 nm in thickness and heat-treated at 873 K.

Al Doped Ta2O5 Thin Films for Microelectronic Applications

2000 ◽  
Vol 654 ◽  
Author(s):  
P. C Joshi ◽  
M. W. Cole ◽  
C. W. Hubbard ◽  
E. Ngo
Keyword(s):  
Thin Films ◽  
Precursor Solution ◽  
Electrical Measurements ◽  
Cross Sectional ◽  
Solution Deposition ◽  
Atomic Force ◽  
The Stability ◽  
Insulating Properties ◽  
Post Deposition

AbstractIn this paper, we report on the fabrication and characterization of pure and Al doped Ta2O5 thin films fabricated by metalorganic solution deposition (MOSD) technique. The pure and Aldoped Ta2O5 thin films were fabricated by spin-coating technique using room temperature processed carboxylate-alkoxide precursor solution. The structure of the films was analyzed by xray diffraction (XRD). The surface and cross-sectional morphology of the films were examined by field emission scanning electron microscope (FESEM) and atomic force microscope (AFM). The electrical measurements were conducted on films in MIM configuration using Pt as the top and bottom electrode. The effects of Al concentration and the post-deposition annealing temperature on the structural, dielectric, and insulating properties were analyzed. The effects of the applied bias and the measurement temperature on the dielectric and insulating properties were also analyzed to establish the stability and reliability of Al doped Ta2O5 thin films.

Synthesis and Characterization of Sr3MgSi2O8:Eu2+, Dy3+ Phosphor Prepared by a Chemical Solution Method

2011 ◽  
Vol 675-677 ◽  
pp. 1089-1092 ◽  
Author(s):  
Wen Pan ◽  
Ning Hui Wang ◽  
Guo Feng Li ◽  
Gui Ling Ning
Keyword(s):  
Solution Method ◽  
Intermediate Phase ◽  
Precursor Solution ◽  
X Ray Diffraction ◽  
Calcination Process ◽  
Chemical Solution Method ◽  
Transmission Electron ◽  
Dispersion Media ◽  
Better Than

A novel synthesis route for the production of Sr3MgSi2O8:Eu2+,Dy3+ sub-micron quasisphere phosphor powder is reported. Both the host and activator cations were co-precipitated in water-ethanol mixed solutions and precipitation was performed with analytical grade ammonium citratetribasic. As the dispersion media, optimum concentration for PEG in the precursor solution is determined to be 0.08 g/mL. X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscope (TEM) and fluorescence spectrophotometer were employed to characterize the phosphor. The effect of the calcining temperature on the crystalline particle and luminescence properties of Sr3MgSi2O8:Eu2+,Dy3+ is systematically discussed. Sr3MgSi2O8:Eu2+,Dy3+ single phased quasi-sphere phosphor was achieved by calcining the asprecipitated precursor at 1100°C. Sr2SiO4 was identified as the intermediate phase during the calcination process. Despite the small particle size, the emission intensities were higher by the present method. However, the afterglow characteristic was not better than that prepared by solidstate reaction in the comparable condition.

Quantitative chemical analysis of fluorite-to-perovskite transformations in (Pb,La)(Zr,Ti)O3 PLZT thin films

2008 ◽  
Vol 23 (11) ◽  
pp. 2944-2953 ◽  
Author(s):  
Chad M. Parish ◽  
Geoff L. Brennecka ◽  
Bruce A. Tuttle ◽  
Luke N. Brewer
Keyword(s):  
Thin Films ◽  
Single Phase ◽  
Perovskite Phase ◽  
Scanning Transmission Electron Microscope ◽  
Fluorite Phase ◽  
Quantitative Chemical Analysis ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Before And After ◽  
Plzt Thin Films

Lead loss during processing of solution-derived Pb(Zr,Ti)O3 (PZT)-based thin-films can result in the formation of a Pb-deficient, nonferroelectric fluorite phase that is detrimental to dielectric properties. It has recently been shown that this nonferroelectric fluorite phase can be converted to the desired perovskite phase by postcrystallization treatment. Here, quantitative standard-based energy-dispersive x-ray spectrometry (EDS) in a scanning transmission electron microscope (STEM) is used to study cation distribution before and after this fluorite-to-perovskite transformation. Single-phase perovskite PbZr0.53Ti0.47O3 (PZT 53/47) and Pb0.88La0.12Zr0.68Ti0.29O3 (PLZT 12/70/30) specimens that underwent this treatment were found to be chemically indistinguishable from the perovskite present in the multiphase specimens prior to the fluorite-to-perovskite transformation. Significant Zr–Ti segregation is found in PLZT 12/70/30, but not in PZT 53/47. Slight La-segregation was seen in rapidly crystallized PLZT, but not in more slowly crystallized PLZT.

