Thermal and Electromigration-Induced Strains in Copper Conductor Lines: X-ray Microbeam Measurements and Analysis

2006 ◽  
Vol 914 ◽  
Author(s):  
G. Wang ◽  
H. Zhang ◽  
G. S. Cargill III ◽  
C. -K. Hu ◽  
Y. Ge ◽  
...  
Keyword(s):  
Grain Boundary ◽  
Fiber Texture ◽  
Energy Dispersive ◽  
X Ray Diffraction ◽  
Interface Diffusion ◽  
X Ray ◽  
Copper Conductor ◽  
Random Texture ◽  
Diffusion Paths ◽  
Low K

AbstractWe have carried out measurements of electromigration-induced strains in copper conductor lines using microbeam energy dispersive x-ray diffraction. Strains developed in random texture damascene Cu 2μm-wide, 0.16 μm-thick conductor lines with TaN liners in low-k dielectric during electromigration at 350°C are much smaller than electromigration-induced strains in (111) fiber texture Al-on-Si, 10μm-wide, SiO2 passivated conductor lines. The reasons for these differences in electromigration behavior may involve the different roles of grain boundary and interface diffusion paths and the different passivation structures and materials for the two types of samples.

Structural Characterization of Gallbladder Stones Using Energy Dispersive X-ray Spectroscopy and X-ray Diffraction

2018 ◽  
Vol 21 (7) ◽  
pp. 495-500 ◽  
Author(s):  
Hassan A. Almarshad ◽  
Sayed M. Badawy ◽  
Abdalkarem F. Alsharari
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Energy Dispersive ◽  
Spectroscopic Techniques ◽  
X Ray Diffraction ◽  
Major Health Problem ◽  
X Ray ◽  
Gallbladder Stones ◽  
Pure Cholesterol ◽  
Scanning Electron

Aim and Objective: Formation of the gallbladder stones is a common disease and a major health problem. The present study aimed to identify the structures of the most common types of gallbladder stones using X-ray spectroscopic techniques, which provide information about the process of stone formation. Material and Method: Phase and elemental compositions of pure cholesterol and mixed gallstones removed from gallbladders of patients were studied using energy-dispersive X-ray spectroscopy combined with scanning electron microscopy analysis and X-ray diffraction. Results: The crystal structures of gallstones which coincide with standard patterns were confirmed by X-ray diffraction. Plate-like cholesterol crystals with laminar shaped and thin layered structures were clearly observed for gallstone of pure cholesterol by scanning electron microscopy; it also revealed different morphologies from mixed cholesterol stones. Elemental analysis of pure cholesterol and mixed gallstones using energy-dispersive X-ray spectroscopy confirmed the different formation processes of the different types of gallstones. Conclusion: The method of fast and reliable X-ray spectroscopic techniques has numerous advantages over the traditional chemical analysis and other analytical techniques. The results also revealed that the X-ray spectroscopy technique is a promising technique that can aid in understanding the pathogenesis of gallstone disease.

A new technique for the study of phase transitions by means of energy dispersive x-ray diffraction. Application to polymeric samples

1996 ◽  
Vol 35 (2) ◽  
pp. 199-213 ◽  
Author(s):  
V. Rossi Albertini ◽  
L. Bencivenni ◽  
R. Caminiti ◽  
F. Cilloco ◽  
C. Sadun
Keyword(s):  
Phase Transitions ◽  
Energy Dispersive ◽  
New Technique ◽  
X Ray Diffraction ◽  
X Ray ◽  
A New Technique ◽  
Polymeric Samples

Selective catalytic reduction of NO by Co-Mn based nanocatalysts

2021 ◽  
Vol 0 (0) ◽  
Author(s):  
Vahid Zabihi ◽  
Mohammad Hasan Eikani ◽  
Mehdi Ardjmand ◽  
Seyed Mahdi Latifi ◽  
Alireza Salehirad
Keyword(s):  
Selective Catalytic Reduction ◽  
Catalytic Reduction ◽  
Energy Dispersive ◽  
Diffraction Field ◽  
X Ray Diffraction ◽  
X Ray ◽  
Analysis Techniques ◽  
Acidic Sites ◽  
Temperature Window ◽  
Temperature Programmed

Abstract One of the most significant aspects in selective catalytic reduction (SCR) of nitrogen oxides (NOx) is developing suitable catalysts by which the process occurs in a favorable way. At the present work SCR reaction by ammonia (NH3-SCR) was conducted using Co-Mn spinel and its composite with Fe-Mn spinel, as nanocatalysts. The nanocatalysts were fabricated through liquid routes and then their physicochemical properties such as phase composition, degree of agglomeration, particle size distribution, specific surface area and also surface acidic sites have been investigated by X-ray diffraction, Field Emission Scanning Electron Microscope, Energy-dispersive X-ray spectroscopy, energy dispersive spectroscopy mapping, Brunauer–Emmett–Teller, temperature-programmed reduction (H2-TPR) and temperature-programmed desorption of ammonia (NH3-TPD) analysis techniques. The catalytic activity tests in a temperature window of 150–400 °C and gas hourly space velocities of 10,000, 18,000 and 30,000 h−1 revealed that almost in all studied conditions, CoMn2O4/FeMn2O4 nanocomposite exhibited better performance in SCR reaction than CoMn2O4 spinel.

scholarly journals Energy dispersive X-ray diffraction (EDXRD) for operando materials characterization within batteries

2020 ◽  
Vol 22 (37) ◽  
pp. 20972-20989 ◽  
Author(s):  
Amy C. Marschilok ◽  
Andrea M. Bruck ◽  
Alyson Abraham ◽  
Chavis A. Stackhouse ◽  
Kenneth J. Takeuchi ◽  
...  
Keyword(s):  
Materials Characterization ◽  
Energy Dispersive ◽  
System Level ◽  
X Ray Diffraction ◽  
X Ray ◽  
Non Destructive ◽  
Non Destructive Characterization

This review highlights the efficacy of EDXRD as a non-destructive characterization tool in elucidating system-level phenomena for batteries.

