Surface and Interface Characterization of Ion Beam Re-crystallized Si

2002 ◽  
Vol 750 ◽  
Author(s):  
P. K. Sahoo ◽  
B. Satpati ◽  
S. Dey ◽  
P. V. Satyam ◽  
T. Som ◽  
...  
Keyword(s):  
Ion Beam ◽  
Amorphous Layer ◽  
Amorphous Structure ◽  
Average Height ◽  
Force Microscopy ◽  
Surface And Interface ◽  
Atomic Force ◽  
Nano Crystalline ◽  
Transmission Electron

ABSTRACTIn the present work we have studied efficacy of ion beam induced epitaxial crystallization (IBIEC) to recover amorphous layers (300 – 350 nm) produced by MeV Kr ions in Si(100) and studied the associated changes occurring on surface and interface of the recrystallized region. IBIEC experiments were carried out at sample temperatures in the range of 200 − 400°C using 1 MeV N+ ion beam. Rutherford backscattering-Channeling technique showed planar and gradual recovery of the amorphous layer as a function of temperature. Transmission electron microscopy measurements show good crystalline structure of the recovered region at 400°C while at lower temperatures nano-crystalline Si formation embedded in the amorphous structure is evident. The surface topography studied by atomic force microscopy shows development of islands after IBIEC. The rms roughness is around 0.5 nm and average height of the islands is found to be 1.8 nm. The observed epitaxial growth and the surface topographical features have been correlated.

Surface and Interface Characterization of Asphaltenic Fractions Obtained with Different Alkanes: A Study by Atomic Force Microscopy and Pendant Drop Tensiometry

2018 ◽  
Vol 32 (12) ◽  
pp. 12174-12186 ◽  
Author(s):  
Iago Oliveira ◽  
Larissa Gomes ◽  
Elton Franceschi ◽  
Gustavo Borges ◽  
Juliana F. de Conto ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Pendant Drop ◽  
Force Microscopy ◽  
Interface Characterization ◽  
Surface And Interface ◽  
Atomic Force

Fabrication of Ga-templates Using a Focused Ion Beam

2009 ◽  
Vol 1228 ◽  
Author(s):  
Hao Wang ◽  
Greg C. Hartman ◽  
Joshua Williams ◽  
Jennifer L. Gray
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Processing Conditions ◽  
New Materials ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nitridation Process ◽  
Microscopy Characterization ◽  
Device Technology

AbstractThere are many factors that have the potential to limit significant advances in device technology. These include the ability to arrange materials at shrinking dimensions and the ability to successfully integrate new materials with better properties or new functionalities. To overcome these limitations, the development of advanced processing methods that can organize various combinations of materials at nano-scale dimensions with the necessary quality and reliability is required. We have explored using a gallium focused ion beam (FIB) as a method of integrating highly mismatched materials with silicon by creating template patterns directly on Si with nanoscale resolution. These templates are potentially useful as a means of locally controlling topography at nanoscale dimensions or as a means of locally implanting Ga at specific surface sites. We have annealed these templates in vacuum to study the effects of ion dosage on local Ga concentration and topography. We have also investigated the feasibility of creating Ga nanodots using this method that could eventually be converted to GaN through a nitridation process. Atomic force microscopy and electron microscopy characterization of the resulting structures are shown for a variety of patterning and processing conditions.

scholarly journals Spore Coat Architecture of Clostridium novyi NT Spores

2007 ◽  
Vol 189 (17) ◽  
pp. 6457-6468 ◽  
Author(s):  
Marco Plomp ◽  
J. Michael McCaffery ◽  
Ian Cheong ◽  
Xin Huang ◽  
Chetan Bettegowda ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Anaerobic Bacterium ◽  
Amorphous Layer ◽  
Spore Coat ◽  
Experimental Animals ◽  
Force Microscopy ◽  
Atomic Force ◽  
Clostridium Novyi ◽  
Transmission Electron

