Some Features of Quantitative Analysis of Rock-Forming Minerals Using a JXA-8230 Electron Probe Microanalyzer

2021 ◽  
Vol 62 (11) ◽  
pp. 1209-1213
Author(s):  
Yu.G. Lavrent’ev ◽  
L.V. Usova
Keyword(s):  
Quantitative Analysis ◽  
Theoretical Data ◽  
Correction Method ◽  
Positive Influence ◽  
Analytical Line ◽  
X Ray ◽  
Electron Probe Microanalyzer ◽  
The Matrix ◽  
Isomorphic Series ◽  
Atomic Electrons

Abstract —The basic software package of a JXA-8230 microanalyzer, like its predecessor JXA-8100, uses the long-established ZAF correction method (with some differences) for a quantitative analysis: Calculation of mass absorption coefficients is based on Chantler’s theoretical data. The core of this method is quantum-mechanical calculation of the cross section of the interaction between an X-ray photon and atomic electrons. This innovation has had a positive influence on the trueness of X-ray microanalysis. Control tests on specimens where the absorption effect is dominant have demonstrated that the results of this analysis are slightly lower (by less than 2%) independently of the matrix absorption interval in which the analytical line is located. As a consequence, the selection of comparison specimens becomes easier: It is sufficient that the specimen under study and the comparison specimen belong to the same isomorphic series and that the intensity of the analytical line of the comparison specimen allows for the measurement with the required accuracy.

Lateral resolution of the electron microbeam analysis

1978 ◽  
Vol 36 (1) ◽  
pp. 542-543
Author(s):  
H.J. Dudek
Keyword(s):  
Quantitative Analysis ◽  
Depth Resolution ◽  
Lateral Resolution ◽  
Cylindrical Particle ◽  
Correction Procedure ◽  
X Ray ◽  
Element Concentrations ◽  
Microbeam Analysis ◽  
The Matrix

The chemical inhomogenities in modern materials such as fibers, phases and inclusions, often have diameters in the region of one micrometer. Using electron microbeam analysis for the determination of the element concentrations one has to know the smallest possible diameter of such regions for a given accuracy of the quantitative analysis.In th is paper the correction procedure for the quantitative electron microbeam analysis is extended to a spacial problem to determine the smallest possible measurements of a cylindrical particle P of high D (depth resolution) and diameter L (lateral resolution) embeded in a matrix M and which has to be analysed quantitative with the accuracy q. The mathematical accounts lead to the following form of the characteristic x-ray intens ity of the element i of a particle P embeded in the matrix M in relation to the intensity of a standard S

Substitution–dilution method to correct the matrix effect in multi-element quantitative analysis by X-ray fluorescence

2001 ◽  
Vol 56 (2) ◽  
pp. 187-201 ◽  
Author(s):  
F Bosch-Reig ◽  
J.V Gimeno-Adelantado ◽  
S Sánchez-Ramos ◽  
D.J Yusá-Marco ◽  
F Bosch-Mossi
Keyword(s):  
Quantitative Analysis ◽  
Matrix Effect ◽  
Dilution Method ◽  
X Ray ◽  
The Matrix

Particle Size Effects in Geological Analyses by X-Ray Fluorescence

1985 ◽  
Vol 29 ◽  
pp. 587-592
Author(s):  
K.K. Nielson ◽  
V.C. Rogers
Keyword(s):  
Particle Size ◽  
Quantitative Analysis ◽  
Size Effects ◽  
Light Element ◽  
New Method ◽  
X Ray ◽  
Particle Size Effects ◽  
Sample Matrix ◽  
Xrf Analysis ◽  
The Matrix

Particle-size effects can cause significant errors in x-ray fluorescence (XRF) analysis of particulate materials. The effects are usually removed when samples are fused or dissolved to standardize the matrix for quantitative analysis. Recent improvements in numerical matrix corrections reduce the need to standardize the sample matrix via fusion or dissolution, particularly when the CEMAS method is used to estimate unmeasured light-element components of undefined materials for matrix calculations. A new method to correct for particle-size effects has therefore been examined to potentially avoid the need for destructive preparation of homogeneous samples.

“Standardless” Quantitative Analysis by Electron-Excited Energy Dispersive X-Ray Spectrometry: What is its Proper Role?

1998 ◽  
Vol 4 (S2) ◽  
pp. 194-195
Author(s):  
Dale E. Newbury
Keyword(s):  
Quantitative Analysis ◽  
Energy Dispersive ◽  
K Value ◽  
X Ray ◽  
Electron Probe Microanalyzer ◽  
Proper Role ◽  
Wide Range ◽  
Measured Characteristic ◽  
Electron Range

The development of energy dispersive x-ray spectrometry (EDS) has had a profound impact on the methodology of quantitative x-ray microanalysis of thick specimens (i.e., thickness≫ electron range) as performed in electron beam instruments. By equipping the scanning electron microscope (SEM) with EDS, quantitative x-ray microanalysis has become commonly available to a wide range of users, at least some of whom have only a modest background in analytical science. An important aspect of the development of quantitative analysis by EDS has been the extensive analytical experience gained during the development of the electron probe microanalyzer (EPMA) equipped with wavelength dispersive x-ray spectrometers (WDS). The critical measurement step for quantitative WDS analysis was recognized to be the determination of the “k-value”:k = Iunk / Istd (1)where I is the measured characteristic intensity of a specific x-ray peak, corrected for background and peak overlaps, for both the unknown and the standard.

scholarly journals Investigation of Y2.1Er0.9(ScxGa1−x)5O12 Matrix Components on the Spectral Properties around 3.0 μm by Micro-Pulling-Down Method

