Face-centered-cubic titanium: An artifact in titanium/aluminum multilayers
1999 ◽
Vol 14
(5)
◽
pp. 1977-1981
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Keyword(s):
The present investigation is the first comprehensive comparative study of x-ray diffraction (XRD) and transmission electron microscopy (TEM) results to address the important issue of fcc Ti formation in nanoscale multilayers. Ti/Al multilayers with 7.2 and 5.2 nm composition modulation wavelengths were studied by reflection and transmission XRD as well as transmission electron diffraction (ED), high-resolution TEM, and energy-filtered TEM. Previous reports have claimed deposition of fcc Ti in multilayer systems. Our results demonstrate that the Ti in Ti/Al multilayers deposits in the hcp form and that fcc Ti is merely an artifact of producing specimens for cross-sectional TEM.
Keyword(s):
1995 ◽
Vol 10
(6)
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pp. 1546-1554
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2010 ◽
Vol 97-101
◽
pp. 19-22
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2010 ◽
Vol 178
◽
pp. 291-295
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2005 ◽
Vol 04
(05n06)
◽
pp. 1011-1020