Microstructure and Tribological Behavior of Cr-DLC Nanocomposite Films

2001 ◽  
Vol 697 ◽  
Author(s):  
V. Singh ◽  
J.C. Jiang ◽  
E.I. Meletis
Keyword(s):  
Nanocomposite Films ◽  
Face Centered Cubic ◽  
Cr Content ◽  
Transmission Electron ◽  
Diamondlike Carbon ◽  
High Resolution Tem ◽  
Pin On Disc ◽  
The Coefficient Of Friction ◽  
High Bias ◽  
Face Centered

AbstractCr-diamondlike carbon (Cr-DLC) nanocomposite films with the Cr content varying up to 27 at. % were synthesized by reactive magnetron sputtering. Their microstructure and tribological properties were studied using transmission electron microscopy (TEM) and pin-on-disc experiments, respectively. Electron diffraction and high- resolution TEM studies show that the films, with ∼ 9 at. % Cr, deposited using low (−200 V) and high (−1000 V) specimen bias during processing are composed of nanocrystalline metallic Cr and face-centered cubic chromium carbide, respectively surrounded by an amorphous matrix. The Cr-DLC film deposited at high bias exhibited enhanced adhesion to Si substrate and wear resistance compared to those deposited at low bias with the same Cr content. Wear rate of the films deposited at high bias is relatively independent of Cr content up to about 10 at. % (of the order of 10−7 mm3/N-m) and then increases with increasing Cr content. The coefficient of friction for the films with a Cr content less than 19 at. % is low and remains between 0.1-0.16.

Face-centered-cubic titanium: An artifact in titanium/aluminum multilayers

1999 ◽  
Vol 14 (5) ◽  
pp. 1977-1981 ◽  
Author(s):  
J. Bonevich ◽  
D. van Heerden ◽  
D. Josell
Keyword(s):  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
Cross Sectional ◽  
Reflection And Transmission ◽  
Multilayer Systems ◽  
Composition Modulation ◽  
Transmission Electron ◽  
Titanium Aluminum ◽  
High Resolution Tem ◽  
Face Centered

The present investigation is the first comprehensive comparative study of x-ray diffraction (XRD) and transmission electron microscopy (TEM) results to address the important issue of fcc Ti formation in nanoscale multilayers. Ti/Al multilayers with 7.2 and 5.2 nm composition modulation wavelengths were studied by reflection and transmission XRD as well as transmission electron diffraction (ED), high-resolution TEM, and energy-filtered TEM. Previous reports have claimed deposition of fcc Ti in multilayer systems. Our results demonstrate that the Ti in Ti/Al multilayers deposits in the hcp form and that fcc Ti is merely an artifact of producing specimens for cross-sectional TEM.

scholarly journals Diffraction studies on Ni–Co and Ni–Cr alloy thin films

1991 ◽  
Vol 6 (4) ◽  
pp. 749-754 ◽  
Author(s):  
A.R. Sethuraman ◽  
R.J. De Angelis ◽  
P.J. Reucroft
Keyword(s):  
Amorphous Structure ◽  
Face Centered Cubic ◽  
Limited Information ◽  
X Ray Diffraction ◽  
Tem Analysis ◽  
Alloy Films ◽  
X Ray ◽  
Cr Content ◽  
Transmission Electron ◽  
Face Centered

Alloy films of Ni–Co and Ni–Cr of compositional ratios 1:1, 1:3, and 3:1 deposited by vapor deposition were studied by Transmission Electron Microscopy (TEM) and X-Ray Diffraction (XRD). Results of TEM analysis on the Ni–Co alloy films indicated that the films were face-centered cubic (fcc) in structure. XRD results confirmed the TEM observations. TEM analysis of Ni–Cr alloy films showed that the films were body-centered cubic (bcc) in structure. With increase in the Cr content more than 25%, the material contained a higher fraction of an amorphous phase. XRD studies provide limited information owing to the quasi-amorphous structure of the films of high Cr content.