Crystals ◽  
2019 ◽  
Vol 9 (3) ◽  
pp. 138
Author(s):  
Zhijiang Che ◽  
Jian Zhang ◽  
Baiyi Wu ◽  
Qiangqiang Hu ◽  
Wenxiang Mu ◽  
...  
Keyword(s):  
Fluorescence Spectra ◽  
Room Temperature ◽  
Lattice Vibration ◽  
Emission Spectra ◽  
X Ray Diffraction ◽  
Mid Infrared ◽  
X Ray ◽  
Electron Probe Microanalyzer ◽  
The Matrix ◽  
Crystal Fibers

Single crystal fibers of 30% Er3+-doped compound of Y3(ScxGa1−x)5O12 have been grown by using the micro-pulling down (μ-PD) technique successfully. Our main purpose is to tune the fluorescence properties by adjusting the ratios of Sc3+ and Ga3+ ions inside the matrix crystals. The crystal structures of the series compounds were measured and analyzed through X-ray diffraction (XRD) measurements. The components and doping elements distributions were measured by the X-ray Fluorescence spectrometry and electron-probe microanalyzer. The absorption and mid-infrared fluorescence spectra, including the fluorescent lifetime of Er3+:4I13/2 and 4I11/2 levels were measured and compared systematically at room temperature. Spectral analysis indicated that the fluorescent lifetime of Er3+:4I13/2 tended to shorten and the emission spectra began to show a red shift when the proportion of YSG increased in the compound. Furthermore, the Raman spectra were measured to reveal the variations of lattice vibration and phonon energy.

Quantitative Analysis of LIBS Reduces the Matrix Effect Methods

2013 ◽  
Vol 313-314 ◽  
pp. 579-582
Author(s):  
You Liang Yang ◽  
Jun Xiang Li ◽  
Fan Wei Meng ◽  
Cui Hong Ma
Keyword(s):  
Quantitative Analysis ◽  
Matrix Effect ◽  
Correction Method ◽  
Analysis Method ◽  
Network Reduction ◽  
Breakdown Spectroscopy ◽  
Laser Induced Breakdown ◽  
The Matrix ◽  
Quantitative Analysis Method ◽  
The Impact

This paper introduced the principle about the technology of Laser-induced Breakdown Spectroscopy (LIBS) of quantitative analysis. It was reviewed about the quantitative analysis of LIBS reduced method of matrix. The reason of cause matrix effect was not clear, but the matrix effect on the LIBS quantitative analysis of the impact can not be ignored. The LIBS quantitative analysis method was divided into two categories: one was based on the calibration curve with the mathematical matrix correction method; the other was combined with neural network reduction method of matrix. This paper was introduced for the two categories of methods, and gives an example to explain.

Correction of Matrix Effect in Multielemental Quantitative Analysis by X-Ray Fluorescence Spectroscopy Using the Linear Behavior in the Analytical Range of the Substitution-Dilution Method

2002 ◽  
Vol 56 (1) ◽  
pp. 58-61
Author(s):  
F. Bosch-Reig ◽  
J. V. Gimeno-Adelantado ◽  
S. Sánchez-Ramos ◽  
D. J. Yusá-Marco ◽  
F. Bosch-Mossi ◽  
...  
Keyword(s):  
Quantitative Analysis ◽  
Matrix Effect ◽  
Linear Range ◽  
Factor H ◽  
Dilution Method ◽  
X Ray ◽  
Linear Behavior ◽  
Relative Standard ◽  
The Matrix ◽  
Analytical Range

This paper is an analytical study of the possibility of applying the linear range of the substitution-dilution method to correct the matrix effect in quantitative analysis by X-ray fluorescence (XRF) spectroscopy. The analytical range is obtained from a series of samples prepared in the form of glass discs by substituting the unknown sample with a standard sample (substitution factor, h) including a diluent-melt. In general, the substitution-dilution method is hyperbolic in character and therefore the diluent is required to ensure linear behavior between If vs. h in the experimental range. The linear range is located between the concentrations of standard and unknown for each element analyzed. This linear model makes it possible to correct the matrix effect in quantitative analysis by XRF using a single multi-elemental standard for different types of samples with a complex matrix, such as geologicals and cements. The results found for Si, Ti, Al, Fe, Mn, Ca, K, and P in soil and sediment samples and Si, Fe, Al, Ca, and K in cements (white and gray) are statistically satisfactory. Thus, the mean relative standard deviation calculated for all analytes in each sample was: ±4.0% and ±5.0% in soils; ±5.0% in sediments; and ±6.0% or ±3.0% in cements, white and gray, respectively.

Quantitative Analysis and High-Resolution X-ray Mapping with a Field Emission Electron Microprobe

2013 ◽  
Vol 21 (3) ◽  
pp. 10-15 ◽  
Author(s):  
C. Hombourger ◽  
M. Outrequin
Keyword(s):  
Quantitative Analysis ◽  
High Resolution ◽  
Field Emission ◽  
Spatial Resolution ◽  
Electron Microprobe ◽  
Electron Probe ◽  
Chemical Elements ◽  
Electron Source ◽  
X Ray ◽  
Electron Probe Microanalyzer

The electron probe microanalyzer (EPMA) provides quantitative analysis for nearly all chemical elements with a spatial resolution of analysis about ~1 μm, which is relevant to microstructures in a wide variety of materials and mineral specimens. Recent implementation of the Schottky emitter field-emission gun (FEG) electron source in the EPMA has significantly improved the spatial resolution and detectability of the EPMA technique.

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