scholarly journals Nanocharacterization of metallic thin films deposited on different substrates

2020 ◽  
Vol 38 (1) ◽  
pp. 8-16
Author(s):  
Violeta V. Merie ◽  
Nicolae V. Burnete ◽  
Corina Bîrleanu ◽  
Marius Pustan
Keyword(s):  
Thin Films ◽  
Friction Force ◽  
Modulus Of Elasticity ◽  
Substrate Material ◽  
Plastic Substrate ◽  
Metallic Thin Films ◽  
3D Image ◽  
Force Analysis ◽  
Variation Rule

AbstractThe purpose of this study was to determine the influence of different substrates (C45 steel, polycarbonate, glass) on the topography as well as tribological and mechanical properties (nanohardness, modulus of elasticity and friction force) of aluminum, gold and silver thin films. The 3D image analysis showed a strong influence of the substrate material on the topography of the studied thin films with no certain variation rule. Using the Oliver and Pharr method for determining nanohardness it was observed that, the smallest values were obtained for the thin films deposited on plastic substrate, followed by glass and C45 steel, regardless of the deposited material. The determination of the modulus of elasticity was done using the Hertzian method. The obtained results showed that the highest values of this parameter were obtained for the films deposited on plastic substrate, while the lowest values depended on both the deposited material and substrate. Friction force analysis for aluminum and gold showed a significant impact of the substrate material, with more constant values for gold. As a consequence, one must pay a particular attention when choosing the material for the substrate on which the thin films are deposited.

Far infrared spectra of amorphous-Si:H thin films on polyethylene

1983 ◽  
Vol 61 (2) ◽  
pp. 305-308
Author(s):  
M. S. Mathur ◽  
H. C. Card ◽  
K. C. Kao ◽  
S. R. Mejia ◽  
G. C. Tabisz
Keyword(s):  
Thin Films ◽  
Microwave Plasma ◽  
Chemical Vapour ◽  
Far Infrared ◽  
Substrate Material ◽  
Absorption Bands ◽  
Silicon Thin Films ◽  
Infrared Measurements ◽  
Hydrogenated Amorphous

Hydrogenated amorphous-silicon thin films (a-Si:H) were deposited by microwave plasma chemical-vapour decomposition of SiH4, on thin polyethylene sheets. The high-resolution, far infrared measurements were performed on these films in the 700–50 cm−1 region on a Nicolet far infrared interferometer. The use of polyethylene as the substrate material permitted the determination of the absorption bands at 656.4, 652, 639.4, and 543 cm−1 with a shoulder at 539 cm−1 and a broad feature at 70.8 cm−1. These features provided evidence for SiH, SiH2 (as predicted by Lucovsky et al.), and SiH3 combinations in the film, as well as far more complex systems.

Specific Heat Determination of Metallic Thin Films at Room Conditions

2015 ◽  
Vol 137 (5) ◽  
Author(s):  
J. M. Lugo ◽  
V. Rejón ◽  
A. I. Oliva
Keyword(s):  
Thin Films ◽  
Specific Heat ◽  
Thermal Model ◽  
Electronic Device ◽  
Metallic Thin Films ◽  
Electric Pulses ◽  
Glass Substrates ◽  
Film Substrate ◽  
Analytical Thermal Model

A methodology to evaluate the specific heat of metallic thin films at constant pressure and 300 K by means of the heating profile is proposed. Changes on the electrical resistance of metallic films after the application of short electric pulses (20–500 μs) are correlated with changes of temperature of the films. Electric pulses are applied on films by an implemented electronic device. A proposed analytical thermal model predicts the correlation between the duration of the electric pulses and the thermal profiles of the film/substrate systems. The analytical thermal model and the measured thermal profiles results are useful to evaluate the specific heat of films. Following this methodology, Au and Al nanofilms evaporated on glass substrates were analyzed. Results indicate that specific heat values of Au films decrease from (229 ± 15) J/kg K to (125 ± 8) J/kg K, and for Al films from (1444 ± 89) J/kg K to (947 ± 53) J/kg K, for film thicknesses from 20 to 200 nm.

Electronic Determination of the Modulus of Elasticity and Intrinsic Stress of Thin Films using Capacitive Bridges

1992 ◽  
Vol 276 ◽  
Author(s):  
Sha Wang ◽  
Selden Crary ◽  
Khalil Najafi
Keyword(s):  
Thin Films ◽  
Modulus Of Elasticity ◽  
Intrinsic Stress ◽  
Theoretical Concepts ◽  
Bridge Structures

ABSTRACTWe extend the method of Najafi and Suzuki [1] for the electronic determination of the modulus of elasticity and intrinsic stress of thin films using capacitive bridge structures. New theoretical concepts are introduced. The extended method does not require that the test structures be exercised to the point of snap-action.

Determination of the mechanical properties of metallic thin films and substrates from indentation tests

2002 ◽  
Vol 82 (10) ◽  
pp. 2013-2029 ◽  
Author(s):  
K. Tunvisut ◽  
E. P. Busso ◽  
N. P. O'dowd ◽  
H. P. Brantner
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Metallic Thin Films ◽  
Indentation Tests

scholarly journals Determination of flexure arrow a felled tree

2017 ◽  
Vol 6 (2) ◽  
pp. 105-109
Author(s):  
Ушницкий ◽  
Aleksandr Ushnickiy ◽  
Григорьев ◽  
Mihail Grigor'ev
Keyword(s):  
Friction Force ◽  
Wood Density ◽  
Modulus Of Elasticity ◽  
Ground Surface ◽  
Bending Moment ◽  
Vertical Load ◽  
Body Of Revolution ◽  
Truncated Cone

It is known that the vertical load on the skidder including depends on the size characteristics hauling felled trees. In this case vertical load on the tractor is equal to the weight having caved in portion trees portion by the lower part of the tree cuta-way to the point of lifted from the ground surface and bending moment. For a determination of the weight the immersed por-tion is accounted distribution of mass along the length of felled trees wood density, modulus of elasticity and the friction force in felled trees the bundle. To simplify the calculation was performed at the following assumptions: a generator trunks accept how to defining body of revolution (truncated cone); wood density is uniform over the volume of that part of felled trees which is seen currently.

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