scholarly journals Термодинамические свойства оксипентафторида ванадия (IV), (NH-=SUB=-4-=/SUB=-)-=SUB=-3-=/SUB=-VOF-=SUB=-5-=/SUB=-

2020 ◽  
Vol 62 (7) ◽  
pp. 1123
Author(s):  
Е.В. Богданов ◽  
Е.И. Погорельцев ◽  
А.В. Карташев ◽  
М.В. Горев ◽  
М.С. Молокеев ◽  
...  
Keyword(s):  
Phase Transitions ◽  
Photoelectron Spectroscopy ◽  
Single Phase ◽  
Dielectric Studies ◽  
X Ray Diffraction ◽  
X Ray ◽  
Limits Of Stability ◽  
Three Phase ◽  
Temperature Dependences ◽  
Spectroscopy Studies

Abstract The (NH_4)_3VOF_5 crystals have been synthesized and their homogeneity and single-phase structure has been established by the X-ray diffraction, energy dispersive spectroscopy, and X-ray photoelectron spectroscopy studies. The investigations of the temperature dependences of specific heat, entropy, strain, and pressure susceptibility show the occurrence of three phase transitions caused by the structural transformations in the (NH_4)_3VOF_5 crystals. The T – p phase diagram shows the temperature limits of stability of the crystalline phases implemented in (NH_4)_3VOF_5. The optical and dielectric studies disclose the ferroelastic nature of the phase transitions. An analysis of the experimental data together with the data on the isostructural (NH_4)_3VO_2F_4 crystal makes it possible to distinguish the physical properties of oxyfluorides containing vanadium of different valences (IV and V).

X-ray diffraction spectroscopy and X-ray photoelectron spectroscopy studies of Cu-doped ZnO films

2009 ◽  
Vol 41 (5) ◽  
pp. 788-791 ◽  
Author(s):  
H. Xue ◽  
Y. Chen ◽  
X.L. Xu ◽  
G.H. Zhang ◽  
H. Zhang ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Zno Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Doped Zno ◽  
Spectroscopy Studies

scholarly journals Dielectric and Raman studies of Ba0.06(Na1/2Bi1/2)0.94TiO3–NaNbO3 ceramics

2016 ◽  
Vol 34 (2) ◽  
pp. 437-445 ◽  
Author(s):  
Sumit K. Roy ◽  
S. Chaudhuri ◽  
R.K. Kotnala ◽  
D.K. Singh ◽  
B.P. Singh ◽  
...  
Keyword(s):  
Single Phase ◽  
Solid State Reaction Method ◽  
Lead Free ◽  
Orthorhombic Symmetry ◽  
Dielectric Studies ◽  
X Ray Diffraction ◽  
Reaction Method ◽  
X Ray ◽  
New Phase ◽  
Diffusivity Parameter

AbstractIn this work the X-ray diffraction, scanning electron microscopy, Raman and dielectric studies of lead free perovskite (1 – x)Ba0.06(Na1/2Bi1/2)0.94TiO3–xNaNbO3 (0 ⩽ x ⩽ 1.0) ceramics, prepared using a standard solid state reaction method, were investigated. X-ray diffraction studies of all the ceramics suggested the formation of single phase with crystal structure transforming from rhombohedral-tetragonal to orthorhombic symmetry with the increase in NaNbO3 content. Raman spectra also confirmed the formation of solid solution without any new phase. Dielectric studies showed that the phase transition is of diffusive character and diffusivity parameter decreases with increasing NaNbO3 content. The compositional fluctuation was considered to be the main cause of diffusivity.

DIELECTRIC, FERROELECTRIC, PIEZOELECTRIC AND IMPEDANCE STUDY OF LEAD-FREE CERAMIC: SrBi4Ti3.975Zr0.025O15

2012 ◽  
Vol 02 (04) ◽  
pp. 1250023 ◽  
Author(s):  
B. MAMATHA ◽  
P. SARAH
Keyword(s):  
Single Phase ◽  
Electromechanical Coupling ◽  
Xrd Analysis ◽  
Coupling Coefficients ◽  
X Ray Diffraction ◽  
Solid State Reaction Technique ◽  
Debye Relaxation ◽  
X Ray ◽  
Resonance Frequencies ◽  
Spectroscopy Studies

Polycrystalline SrBi4Ti3.975Zr0.025O15 (SBTZ) was prepared using solid-state reaction technique. SBTZ was characterized by X-ray diffraction (XRD) and scanning electron microscopy (SEM). XRD analysis indicated the formation of a single-phase orthorhombic structure. Particle size was found using SEM. The dielectric, ferroelectric, piezoelectric, modulus and impedance spectroscopy studies on SBTZ were investigated in the frequency range 1 Hz–1 MHz from room temperature (RT) to 600°C. Piezoelectric charge and electromechanical coupling coefficients were calculated from resonance and anti-resonance frequencies. Impedance and modulus plots were used as tools to analyze the sample behavior as a function of frequency. Cole–Cole plots showed a non-Debye relaxation. Conductivity measurements were performed on SBTZ.

