Three Dimensional Characterization of Interfaces in Semiconductors by Scanning Electron Microscopy

1986 ◽  
Vol 69 ◽  
Author(s):  
David C. Joy ◽  
D. M. Maher ◽  
R C Farrow
Keyword(s):  
Electron Microscopy ◽  
Three Dimensional ◽  
Preparation Time ◽  
Cross Sectional ◽  
Transmission Electron ◽  
Alternative Approach ◽  
Imaging Mode ◽  
Structural Characterizations ◽  
Scanning Electron

AbstractIn many semiconductor materials problems, structural characterizations must be achieved in both the lateral and vertical dimensions. Although a combination of cross-sectional and planar transmission electron microscopy can provide this information, the sample preparation time is demanding and only relatively small volumes of material are examined. We describe here an alternative approach in which the charge collection (‘CCM’) imaging mode of the scanning electron microscope (SEM) is used. It is shown that, by varying the incident electron beam energy, electricallly active defects at different positions beneath the entrance surface of the material can be imaged and their depth estimated.

Surface Characterization of Cu(In, Ga)Se2 Thin Films Treated by Various Solutions

1996 ◽  
Vol 426 ◽  
Author(s):  
T. Wada ◽  
Y. Hashimoto ◽  
K. Kusao ◽  
N. Kohara ◽  
T. Negami ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Photoelectron Spectroscopy ◽  
Surface Characterization ◽  
Front Surface ◽  
Cross Sectional ◽  
X Ray ◽  
Transmission Electron ◽  
Cation Ratio ◽  
Scanning Electron

AbstractCu-rich Cu(In, Ga)Se2 (CIGS) films were investigated by scanning electron microscopy (SEM), transmission electron microscopy (TEM), energy dispersive x-ray fluorescence spectroscopy (EDX) and x-ray photoelectron spectroscopy (XPS). The Cu-rich CIGS film were treated in KCN and NH3 solutions. In the as-deposited Cu-rich CIGS film, the cation ratio of Cu/(In+Ga) at the surface exceeded the bulk value. Cross-sectional TEM of the KCN-treated film suggested that Cu2-xSe existed both at the grain boundaries and on the grains near the surface of the Cu-rich CIGS film. The Cu2-xSe was completely removed by the treatment in the KCN solution and was removed only at the front surface by treatment in the NH3 solution.

Scanning and Transmission Microscopy of Nematocyst Batteries in Epitheliomuscular Cells of Hydra

1971 ◽  
Vol 29 ◽  
pp. 410-411 ◽  
Author(s):  
Jane A. Westfall ◽  
S. Yamataka ◽  
Paul D. Enos
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Osmium Tetroxide ◽  
External Surface ◽  
Three Dimensional ◽  
Surface Structures ◽  
Transmission Microscopy ◽  
Transmission Electron ◽  
Freeze Dried ◽  
Scanning Electron

Scanning electron microscopy (SEM) provides three dimensional details of external surface structures and supplements ultrastructural information provided by transmission electron microscopy (TEM). Animals composed of watery jellylike tissues such as hydras and other coelenterates have not been considered suitable for SEM studies because of the difficulty in preserving such organisms in a normal state. This study demonstrates 1) the successful use of SEM on such tissue, and 2) the unique arrangement of batteries of nematocysts within large epitheliomuscular cells on tentacles of Hydra littoralis.Whole specimens of Hydra were prepared for SEM (Figs. 1 and 2) by the fix, freeze-dry, coat technique of Small and Màrszalek. The specimens were fixed in osmium tetroxide and mercuric chloride, freeze-dried in vacuo on a prechilled 1 Kg brass block, and coated with gold-palladium. Tissues for TEM (Figs. 3 and 4) were fixed in glutaraldehyde followed by osmium tetroxide. Scanning micrographs were taken on a Cambridge Stereoscan Mark II A microscope at 10 KV and transmission micrographs were taken on an RCA EMU 3G microscope (Fig. 3) or on a Hitachi HU 11B microscope (Fig. 4).

Characterization of Thin Polymer Blend Films using ESEM – No Charging, No Staining.

2001 ◽  
Vol 707 ◽  
Author(s):  
Ian C. Bache ◽  
Catherine M. Ramsdale ◽  
D. Steve Thomas ◽  
Ana-Claudia Arias ◽  
J. Devin MacKenzie ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Environmental Scanning Electron Microscopy ◽  
Environmental Scanning ◽  
Cross Sectional ◽  
Blend Films ◽  
Thin Polymer ◽  
Device Applications ◽  
Scanning Electron

ABSTRACTCharacterising the morphology of thin films for use in device applications requires the ability to study both the structure within the plane of the film, and also through its thickness. Environmental scanning electron microscopy has proved to be a fruitful technique for the study of such films both because contrast can be seen within the film without the need for staining (as is conventionally done for electron microscopy), and because cross-sectional images can be obtained without charging artefacts. The application of ESEM to a particular blend of relevance to photovoltaics is described.