Faceted antiphase boundaries in GaAs grown on Ge

1987 ◽  
Vol 45 ◽  
pp. 314-315
Author(s):  
N.-H. Cho ◽  
S. McKernan ◽  
C.B. Carter ◽  
K. Wagner
Keyword(s):  
Cross Section ◽  
Atomic Resolution ◽  
Face Centered Cubic ◽  
Electrical Behavior ◽  
Sphalerite Structure ◽  
Antiphase Boundaries ◽  
Transmission Electron ◽  
Face Centered ◽  
Quality Material ◽  
Simulated Images

Interest has recently increased in the possibility of growing III-V compounds epitactically on non-polar substrates to produce device quality material. Antiphase boundaries (APBs) may then develop in the GaAs epilayer because it has sphalerite structure (face-centered cubic with a two-atom basis). This planar defect may then influence the electrical behavior of the GaAs epilayer. The orientation of APBs and their propagation into GaAs epilayers have been investigated experimentally using both flat-on and cross-section transmission electron microscope techniques. APBs parallel to (110) plane have been viewed at the atomic resolution and compared to simulated images.Antiphase boundaries were observed in GaAs epilayers grown on (001) Ge substrates. In the image shown in Fig.1, which was obtained from a flat-on sample, the (110) APB planes can be seen end-on; the faceted APB is visible because of the stacking fault-like fringes arising from a lattice translation at this interface.

Microstructure Characterization of Ag Nanoparticles Prepared by Hydrothermal Method

2012 ◽  
Vol 476-478 ◽  
pp. 1138-1141
Author(s):  
Zhi Qiang Wei ◽  
Qiang Wei ◽  
Li Gang Liu ◽  
Hua Yang ◽  
Xiao Juan Wu
Keyword(s):  
Crystal Structure ◽  
Particle Size ◽  
Hydrothermal Method ◽  
Ag Nanoparticles ◽  
Average Particle Size ◽  
Average Particle ◽  
Face Centered Cubic ◽  
Selected Area Electron Diffraction ◽  
Transmission Electron ◽  
Face Centered

Ag nanoparticles were successfully synthesized by hydrothermal method under the polyol system combined with traces of sodium chloride, Silver nitrate(AgNO3) and polyvinylpyrrolidone (PVP) acted as the silver source and dispersant respectively. The samples by this process were characterized via X-ray powder diffraction (XRD), Brunauer–Emmett–Teller (BET) adsorption equation, transmission electron microscopy (TEM) and the corresponding selected area electron diffraction (SAED) to determine the chemical composition, particle size, crystal structure and morphology. The experiment results indicate that the crystal structure of the samples is face centered cubic (FCC) structure as same as the bulk materials, The specific surface area is 24 m2/g, the particle size distribution ranging from10 to 50 nm, with an average particle size about 26 nm obtained by TEM and confirmed by XRD and BET results.

scholarly journals In-Situ TEM Annealing Observation of Helium Bubble Evolution in Pre-Irradiated FeCoNiCrTi0.2 Alloys

Materials ◽  
2021 ◽  
Vol 14 (13) ◽  
pp. 3727
Author(s):  
Huanhuan He ◽  
Zhiwei Lin ◽  
Shengming Jiang ◽  
Xiaotian Hu ◽  
Jian Zhang ◽  
...  
Keyword(s):  
Vacuum Arc ◽  
In Situ Tem ◽  
Face Centered Cubic ◽  
Helium Bubble ◽  
High Entropy ◽  
Helium Bubbles ◽  
Transmission Electron ◽  
Bubble Evolution ◽  
Face Centered

The FeCoNiCrTi0.2 high-entropy alloys fabricated by vacuum arc melting method, and the annealed pristine material, are face centered cubic structures with coherent γ’ precipitation. Samples were irradiated with 50 keV He+ ions to a fluence of 2 × 1016 ions/cm2 at 723 K, and an in situ annealing experiment was carried out to monitor the evolution of helium bubbles during heating to 823 and 923 K. The pristine structure of FeCoNiCrTi0.2 samples and the evolution of helium bubbles during in situ annealing were both characterized by transmission electron microscopy. The annealing temperature and annealing time affect the process of helium bubbles evolution and formation. Meanwhile, the grain boundaries act as sinks to accumulate helium bubbles. However, the precipitation phase seems have few effects on the helium bubble evolution, which may be due to the coherent interface and same structure of γ’ precipitation and matrix.

