Investigation of atomically thin films: state of the art

2020 ◽  
Vol 191 (01) ◽  
pp. 30-51
Author(s):  
Konstantin V. Larionov ◽  
Pavel B. Sorokin
Keyword(s):  
Thin Films ◽  
State Of The Art

scholarly journals Mesoporous TiO2 Thin Films: State of the Art

2018 ◽  
Author(s):  
Francesca Scarpelli ◽  
Teresa F. Mastropietro ◽  
Teresa Poerio ◽  
Nicolas Godbert
Keyword(s):  
Thin Films ◽  
State Of The Art ◽  
Mesoporous Tio2 ◽  
Tio2 Thin Films

Opportunities and challenges for electrochemistry in studying the electronic structure of nanocrystals

2019 ◽  
Vol 21 (18) ◽  
pp. 8992-9001 ◽  
Author(s):  
Michelle Weber ◽  
Sophia Westendorf ◽  
Björn Märker ◽  
Kai Braun ◽  
Marcus Scheele
Keyword(s):  
Thin Films ◽  
Electronic Structure ◽  
State Of The Art ◽  
The State ◽  
Spectroscopic Methods

We review the state-of-the-art of determining the electronic structure of nanocrystals in thin films by electrochemistry and emphasize the benefits of correlating electrochemical with spectroscopic methods to this end.

Thermoelectric Properties of C-Axis-Oriented Ca3Co4O9+δ Films Grown on MgO-Buffered Si (100) by PLD Technique

2010 ◽  
Vol 29-32 ◽  
pp. 1913-1918
Author(s):  
Xia Zhang ◽  
Hong Chen ◽  
Qiu Hui Liao ◽  
Xia Li
Keyword(s):  
Thin Films ◽  
State Of The Art ◽  
Pulsed Laser ◽  
Buffer Layers ◽  
Laser Deposition ◽  
X Ray Diffraction ◽  
High Quality ◽  
X Ray ◽  
Current State ◽  
Good Crystallinity

High-quality c-axis-oriented Ca3Co4O9+δ thin films have been grown directly on Si (100) wafers with inserting MgO buffer layers by pulsed-laser deposition (PLD). X-ray diffraction and scan electron microscopy show good crystallinity of the Ca3Co4O9+δ films. The resistivity and Seebeck coefficient of the Ca3Co4O9+δ thin films on Si (100) substrates are 9.8 mΩcm and 189 μV/K at the temperature of 500K, respectively, comparable to the single-crystal samples. This advance demonstrates the possibility of integrating the cobaltate-based high thermoelectric materials with the current state-of-the-art silicon technology for thermoelectricity-on-a-chip applications.

The Analysis of Depth-Sensing Indentation Data: Review of the Special Discussion Session

1993 ◽  
Vol 308 ◽  
Author(s):  
Shefford P. Baker ◽  
T.P. Weihs
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
State Of The Art ◽  
The State ◽  
Discussion Session ◽  
Depth Sensing ◽  
Recent Advances

In light of recent advances in the analysis of depth-sensing indentation data and of the importance of this technique in the study of the mechanical properties of thin films, a special discussion session was held in order to explore the state of the art and to provide an informal forum for discussion. This is a brief review of that discussion. The discussion was focused by the four main sources of deviation from model behavior described in the previous paper.

Critical evaluation of the state of the art of the analysis of light elements in thin films demonstrated using the examples of SiOXNY and AlOXNY films (IUPAC Technical Report)

2004 ◽  
Vol 76 (6) ◽  
pp. 1161-1213 ◽  
Author(s):  
Sabine Dreer ◽  
P. Wilhartitz
Keyword(s):  
Thin Films ◽  
State Of The Art ◽  
Relevant Literature ◽  
Critical Evaluation ◽  
Analytical Techniques ◽  
The State ◽  
Model Systems ◽  
Light Elements ◽  
Comprehensive Overview ◽  
Technical Report

