scholarly journals Development of Thermal Plasma Jet Induced Annealing Technology and Its Application to Electronic Device Fabrication

2017 ◽  
Vol 60 (3) ◽  
pp. 77-80 ◽  
Author(s):  
Seiichiro HIGASHI
2007 ◽  
Vol 515 (12) ◽  
pp. 4897-4900 ◽  
Author(s):  
T. Okada ◽  
S. Higashi ◽  
H. Kaku ◽  
N. Koba ◽  
H. Murakami ◽  
...  

2005 ◽  
Vol 244 (1-4) ◽  
pp. 8-11 ◽  
Author(s):  
H. Kaku ◽  
S. Higashi ◽  
H. Taniguchi ◽  
H. Murakami ◽  
S. Miyazaki

Author(s):  
Takuma Sato ◽  
Hiroaki Hanafusa ◽  
Seiichiro HIGASHI

Abstract Crystalline-germanium (c-Ge) is an attractive material for a thin-film transistor (TFT) channel because of its high carrier mobility and applicability to a low-temperature process. We present the electrical characteristics of c-Ge crystallized by atmospheric pressure micro-thermal-plasma-jet (µ-TPJ). The µ-TPJ crystalized c-Ge showed the maximum Hall mobility of 1070 cm2·V−1·s−1 with its hole concentration of ~ 1016 cm−3, enabling us to fabricate the TFT with field-effect mobility (μ FE) of 196 cm2·V−1·s−1 and ON/OFF ratio (R ON/OFF) of 1.4 × 104. On the other hand, RON/OFFs and μFEs were dependent on the scanning speed of the TPJ, inferring different types of defects were induced in the channel regions. These findings show not only a possibility of the TPJ irradiation as a promising method to make a c-Ge TFT on insulating substrates.


2008 ◽  
Vol 36 (4) ◽  
pp. 1066-1067 ◽  
Author(s):  
J. Hlina ◽  
Z. Sekeresova ◽  
J. Sonsky

Carbon ◽  
2016 ◽  
Vol 106 ◽  
pp. 48-55 ◽  
Author(s):  
Myung Woo Lee ◽  
Hyun-Young Kim ◽  
Hyeokjin Yoon ◽  
Juhan Kim ◽  
Jung Sang Suh

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