Phase composition depth profiles using spatially resolved energy dispersive X-ray diffraction

2004 ◽  
Vol 37 (6) ◽  
pp. 967-976 ◽  
Author(s):  
Andrew C. Jupe ◽  
Stuart R. Stock ◽  
Peter L. Lee ◽  
Nikhila N. Naik ◽  
Kimberly E. Kurtis ◽  
...  
Keyword(s):  
Phase Composition ◽  
Spatial Resolution ◽  
Zinc Coating ◽  
High Energy ◽  
Sulfate Attack ◽  
Energy Dispersive ◽  
X Ray Diffraction ◽  
X Ray ◽  
Spatially Resolved ◽  
Composition Profiles

Spatially resolved energy dispersive X-ray diffraction, using high-energy synchrotron radiation (∼35–80 keV), was used nondestructively to obtain phase composition profiles along the radii of cylindrical cement paste samples to characterize the progress of the chemical changes associated with sulfate attack on the cement. Phase distributions were acquired to depths of ∼4 mm below the specimen surface with sufficient spatial resolution to discern features less than 200 µm thick. The experimental and data analysis methods employed to obtain quantitative composition profiles are described. The spatial resolution that could be achieved is illustrated using data obtained from copper cylinders with a thin zinc coating. The measurements demonstrate that this approach is useful for nondestructively visualizing the sometimes complex transformations that take place during sulfate attack on cement-based materials. These transformations can be spatially related to microstructure as seen by computed microtomography.

Structural and thermodynamic properties of nanocrystalline fcc metals prepared by mechanical attrition

1992 ◽  
Vol 7 (7) ◽  
pp. 1751-1761 ◽  
Author(s):  
J. Eckert ◽  
J.C. Holzer ◽  
C.E. Krill ◽  
W.L. Johnson
Keyword(s):  
Thermal Analysis ◽  
Grain Size ◽  
Melting Point ◽  
Grain Boundary ◽  
Bulk Modulus ◽  
Atomic Level ◽  
X Ray Diffraction ◽  
X Ray ◽  
Fcc Metals ◽  
Mechanical Attrition

Nanocrystalline fcc metals have been synthesized by mechanical attrition. The crystal refinement and the development of the microstructure have been investigated in detail by x-ray diffraction, differential scanning calorimetry, and transmission electron microscopy. The deformation process causes a decrease of the grain size of the fcc metals to 6–22 nm for the different elements. The final grain size scales with the melting point and the bulk modulus of the respective metal: the higher the melting point and the bulk modulus, the smaller the final grain size of the powder. Thus, the ultimate grain size achievable by this technique is determined by the competition between the heavy mechanical deformation introduced during milling and the recovery behavior of the metal. X-ray diffraction and thermal analysis of the nanocrystalline powders reveal that the crystal size refinement is accompanied by an increase in atomic-level strain and in the mechanically stored enthalpy in comparison to the undeformed state. The excess stored enthalpies of 10–40% of the heat of fusion exceed by far the values known for conventional deformation processes. The contributions of the atomic-level strain and the excess enthalpy of the grain boundaries to the stored enthalpies are critically assessed. The kinetics of grain growth in the nanocrystalline fcc metals are investigated by thermal analysis. The activation energy for grain boundary migration is derived from a modified Kissinger analysis, and estimates of the grain boundary enthalpy are given.

Structural and morphological characterisation of ruthenium phthalocyanine films by energy dispersive X-ray diffraction and atomic force microscopy

2001 ◽  
Vol 382 (1-2) ◽  
pp. 74-80 ◽  
Author(s):  
R. Caminiti ◽  
A. Capobianchi ◽  
P. Marovino ◽  
A.M. Paoletti ◽  
G. Padeletti ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Energy Dispersive ◽  
X Ray Diffraction ◽  
Morphological Characterisation ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

Composition Analysis of Ge/Si1-xGex: C Buffer on Silicon Measured by Planar Scanning Energy Dispersive Spectroscopy

2011 ◽  
Vol 383-390 ◽  
pp. 7619-7623
Author(s):  
Z Z Lu ◽  
F. Yu ◽  
L. Yu ◽  
L. H. Cheng ◽  
P. Han
Keyword(s):  
Energy Dispersive Spectroscopy ◽  
Chemical Vapor ◽  
Energy Dispersive ◽  
Composition Analysis ◽  
X Ray Diffraction ◽  
Si Substrate ◽  
Composition Distribution ◽  
X Ray ◽  
Cvd Method ◽  
Substrate Structure

In this work, Si, Ge element composition distribution in Ge /Si1-xGex:C /Si substrate structure has been characterized and modified by planar scanning energy dispersive spectroscopy (EDS) and X-ray diffraction (XRD). The Ge /Si1-xGex:C /Si substrate samples are grown by chemical vapor deposition (CVD) method. The accuracy of EDS value can be improved by ~ 32%. And the modified EDS results indicate the Ge distribution in the Ge/Si1-xGex:C/Si sub structure.

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