The Influence of Precursor on the Microstructure and Characterization for Sr0.5Ba0.5Bi4Ti4O15 Thin Films

2007 ◽  
Vol 336-338 ◽  
pp. 136-139
Author(s):  
Dan Xie ◽  
Wei Pan ◽  
Tian Ling Ren ◽  
Li Tian Liu ◽  
Zhi Min Dang
Keyword(s):  
Thin Films ◽  
Ph Value ◽  
Sol Gel ◽  
Precursor Solution ◽  
Layered Perovskite ◽  
Layered Perovskite Structure ◽  
Gel Technique ◽  
The Stability

The uniform Sr0.5Ba0.5Bi4Ti4O15 thin films were prepared using a modified Sol-Gel technique and the influence of precursor on the microstructure and characterization of thin films were studied. The stability and uniformity of precursor solution is key issue for the quality of thin films. Ethanolamine is an effective complexation reagent of Bi3+, which could moderate the acidity of precursor. When pH value and concentration of precursor solution was about 3.5 and 0.35M respectively, the smooth and uniform Sr0.5Ba0.5Bi4Ti4O15 thin films could be obtained. The Bi-layered perovskite structure of Sr0.5Ba0.5Bi4Ti4O15 formed at 750°C. The morphology of the grains in Sr0.5Ba0.5Bi4Ti4O15 thin films was elliptoid and the grain size was about 90 ~ 100 nm.

Mössbauer Spectra of 57Fe-Enriched BiFeO3 Thin Films Fabricated on SiO2/Si Substrates by Chemical Solution Deposition Process

2013 ◽  
Vol 582 ◽  
pp. 63-66 ◽  
Author(s):  
Kiyotaka Tanaka ◽  
Yoshinori Tsukamoto ◽  
Soichiro Okamura ◽  
Yutaka Yoshida
Keyword(s):  
Thin Films ◽  
Chemical Solution Deposition ◽  
Perovskite Phase ◽  
Precursor Solution ◽  
Deposition Process ◽  
Molar Ratio ◽  
Chemical Solution ◽  
Solution Deposition ◽  
Si Substrates ◽  
Mixture Phase

sup>57Fe-enriched BiFeO3 (BFO) thin films were fabricated on SiO2/Si substrates from a stoichiometric precursor solution by chemical solution deposition process. The Bi/Fe molar ratio of the thin films decreased from 0.95 to 0.80 with increase in the sintering temperature. A perovskite phase and flat surface were obtained in the BFO thin films sintered at 500 and 600 °C. However, the 57Fe Mössbauer spectra showed a mixture phase due to amorphous and/or Bi2Fe4O9 phases in the BFO thin films. The valence state of Fe ions of the BFO thin films was confirmed to be only Fe3+ by the Mössbauer spectra.

Influence of Mg on the Structural and Optical Properties of LiNbO3 Thin Films Grown by Polymeric Precursor Method

2005 ◽  
Vol 498-499 ◽  
pp. 342-349
Author(s):  
A.Z. Simões ◽  
V. Bouquet ◽  
F. Moura ◽  
A. Ries ◽  
M.A. Zaghete ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Precursor Solution ◽  
Polymeric Precursor ◽  
X Ray Diffraction ◽  
Oriented Growth ◽  
Precursor Method ◽  
Diffraction Patterns ◽  
Mg Doped ◽  
Magnesium Addition

A polymeric precursor solution was used to deposit pure and Mg doped LiNbO3 thin films on sapphire substrates by spin-coating. The effects of magnesium addition on crystallinity, morphology and optical properties of the annealed films were investigated. X-ray diffraction patterns indicate the oriented growth of the films. Phi-scan diffraction evidenced the epitaxial growth with two in-plane variants. AFM studies show that the films are very homogeneous, dense and present smooth surfaces. The refractive index and optical losses obtained by the prism coupling method were influenced by the magnesium addition.

Sign in / Sign up

Export Citation Format

Share Document