The location and effects of Si in (Ti1–xSix)Ny thin films

2009 ◽  
Vol 24 (8) ◽  
pp. 2483-2498 ◽  
Author(s):  
Axel Flink ◽  
Manfred Beckers ◽  
Jacob Sjölén ◽  
Tommy Larsson ◽  
Slawomir Braun ◽  
...  
Keyword(s):  
Thin Films ◽  
Grain Boundaries ◽  
Photoelectron Spectroscopy ◽  
Single Phase ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Arc Evaporation ◽  
Annealing Experiments ◽  
Tissue Phase

(Ti1–xSix)Ny (0 ≤ x ≤ 0.20; 0.99 ≤ y(x) ≤ 1.13) thin films deposited by arc evaporation have been investigated by analytical transmission electron microscopy, x-ray diffraction, x-ray photoelectron spectroscopy, and nanoindentation. Films with x ≤ 0.09 are single-phase cubic (Ti,Si)N solid solutions with a dense columnar microstructure. Films with x > 0.09 have a featherlike microstructure consisting of cubic TiN:Si nanocrystallite bundles separated by metastable SiNz with coherent-to-semicoherent interfaces and a dislocation density of as much as 1014 cm−2 is present. The films exhibit retained composition and hardness between 31 and 42 GPa in annealing experiments to 1000 °C due to segregation of SiNz to the grain boundaries. During annealing at 1100–1200 °C, this tissue phase thickens and transforms to amorphous SiNz. At the same time, Si and N diffuse out of the films via the grain boundaries and TiN recrystallize.

Structural, Magnetic and Magneto-tranport Properties of Reactive-sputtered Fe3O4 Thin Films

2010 ◽  
Vol 1250 ◽  
Author(s):  
Xinghua Wang ◽  
Sarjoosing Goolaup ◽  
Peng Ren ◽  
Wen Siang Lew
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Single Phase ◽  
Native Oxide ◽  
X Ray Diffraction ◽  
Verwey Transition ◽  
Electrical Measurements ◽  
Metal Insulator ◽  
X Ray ◽  
Sample Measurement

AbstractThin films of magnetite (Fe3O4) are grown on a single-crystal Si/SiO2 (100) substrate with native oxide using DC reactive sputtering technique at room tempreture (RT) and 300C. The x-ray diffraction(XRD) result shows the thermal energy during deposition enhances the crystallization of the Fe3O4 and x-ray photoelectron spectroscopy confirms the film deposited at 300C is single-phase Fe3O4 while the film deposited at RT is mostly ν-Fe2O3. The electrical measurements show that the resistivity of the Fe3O4 film increases exponentially with decreasing temperature, and exhibit a sharp metal-insulator transition at around 100 K, indicating the Verwey transition feature. The saturation magnetization Ms of Fe3O4 film measured by vibrating sample measurement (VSM) at RT was found to be 445 emu/cm3.

scholarly journals S tudies on the phase transitions and properties of tungsten (VI) oxide nanoparticles by X - Ray diffraction (XRD) and thermal analysis

2017 ◽  
Vol 26 (1) ◽  
Author(s):  
S.F. Abdullah ◽  
S. Radiman ◽  
M.A. Abdul Hamid ◽  
N.B. Ibrahim
Keyword(s):  
Thermal Analysis ◽  
Phase Transitions ◽  
Photoelectron Spectroscopy ◽  
Average Diameter ◽  
Amorphous Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Calcination Temperatures ◽  
Transmission Electron ◽  
Scherrer Formula

Tungsten (VI) oxide, WO3nanoparticles were synthesized by colloidal gas aphrons(CGAs) technique.The resultant WO3nanoparticleswere characterized by thermogravimetric-differential thermal analysis (TG-DTA) and X-Ray diffraction (XRD) measurements in order to determine the phase transitions, the crystallinity and the size of theWO3nanoparticles. As a comparison, transmission electron microscope (TEM) was used to investigate the size of the WO3nanoparticles. The result from XRD and DTA show that the formation of polymorphsWO3nanoparticles have the following sequence: orthorhombic (b-WO3)®monoclinic (g-WO3) ®triclinic (d-WO3) ®monoclinic (e-WO3) with respect to the calcination temperature of 400, 500, 600 and 700°C. No diffraction peaks were found in the X-Ray diffraction measurements for the sample heat treated at 300°C (as-prepared), suggesting that an amorphous structure was obtained at this temperature whereas the crystallinity had been obtained by the other samples of theWO3nanoparticles at the calcination temperatures of 400, 500, 600 and 700°C. It is also found that the X-Ray diffraction measurements produced an average diameter of (30 ±5), (50 ±5), (150 ±10) and (200 ±10) nm at calcination temperatures of 400, 500, 600 and 700°C respectively by using Debye-Scherrer formula. The TG curve revealed that the WO3nanoparticles is purely anhydrous since the weight loss is insignificant (0.3 –1.4) % from 30 until 600°C for the WO3nanoparticles calcined at 400°C. Finally, the composition and the purity of the WO3nanoparticleshave been examined by X-Ray photoelectron spectroscopy (XPS). Theresults indicate no significant changes to the composition and the purity of the WO3nanoparticle produced due to the temperature variations 

scholarly journals The Polythermal Section of Ti-22Al-xNb (30-78at.%Ti) in Ti–Al–Nb System

Metals ◽  
2020 ◽  
Vol 10 (7) ◽  
pp. 871
Author(s):  
Yun Zhao ◽  
Li-Bin Liu ◽  
Li-Gang Zhang ◽  
Jia-Jun Yang ◽  
Patrick J. Masset
Keyword(s):  
Single Phase ◽  
Invariant Reaction ◽  
Polythermal Section ◽  
Electron Probe Micro Analysis ◽  
X Ray Diffraction ◽  
Two Phase ◽  
X Ray ◽  
Three Phase ◽  
Micro Analysis ◽  
O Phase

The polythermal section of Ti-22Al-xNb (30–78 at.% Ti) in the Ti-Al-Nb system was studied using X-ray diffraction analysis (XRD), differential thermal analysis (DSC), and electron probe micro-analysis (EPMA). No new ternary compounds were found in this work. The polythermal section has five three-phase regions, nine two-phase regions, and three single-phase regions. The O phase transition is confirmed to occur below 1000 °C. A four-phase invariant reaction β + σ → O + δ was found at 931 °C.

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