Triple-probe Atomic Force Microscope: Measuring a carbon nanotube/DNA MIS-FET
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ABSTRACTWe have constructed an advanced electric probing system, which is a triple-probe atomic force microscope (T-AFM). The T-AFM consists of “Nanotweezers” and an AFM with a carbon nanotube probe. Using this system, we fabricated a single-walled carbon nanotubes (SWNTs)/deoxyribonucleic acid (DNA) three-terminal device and measured the current-voltage (I-V) curves of this device. In this three-terminal device, DNA strands were entangled with the SWNT bundle, and behaved as a gate-insulator-layer. This three-terminal device worked as a metal-insulator-semiconductor field effect transistor (MIS-FET) with depletion switching behavior.
2013 ◽
Vol 378
◽
pp. 466-471
2006 ◽
Vol 315-316
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pp. 758-761
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