Hydrothermal Synthesis and Characterization of BiFeO3 Polyhedral Crystallites

2012 ◽  
Vol 174-177 ◽  
pp. 508-511
Author(s):  
Lin Lin Yang ◽  
Yong Gang Wang ◽  
Yu Jiang Wang ◽  
Xiao Feng Wang
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Synthesis And Characterization ◽  
X Ray Diffraction ◽  
Xrd Pattern ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Electron

BiFeO3 polyhedrons had been successfully synthesized via a hydrothermal method. The as-prepared products were characterized by power X-ray diffraction (XRD) pattern, scanning electron microscopy (SEM) and transmission electron microscopy (TEM). The possible mechanisms for the formation of BiFeO3 polyhedrons were discussed. Though comparison experiments, it was found that the kind of precursor played a key role on the morphology control of BiFeO3 crystals.

Characterization of Al65.0Cu32.9Co2.1 Alloy Containing Nanofibres

2012 ◽  
Vol 186 ◽  
pp. 212-215
Author(s):  
Jacek Krawczyk ◽  
Włodzimierz Bogdanowicz ◽  
Grzegorz Dercz ◽  
Wojciech Gurdziel
Keyword(s):  
Electron Microscopy ◽  
Average Diameter ◽  
Chemical Compositions ◽  
X Ray ◽  
Transmission Electron ◽  
Orthogonal Set ◽  
T Phase ◽  
Terminal Area ◽  
Scanning Electron

Microstructure of terminal area of Al65Cu32.9Co2.1ingots (numbers indicate at.%), obtained via directional solidification was studied. Scanning Electron Microscopy, Transmission Electron Microscopy and X-ray powder diffraction were applied. Point microanalysis by Scanning Electron Microscope was used for examination of chemical compositions of alloy phases. It was found that tetragonal θ phase of Al2Cu stoichiometric formula was the dominate phase (matrix). Additionally the alloy contained orthogonal set of nanofibres of Al7Cu2Co T phase with the average diameter of 50-500 nm and oval areas of hexagonal Al3(Cu,Co)2H-phase, surrounded by monoclinic AlCu η1phase rim. Inside some areas of H-phase cores of decagonal quasicrystalline D phase were observed.

L-cysteine functionalized graphene quantum dots for sub-ppb detection of As (III)

2021 ◽  
Author(s):  
Md. Farhan Naseh ◽  
Neelam Singh ◽  
Jamilur R. Ansari ◽  
Ashavani Kumar ◽  
Tapan Sarkar ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Quantum Dots ◽  
Room Temperature ◽  
Graphene Quantum Dots ◽  
Optical Characterization ◽  
Functionalized Graphene ◽  
Transmission Electron ◽  
Sensitivity And Selectivity ◽  
Structural Characterizations

Abstract Here, we report functionalized graphene quantum dots (GQDs) for the optical detection of arsenic at room temperature. GQDs with the fluorescence of three fundamental colors (red, green, and blue) were synthesized and functionally capped with L-cysteine (L-cys) to impart selectively towards As (III) by exploiting the affinity of L-cys towards arsenite. The optical characterization of GQDs was carried out using UV-Vis absorption spectroscopy, Fourier transform infrared spectroscopy, and fluorescence spectrometry and the structural characterizations were performed using transmission electron microscopy. The fluorescence results showed instantaneous quenching in intensity when the GQDs came in contact with As (III) for all test concentrations over a range from 0.025 ppb to 25 ppb, which covers the permissible limit of arsenic in drinking water. The experimental results suggested excellent sensitivity and selectivity towards As (III).

Synthesis and characterization of homogeneous lead-substituted tin oxide with the (110) face of rutile structure

2000 ◽  
Vol 15 (10) ◽  
pp. 2076-2079
Author(s):  
Chika Nozaki ◽  
Takashi Yamada ◽  
Kenji Tabata ◽  
Eiji Suzuki
Keyword(s):  
Electron Microscopy ◽  
Tin Oxide ◽  
Photoelectron Spectroscopy ◽  
Synthesis And Characterization ◽  
X Ray Diffraction ◽  
Rutile Structure ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Electron

Synthesis of a rutile-type lead-substituted tin oxide with (110) face was investigated. The characterization was performed by x-ray diffraction, scanning electron microscopy, transmission electron microscopy, energy dispersive x-ray spectroscopy, infrared spectroscopy, x-ray photoelectron spectroscopy, and Brunauer–Emmett–Teller surface area measurements. The homogeneous rutile-type lead-substituted tin oxide was obtained until 4.1 mol% of tin was substituted with lead. The surface of obtained oxide had a homogeneously lead-substituted (110) face.

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