Triple-probe Atomic Force Microscope: Measuring a carbon nanotube/DNA MIS-FET

ABSTRACTWe have constructed an advanced electric probing system, which is a triple-probe atomic force microscope (T-AFM). The T-AFM consists of “Nanotweezers” and an AFM with a carbon nanotube probe. Using this system, we fabricated a single-walled carbon nanotubes (SWNTs)/deoxyribonucleic acid (DNA) three-terminal device and measured the current-voltage (I-V) curves of this device. In this three-terminal device, DNA strands were entangled with the SWNT bundle, and behaved as a gate-insulator-layer. This three-terminal device worked as a metal-insulator-semiconductor field effect transistor (MIS-FET) with depletion switching behavior.

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CHARGE TRANSPORT THROUGH CARBON NANOTUBE OR FULLERENE–MOLECULE–SILICON JUNCTIONS

NANO ◽

10.1142/s1793292007000660 ◽

2007 ◽

Vol 02 (05) ◽

pp. 285-294

Author(s):

FU-REN F. FAN ◽

BO CHEN ◽

AUSTEN K. FLATT ◽

JAMES M. TOUR ◽

ALLEN J. BARD

Keyword(s):

Carbon Nanotube ◽

Charge Transport ◽

Electron Acceptor ◽

Negative Differential Resistance ◽

Fullerene Molecule ◽

Differential Resistance ◽

Electron Donors ◽

Switching Behavior ◽

Current Voltage ◽

Bistable Switching

We report here the current–voltage (i–V) characteristics of several (n++- Si /MNOPE/ C 60/ Pt -tip) or (n++- Si /MNOPE/SWCNT/ Pt -tip) junctions, where MNOPE = 2'-mononitro-4, 4'-bis(phenylethynyl)-1-phenylenediazonium and SWCNT = single wall carbon nanotube. A layer of C 60 or SWCNT-derivatized MNOPE has strong effect on the i–V behavior of the junctions, including rectification, negative differential resistance (NDR) and switching behaviors. The i–V curve of a grafted molecular monolayer (GMM) of MNOPE atop n++- Si shows NDR behavior, whereas those of C 60- and SWCNT-derivatized GMMs of MNOPE on n++- Si show strong rectifying behavior with opposite rectification polarities. With C 60, larger currents were found with negative tip bias, while with SWCNT, the forward top bias was positive. Because C 60 tends to be a good electron acceptor and SWCNTs tend to be good electron donors, they show different i–V behavior, as observed. Some of the (n++- Si /MNOPE/SWCNT/ Pt -tip) junctions also show reversible bistable switching behavior.

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Advancement in fabrication of carbon nanotube tip for atomic force microscope using multi-axis nanomanipulator in scanning electron microscope

Nanotechnology ◽

10.1088/1361-6528/ac4a2b ◽

2022 ◽

Author(s):

Sanjeev Kumar Kanth ◽

Anjli Sharma ◽

Byong Chon Park ◽

Woon Song ◽

Hyun Rhu ◽

...

Keyword(s):

Electron Beam ◽

Electron Microscope ◽

Carbon Nanotube ◽

Scanning Electron Microscope ◽

Atomic Force Microscope ◽

Structural Integrity ◽

Ion Beam ◽

Rectilinear Motion ◽

Atomic Force ◽

Scanning Electron

Abstract We have constructed a new nanomanipulator (NM) in a field emission scanning electron microscope (FE-SEM) to fabricate carbon nanotube (CNT) tip to precisely adjust the length and attachment angle of CNT onto the mother atomic force microscope (AFM) tip. The new NM is composed of 2 modules, each of which has the degree of freedom of three-dimensional rectilinear motion x, y and z and one-dimensional rotational motion θ. The NM is mounted on the stage of a FE-SEM. With the system of 14 axes in total which includes 5 axes of FE-SEM and 9 axes of nano-actuators, it was possible to see CNT tip from both rear and side view about the mother tip. With the help of new NM, the attachment angle error could be reduced down to 0º as seen from both the side and the rear view, as well as, the length of the CNT could be adjusted with the precision using electron beam induced etching. For the proper attachment of CNT on the mother tip surface, the side of the mother tip was milled with focused ion beam. In addition, electron beam induced deposition was used to strengthen the adhesion between CNT and the mother tip. In order to check the structural integrity of fabricated CNT, transmission electron microscope image was taken which showed the fine cutting of CNT and the clean surface as well. Finally, the performance of the fabricated CNT tip was demonstrated by imaging 1-D grating and DNA samples with atomic force microscope in tapping mode.

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Use of dielectrophoresis in the fabrication of an atomic force microscope tip with a carbon nanotube: a numerical analysis

Nanotechnology ◽

10.1088/0957-4484/16/10/046 ◽

2005 ◽

Vol 16 (10) ◽

pp. 2245-2250 ◽

Cited By ~ 49

Author(s):

Ji-Eun Kim ◽

Chang-Soo Han

Keyword(s):

Carbon Nanotube ◽

Numerical Analysis ◽

Atomic Force Microscope ◽

Atomic Force

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Adhesive and Mechanical Properties of Carbon Nanotube Probes Contacting Chemically-Treated Surfaces

Volume 11: Nano and Micro Materials, Devices and Systems; Microsystems Integration ◽

10.1115/imece2011-64403 ◽

2011 ◽

Cited By ~ 1

Author(s):

Kane M. Barker ◽

Al Ferri ◽

Lawrence A. Bottomley

Keyword(s):