scholarly journals The Examination of Calcium ion Implanted Alumina with Energy Filtered Transmission Electron Microscopy

1997 ◽  
Vol 3 (S2) ◽  
pp. 413-414
Author(s):  
E.M. Hunt ◽  
J.M. Hampikian ◽  
N.D. Evans
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Pure Aluminum ◽  
Lattice Parameter ◽  
Face Centered Cubic ◽  
Ion Channeling ◽  
Transmission Electron ◽  
Knoop Microhardness ◽  
Aluminum Nanocrystals ◽  
Face Centered

Ion implantation can be used to alter the optical response of insulators through the formation of embedded nano-sized particles. Single crystal alumina has been implanted at ambient temperature with 50 keV Ca+ to a fluence of 5 x 1016 ions/cm2. Ion channeling, Knoop microhardness measurements, and transmission electron microscopy (TEM) indicate that the alumina surface layer was amorphized by the implant. TEM also revealed nano-sized crystals ≈7 - 8 nm in diameter as seen in Figure 1. These nanocrystals are randomly oriented, and exhibit a face-centered cubic structure (FCC) with a lattice parameter of 0.409 nm ± 0.002 nm. The similarity between this crystallography and that of pure aluminum (which is FCC with a lattice parameter of 0.404 nm) suggests that they are metallic aluminum nanocrystals with a slightly dilated lattice parameter, possibly due to the incorporation of a small amount of calcium.Energy-filtered transmission electron microscopy (EFTEM) provides an avenue by which to confirm the metallic nature of the aluminum involved in the nanocrystals.

Self-Organized Lead(II) Sulfide Quantum Dots Superlattice

MRS Advances ◽  
2017 ◽  
Vol 2 (15) ◽  
pp. 841-846 ◽  
Author(s):  
José Maria C. da Silva Filho ◽  
Victor A. Ermakov ◽  
Luiz G. Bonato ◽  
Ana F. Nogueira ◽  
Francisco C. Marques
Keyword(s):  
Quantum Dots ◽  
Interplanar Spacing ◽  
Face Centered Cubic ◽  
X Ray ◽  
Self Organized ◽  
Transmission Electron ◽  
The Mean ◽  
Face Centered ◽  
Pbs Quantum Dots ◽  
Deposited Films

ABSTRACTWe show that superlattice (SL) of PbS quantum dots (QD) can be easily prepared by drop casting of colloidal QD solution onto glass substrate and the ordering level can be controlled by the substrate temperature. A QD solution was dropped on glass and dried at 25, 40, 70 and 100°C resulting in formation of different SL structures. X-ray diffractograms (XRD) of deposited films show a set of sharp and intense peaks that are higher order satellites of a unique peak at 1.8 degrees (two theta), which corresponds, using the Bragg’s Law, to an interplanar spacing of 5.3 nm. The mean particles diameter, calculated through the broadening of the (111) peak of PbS using the Scherrer’s formula, were in agreement with the interplanar spacing. Transmission electron microscopy (TEM) measurements were also used to study the SL structure, which showed mainly a face centered cubic (FCC) arrangement of the QD. The photoluminescence (PL) spectrum of QD in the SL showed a shift toward lower energy compared to one in solution. It can be attributed to the fluorescence resonant energy transfer (FRET) between neighbors QD´s. Moreover, we observed greater redshift of PL peak for film with lower drying temperature, suggesting that it has a more organized structure.

scholarly journals Green Synthesis of Silver Nanoparticles using Salacca zalacca Extract as Reducing Agent and It’s Antibacterial Activity

