Surface composition analysis of Au-Cu alloy by a scanning auger electron microscope.

Abstract This paper deals with the morphology and surface chemistry of faceted voids existing in singlequasicrystalline icosahedral Al70.5Pd21.0Mn8.5. By observation with a scanning electron microscope of surfaces obtained by cleavage of the quasicrystal, the habit planes of the dodecahedral voids were identified. The chemical surface composition of the void surface was determined by Auger electron spectroscopy after cleavage in ultra-high vacuum.

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Deviations from Ideal Decagonal Symmetry in Electron Diffraction Patterns of the “Decagonal” Phase in the Al-Co-Cu Alloy System

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100088889 ◽

1991 ◽

Vol 49 ◽

pp. 914-915

Author(s):

Atul S. Ramani ◽

Earle R. Ryba ◽

Paul R. Howell

Keyword(s):

Electron Microscope ◽

Alloy System ◽

Nominal Composition ◽

Dimensional Lattice ◽

3 Dimensional ◽

Decagonal Phase ◽

Cu Alloy ◽

Transmission Electron ◽

Lattice Periodicity ◽

Diffraction Patterns

The “decagonal” phase in the Al-Co-Cu system of nominal composition Al65CO15Cu20 first discovered by He et al. is especially suitable as a topic of investigation since it has been claimed that it is thermodynamically stable and is reported to be periodic in the dimension perpendicular to the plane of quasiperiodic 10-fold symmetry. It can thus be expected that it is an important link between fully periodic and fully quasiperiodic phases. In the present paper, we report important findings of our transmission electron microscope (TEM) study that concern deviations from ideal decagonal symmetry of selected area diffraction patterns (SADPs) obtained from several “decagonal” phase crystals and also observation of a lattice of main reflections on the 10-fold and 2-fold SADPs that implies complete 3-dimensional lattice periodicity and the fundamentally incommensurate nature of the “decagonal” phase. We also present diffraction evidence for a new transition phase that can be classified as being one-dimensionally quasiperiodic if the lattice of main reflections is ignored.

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The formation of low temperature Cu3Si in Ag(Cu)/Si structure upon annealing and its effects on adhesion and resistivity

MRS Proceedings ◽

10.1557/proc-766-e3.15 ◽

2003 ◽

Vol 766 ◽

Cited By ~ 3

Author(s):

Sungjin Hong ◽

Seob Lee ◽

Yeonkyu Ko ◽

Jaegab Lee

Keyword(s):

Low Temperature ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Si Substrate ◽

Copper Silicide ◽

Alloy Films ◽

Cu Alloy ◽

Cu Film ◽

Rapid Drop

AbstractThe annealing of Ag(40 at.% Cu) alloy films deposited on a Si substrate at 200 – 800 oC in vacuum has been conducted to investigate the formation of Cu3Si at the Ag-Si interface and its effects on adhesion and resistivity of Ag(Cu)/Si structure. Auger electron spectroscopy(AES) analysis showed that annealing at 200°C allowed a diffusion of Cu to the Si surface, leading to the significant reduction in Cu concentration in Ag(Cu) film and thus causing a rapid drop in resistivity. In addition, the segregated Cu to the Si surface reacts with Si, forming a continuous copper silicide at the Ag(Cu)/Si interface, which can contribute to an enhanced adhesion of Ag(Cu)/Si annealed at 200 oC. However, as the temperature increases above 300°C, the adhesion tends to decrease, which may be attributed to the agglomeration of copper silicide beginning at around 300°C.

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Potential profiling across semiconductor junctions by Auger electron spectroscopy in the scanning electron microscope

Journal of Applied Physics ◽

10.1063/1.321587 ◽

1975 ◽

Vol 46 (12) ◽

pp. 5214-5217 ◽

Cited By ~ 9

Author(s):

J. R. Waldrop ◽

J. S. Harris

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Scanning Electron

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Composition Analysis of Ge Graded Si1-xGex Alloy Films by Capacitance-Voltage Method

Advanced Materials Research ◽

10.4028/www.scientific.net/amr.383-390.7613 ◽

2011 ◽

Vol 383-390 ◽

pp. 7613-7618

Author(s):

Y. Yang ◽

F. Yu ◽

Ping Han ◽

R.P. Ge ◽

L. Yu

Keyword(s):

Chemical Vapor Deposition ◽

Band Gap ◽

Vapor Deposition ◽

Auger Electron ◽

Chemical Vapor ◽

Composition Analysis ◽

Alloy Films ◽

Capacitance Voltage ◽

Capacitance Characteristics ◽

Contact Barrier

Capacitance-voltage method was used to analyze composition of the Si1-xGex alloy films with a stochiometry gradient of Ge, which were epitaxially grown on Si (100) substrate by chemical vapor deposition. Using the capacitance characteristics of Si1-xGex/Si obtained by applying a reserve bias to the Hg electrode probe, the contact barrier height for Hg/Si1-xGexjunction and Si1-xGex/Si junction, and band gap of SSi1-xGex were estimated respectively. With the band gap of Si1-xGex, composition of Si1-xGex in Hg/Si1-xGex junction and Si1-xGex/Si junction were further obtained. Because analyzed Si1-xGex was formed through bilateral inter-diffusion of Si into the epilayer and Ge into the substrate during the deposition, Ge distribution from surface to substrate in Si1-xGex alloy films can be figured out by fitting to diffusion exponential function. The Ge distribution acquired this way was in accordance with the depth profile by auger electron spectrum.

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A Multichannel Monitor for Repetitive Auger Electron Spectroscopy with Application to Surface Composition Changes

Review of Scientific Instruments ◽

10.1063/1.1684816 ◽

1970 ◽

Vol 41 (9) ◽

pp. 1349-1354 ◽

Cited By ~ 15

Author(s):

E. N. Sickafus ◽

A. D. Colvin

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Composition ◽

Composition Changes

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The Effect of Nano-Particles and Water Glass on the Water Stability of Magnesium Phosphate Cement Based Mortar

Materials ◽

10.3390/ma12223755 ◽

2019 ◽

Vol 12 (22) ◽

pp. 3755 ◽

Cited By ~ 1

Author(s):

Hu Feng ◽

Xiangyu Zhao ◽

Gang Chen ◽

Changwei Miao ◽

Xiaocong Zhao ◽

...

Keyword(s):

Electron Microscope ◽

Water Glass ◽

Water Immersion ◽

Nano Particles ◽

Magnesium Phosphate ◽

Composition Analysis ◽

Water Stability ◽

X Ray Diffraction ◽

X Ray ◽

Scanning Electron

This paper experimentally presented the water stability of magnesium phosphate cement (MPC) modified by nano-Al2O3 (NA), nano-Fe2O3 (NF) and water glass (WG). The optimal addition of 6% NA, 2% NF and 1% WG significantly improved the water stability of MPC mortar by 86%, 101% and 96% after 28 days of water immersion, respectively. X-Ray Diffraction (XRD) and Scanning Electron Microscope (SEM) were used to analyze the water stability of MPC modified by NA, NF and WG. The results of the micrograph and composition analysis revealed that the proper amount of NA, NF or WG could fill the micro pores and improve the hydration of interior structures of MPC mortar. Thus, the microstructural compactness was satisfied to keep a good water stability of MPC mortar.

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