Carbon Nanotubes ◽

Carbon Nanotube ◽

Mechanical Response ◽

Tensile Load ◽

Image Resolution ◽

Adhesive Properties ◽

Atomic Force ◽

Afm Cantilever ◽

Walled Carbon Nanotubes ◽

Static Coefficient Of Friction

Carbon nanotubes are useful in a variety of measurement applications. In the case of Atomic Force Microscopes (AFMs), carbon nanotubes can be affixed to the tip of the AFM cantilever to improve image resolution and enable images of surfaces with deep crevices and trench structures. In this paper, the mechanical response of long, straight, small walled carbon nanotubes (SWNTs) under compressive and tensile load is examined with an atomic force microscope. Multi-dimensional force spectroscopy (MDFS) is used to simultaneously measure the cantilever resonant frequency, deflection, and scanner motion. The acquired force curves reveal that the SWNT buckles shortly after contact is initiated. As the scanner continues to rise and then reverses direction, the SWNT undergoes a number of adhesion/sticking episodes, buckling, and slip events. The bulk properties of the nanotube are estimated by measuring the shift in natural frequency during tension. Finally, the carbon nanotube is modeled as an elastica in order to predict the post-buckled shape of the SWNT. By comparing the model results with MDFS results, the static coefficient of friction between the SWNT and a variety of surfaces is estimated. The study suggests that MDFS has a wide applicability for studying the mechanical and adhesive properties of various nanotubes, nanorods and nanofibers.

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Frequency Response of Carbon Nanotube Probes during Tapping Mode of Atomic Force Microscopy

Applied Mechanics and Materials ◽

10.4028/www.scientific.net/amm.378.466 ◽

2013 ◽

Vol 378 ◽

pp. 466-471

Author(s):

Po Jen Shih ◽

Shang Hao Cai

Keyword(s):

Atomic Force Microscopy ◽

Carbon Nanotube ◽

Atomic Force Microscope ◽

Frequency Response ◽

Tapping Mode ◽

Force Microscopy ◽

Frequency Responses ◽

Atomic Force ◽

Frequency Drop ◽

Atomic Force Microscope Measurement

The dynamic behaviors of carbon nanotube probes applied in Atomic Force Microscope measurement are of interest in advanced nanoscalar topography. In this paper, we developed the characteristic equations and applied the model analysis to solve the eigenvalues of the microcantilever and the carbon nanotube. The eigenvalues were then used in the tapping mode system to predict the frequency responses against the tip-sample separations. It was found that the frequency drop steeply if the separation was less than certain distances. This instability of frequency is deduced from the jump of microcantilever or the jump of the carbon nanotube. Various lengths and binding angles of the carbon nanotube were considered, and the results indicated that the binding angle dominated the frequency responses and jumps.

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Characterization of the electrical contact between a conductive atomic force microscope cantilever and a carbon nanotube

Journal of Applied Physics ◽

10.1063/1.3626811 ◽

2011 ◽

Vol 110 (5) ◽

pp. 054305 ◽

Cited By ~ 7

Author(s):

Tarek K. Ghanem ◽

Ellen D. Williams ◽

Michael S. Fuhrer

Keyword(s):

Carbon Nanotube ◽

Atomic Force Microscope ◽

Electrical Contact ◽

Atomic Force Microscope Cantilever ◽

Atomic Force ◽

Force Microscope Cantilever

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Carbon Nanotube as Probe for Atomic Force Microscope

Key Engineering Materials ◽

10.4028/www.scientific.net/kem.315-316.758 ◽

2006 ◽

Vol 315-316 ◽

pp. 758-761

Author(s):

Zong Wei Xu ◽

Ying Chun Liang ◽

Shen Dong ◽

Li Qiang Gu ◽

T. Sun ◽

...

Keyword(s):

Carbon Nanotube ◽

Aspect Ratio ◽

Atomic Force Microscope ◽

Arc Welding ◽

Metal Film ◽

Optical Microscope ◽

Fabrication Method ◽

Easy Method ◽

Atomic Force ◽

Direct View

An improved arc welding method was developed to fabricate carbon nanotube probe under direct view of optical microscope. The new fabrication method here needs not coat silicon probe in advance with metal film, which greatly reduces the fabrication’s difficulty. An easy method for shortening the nanotube probe was also developed. The improved fabrication method here is simple and reliable. The fabricated carbon nanotube probe showed good properties of higher length-to-diameter aspect ratio, better wear characteristics than silicon probe.

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Single-wall carbon nanotube atomic force microscope probes

Applied Physics Letters ◽

10.1063/1.1461073 ◽

2002 ◽

Vol 80 (11) ◽

pp. 2002-2004 ◽

Cited By ~ 95

Author(s):

E. S. Snow ◽

P. M. Campbell ◽

J. P. Novak

Keyword(s):

Carbon Nanotube ◽

Atomic Force Microscope ◽

Single Wall Carbon Nanotube ◽

Single Wall Carbon ◽

Atomic Force

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Directly Reading The Genome

Microscopy Today ◽

10.1017/s1551929500056388 ◽

2001 ◽

Vol 9 (2) ◽

pp. 3-7

Author(s):

Stephen W. Carmichael ◽

Nita J. Maihle

Keyword(s):

Carbon Nanotube ◽

Atomic Force Microscope ◽

Human Genome ◽

Genetic Information ◽

Font Size ◽

Single Walled Carbon Nanotube ◽

Single Walled Carbon ◽

Atomic Force

The code for the human genome is essentially complete, opening an expansive book about our biologic composition. But the problem is to read this book. The font size is very small, What you are reading now is 9 point font, and genetic information would correspond to approximately 10-50 point font, six orders of magnitude smaller. There are methods to derive genetic information, but recently Adam Woolley, Chantal Guillemette, Chin-Li Cheung, David Housman, and Charles Lieber have developed an elegant way to directly read genetic information with a microscope. The microscope they used was an atomic force microscope (AFM) that employed a single-walled carbon nanotube as its probe.

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