2019 ◽  
Vol 31 (12) ◽  
pp. 2804-2810
Author(s):  
Anti Kolonial Prodjosantoso ◽  
Oktanio Sigit Prawoko ◽  
Maximus Pranjoto Utomo ◽  
Lis Permana Sari
Keyword(s):  
Escherichia Coli ◽  
Silver Nanoparticles ◽  
Antibacterial Activity ◽  
Staphylococcus Epidermidis ◽  
Silver Ions ◽  
Reduction Reaction ◽  
Face Centered Cubic ◽  
Gram Positive Bacteria ◽  
Transmission Electron ◽  
Face Centered

In this article, the synthesis of silver nanoparticles through a reduction reaction process using Salacca zalacca extract is reported. The AgNPs were characterized using X-ray diffraction, transmission electron microscopy, Fourier transform infrared and UV-visible spectrophotometry methods. The AgNPs antibacterial activity was determined against of Gram-positive bacteria (Staphylococcus epidermidis) and Gram-negative bacteria (Escherichia coli). The main functional groups contained in Salacca zalacca extract are carbonyl, hydroxyl and nitrile groups, which are believed to reduce the silver ions to metal. The surface plasmon resonance values of brownish red AgNPs are in the range of 410 nm to 460 nm. The structure of AgNPs is face centered cubic (FCC). The diameter of silver nanoparticles crystallite is 14.2 ± 2.6 nm. The AgNPs growth inhibition zones of Escherichia coli and Staphylococcus epidermidis are 9.6 mm and 9.2 mm, respectively.

Effect of Annealing Conditions on Microstructure Evolution of NiMnFeGa Shape Memory Thin Film

2010 ◽  
Vol 150-151 ◽  
pp. 1745-1749
Author(s):  
Hai Bo Wang ◽  
Li Ma ◽  
Wei Cai
Keyword(s):  
Thin Film ◽  
Shape Memory ◽  
Microstructure Evolution ◽  
Face Centered Cubic ◽  
Free Standing ◽  
Annealing Conditions ◽  
Selected Area Electron Diffraction ◽  
Transmission Electron ◽  
Face Centered ◽  
Ferromagnetic Shape Memory

The microstructure evolution of sputtered polycrystalline Ni54.75Mn13.25Fe7Ga25 ferromagnetic shape memory thin film annealed under different conditions is studied. Microstructure of different annealed films was studied using Transmission Electron Microscope (TEM) and corresponding selected area electron diffraction (SAED) patterns. The result shows that in the microstructure of as-deposited Ni54.75Mn13.25Fe7Ga25 free-standing film, after annealed at 1073 K for different time, the crystalline grain grows up with the increase of the annealing time. By analysis of the SAED patterns, the structure of the thin films change from face-centered cubic austenite to orthorhombic structure martensite compared between the film annealed at 1073 K for 10 mins, 1hr, 4 hrs, and 24 hrs respectively. It indicated that the heat treatment is an effective method of crystallizing behavior for the thin film.

Thermal Stability and Failure Mechanisms of Au/Tiw(N)/Si and Au/TiW(N)/Si02/Si Systems

1996 ◽  
Vol 427 ◽  
Author(s):  
C. R. Chen ◽  
L. J. Chen
Keyword(s):  
Thermal Stability ◽  
Failure Mechanisms ◽  
Cubic Phase ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
Transmission Electron ◽  
Single Face ◽  
Face Centered ◽  
The Stability ◽  
Ar Gas

AbstractThermal stability and failure mechanisms of Au/TiW(N)/Si and Au/TiW(N)/SiO2/Si systems have been studied by both conventional and high-resolution transmission electron microscopy, X- ray diffraction and Auger electron spectroscopy. For films deposited in Ar gas containing 20% N2, a single face-centered-cubic phase was the only crystalline phase detected to form. The samples were found to remain stable after annealing at 700 °C for 30 min. The stability temperature for Au/TiW(N)(Ar:N2=80:20)/SiO2/Si samples was found to be higher than those of Au/TiW(N) (Ar:N2=90:10)/SiO2/Si and Au/TiW/SiO2/Si samples.

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