ABSTRACT Spores of the anaerobic bacterium Clostridium novyi NT are able to germinate in and destroy hypoxic regions of tumors in experimental animals. Future progress in this area will benefit from a better understanding of the germination and outgrowth processes that are essential for the tumorilytic properties of these spores. Toward this end, we have used both transmission electron microscopy and atomic force microscopy to determine the structure of both dormant and germinating spores. We found that the spores are surrounded by an amorphous layer intertwined with honeycomb parasporal layers. Moreover, the spore coat layers had apparently self-assembled, and this assembly was likely to be governed by crystal growth principles. During germination and outgrowth, the honeycomb layers, as well as the underlying spore coat and undercoat layers, sequentially dissolved until the vegetative cell was released. In addition to their implications for understanding the biology of C. novyi NT, these studies document the presence of proteinaceous growth spirals in a biological organism.

Structural and Morphological Characterization of Ultrathin Films of an Asymmetric Polydiacetylene

1996 ◽  
Vol 440 ◽  
Author(s):  
H. C. Wang ◽  
D. W. Cheong ◽  
J. Kumar ◽  
C. Sung ◽  
S. K. Tripathy
Keyword(s):  
Second Harmonic ◽  
Morphological Characterization ◽  
Lb Films ◽  
Force Microscopy ◽  
Langmuir Blodgett ◽  
Glass Substrates ◽  
Atomic Force ◽  
Transmission Electron ◽  
Air Water Interface

AbstractA soluble, asymmetrically substituted polydiacetylene, poly(BPOD), has been reported to form stable monolayers at the air-water interface by the Langmuir-Blodgett (LB) technique [2]. Preformed polydiacetylene has been deposited onto hydrophobic substrates as multilayers to form second order nonlinear optical thin films. Second harmonic generation was found to increase with the number of layers. From previous atomic force microscopy (AFM) studies backbone orientation along the dipping direction with an interchain spacing of about 5 A° was indicated [2].The film morphology and preferential molecular orientation of these LB films are further investigated by transmission electron microscopy (TEM). A specifically tailored sample preparation method for the ultrathin LB films was used. Multilayer films were deposited on hydrophobic collodion covered glass substrates for this purpose. Electron diffraction was employed to study the crystalline organization of mono and multilayers of LB films as well as cast films.

scholarly journals Detection Limits of DLS and UV-Vis Spectroscopy in Characterization of Polydisperse Nanoparticles Colloids

2013 ◽  
Vol 2013 ◽  
pp. 1-10 ◽  
Author(s):  
Emilia Tomaszewska ◽  
Katarzyna Soliwoda ◽  
Kinga Kadziola ◽  
Beata Tkacz-Szczesna ◽  
Grzegorz Celichowski ◽  
...  
Keyword(s):  
Light Scattering ◽  
Dynamic Light Scattering ◽  
Point Of View ◽  
Spectroscopy Analysis ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Vis Spectroscopy ◽  
The One

Dynamic light scattering is a method that depends on the interaction of light with particles. This method can be used for measurements of narrow particle size distributions especially in the range of 2–500 nm. Sample polydispersity can distort the results, and we could not see the real populations of particles because big particles presented in the sample can screen smaller ones. Although the theory and mathematical basics of DLS technique are already well known, little has been done to determine its limits experimentally. The size and size distribution of artificially prepared polydisperse silver nanoparticles (NPs) colloids were studied using dynamic light scattering (DLS) and ultraviolet-visible (UV-Vis) spectroscopy. Polydisperse colloids were prepared based on the mixture of chemically synthesized monodisperse colloids well characterized by atomic force microscopy (AFM), transmission electron microscopy (TEM), DLS, and UV-Vis spectroscopy. Analysis of the DLS results obtained for polydisperse colloids reveals that several percent of the volume content of bigger NPs could screen completely the presence of smaller ones. The presented results could be extremely important from nanoparticles metrology point of view and should help to understand experimental data especially for the one who works with DLS and/or UV-Vis only.

Epitaxial Growth and Characterization of the Ordered Vacancy Compound CuIn3Se5 on GaAs (100) Fabricated by Molecular Beam Epitaxy

1994 ◽  
Vol 340 ◽  
Author(s):  
Art J. Nelson ◽  
M. Bode ◽  
G. Horner ◽  
K. Sinha ◽  
John Moreland
Keyword(s):  
Molecular Beam Epitaxy ◽  
Epitaxial Growth ◽  
Molecular Beam ◽  
Structural Defects ◽  
X Ray Diffraction ◽  
Symmetric Vibration ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron

ABSTRACTEpitaxial growth of the ordered vacancy compound (OVC) CuIn3Se5 has been achieved on GaAs (100) by molecular beam epitaxy (MBE) from Cu2Se and In2Se3 sources. Electron probe microanalysis and X-ray diffraction have confirmed the composition for the 1-3-5 OVC phase and that the film is single crystal Culn3Se5 (100). Transmission electron microscopy (TEM) characterization of the material also showed it to be single crystalline. Structural defects in the layer consisted mainly of stacking faults. Photoluminescence (PL) measurements performed at 7.5 K indicate that the bandgap is 1.28 eV. Raman spectra reveal a strong polarized peak at 152 cm−1, which is believed to arise from the totally symmetric vibration of the Se atoms in the lattice. Atomic force microscopy reveals faceting in a preferred (100) orientation.

Hard High Density Carbon Thin Films for X-Ray Multilayer Optics

1994 ◽  
Vol 349 ◽  
Author(s):  
Joseph Pedulla ◽  
Axel Bartos ◽  
Richard D. Deslattes
Keyword(s):  
Ion Beam ◽  
High Hardness ◽  
Carbon Films ◽  
High Electron ◽  
Optical Elements ◽  
X Ray ◽  
Force Microscopy ◽  
Surface And Interface ◽  
Atomic Force ◽  
High Uniformity

ABSTRACTDual ion beam assisted deposition (DIBAD) techniques are known to produce high quality diamond-like carbon films. The reported extreme hardness and high thermal conductivity characteristics of these films have stimulated our investigation of their use as one component of multilayer x-ray optical elements. Non-crystalline carbon films were produced and were characterized by means of highly collimated x-ray refiectometry (λ = 0.154 nn), atomic force microscopy, and IR Raman spectroscopy techniques. They exhibit extreme smoothness at the surface and interface, near diamond density, high hardness, and high uniformity over areas of 0.58 x 10-4 m2. Multilayers have been constructed of this non-crystalline carbon interposed with high electron density materials that have exhibited very good x-ray and EUV optical characteristics at λ = 0.154 nm and at λ = 4.0 – 8.0 nm.

FIB-assisted Pt Deposition for Carbon Nanotube Integration and 3-D Nanoengineering

2002 ◽  
Vol 739 ◽  
Author(s):  
K. Dovidenko ◽  
J. Rullan ◽  
R. Moore ◽  
K. A. Dunn ◽  
R. E. Geer ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Contact Lines ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Minimal Damage ◽  
Effective Use ◽  
Non Destructive

ABSTRACTIn this study, the Focused Ion Beam (FIB) instrument has been used for carbon nanotubes integration and nanoegineering studies. Results of thorough investigation (electrical, structural and chemical) of ultra-thin Pt contact lines and pads fabricated by the FIB, along with evaluation of nanomodification of the carbon nanotubes under the Ga+ ion beam and during Pt deposition are presented. The initial stages of FIB-assisted Pt deposition on multi-wall nanotubes are studied by transmission electron microscopy (TEM). The FIB parameters are optimized to provide non-destructive imaging and controllable Pt deposition with minimal damage on the nanotubes. We have demonstrated effective use of FIB-fabricated Pt pads as means of attaching the nanotubes to the substrate for atomic force and ultrasonic force microscopy studies.

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