The quantitative analysis of thin films containing light elements is very important in improving the coating processes and technological properties of the products. In order to review the state of the art of modern analytical techniques for such applications, the model systems SiOXNY and AlOXNY were selected. Over 1000 abstracts were screened, and the relevant literature was evaluated to give a comprehensive overview of instruments, analytical procedures and results, film types, deposition methods, and investigation goals. From more than 150 citations, the limitations, drawbacks, and pitfalls of the different methods were extracted and reviewed critically, while in addition, improvements were proposed where possible. These suggestions are combined with the newest results of investigation by the authors of this paper. Recommendations concerning the optimized combination of analytical methods for different analytical problems have been worked out on the basis of all results. Analysis of various multicomponent systems containing light elements demonstrated the applicability of the different methods of analysis in combination to all film systems with related compositions.

Sol-gel processing of PZT thin films: A review of the state-of-the-art and process optimization strategies

1995 ◽  
Vol 7 (1-4) ◽  
pp. 259-277 ◽  
Author(s):  
Robert W. Schwartz ◽  
Timothy J. Boyle ◽  
Steven J. Lockwood ◽  
Michael B. Sinclair ◽  
Duane Dimos ◽  
...  
Keyword(s):  
Thin Films ◽  
Process Optimization ◽  
State Of The Art ◽  
Sol Gel ◽  
The State ◽  
Pzt Thin Films ◽  
Gel Processing

High Sensitivity Nanosecond Mid-Infrared Transient Absorption Spectrometer Enabling Low Excitation Density Measurements of Electronic Materials

2016 ◽  
Vol 70 (10) ◽  
pp. 1726-1732 ◽  
Author(s):  
Adam Rimshaw ◽  
Christopher Grieco ◽  
John B. Asbury
Keyword(s):  
Thin Films ◽  
Transient Absorption ◽  
Electronic Materials ◽  
State Of The Art ◽  
High Sensitivity ◽  
Excitation Density ◽  
Time Resolved ◽  
Mid Infrared ◽  
Lock In ◽  
Vibrational Features

A dispersive nanosecond transient absorption instrument was developed to enable rapid time-resolved and steady-state measurements in the mid-infrared (mid-IR) region for thin films without the need for gated integrators or lock-in amplifiers. Two detectors are used depending on the experimental needs (100 MHz and 16 MHz) with time resolution from nano-millisecond and spectral coverage from 1000–5000 cm−1 (2000–10 000 nm). The instrument utilizes flexible digitization resolution (8 bit to 14 bit) to enable high sensitivity (10−5) measurements on thin films under low excitation (<50 µJ/cm2). We highlight the instrument’s improvement over prior state-of-the-art time-resolved capabilities by measuring transient species (e.g., polarons) under extremely low energy densities (<5 µJ/cm2) in less than 10 minutes to achieve high fidelity signals. Additionally, to highlight the spectral capabilities we study two optoelectronic materials for which we resolve vibrational features as small as 10 µOD.

State of the art in deterministic production of optical thin films

2008 ◽  
Author(s):  
D. Ristau ◽  
H. Ehlers ◽  
S. Schlichting ◽  
M. Lappschies
Keyword(s):  
Thin Films ◽  
State Of The Art

scholarly journals Polymer-II-VI Nanocrystals Blends: Basic Physics and Device Applications to Lasers and LEDs

Nanomaterials ◽  
2019 ◽  
Vol 9 (7) ◽  
pp. 1036 ◽  
Author(s):  
Marco Anni
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
State Of The Art ◽  
Actual State ◽  
Active Materials ◽  
Conjugated Molecules ◽  
Light Emitting ◽  
Basic Physics ◽  
Hybrid Thin Films ◽  
Device Applications

Hybrid thin films that combine organic conjugated molecules and semiconductors nanocrystals (NCs) have been deeply investigated in the previous years, due to their capability to provide an extremely broad tuning of their electronic and optical properties. In this paper we review the main aspects of the basic physics of the organic–inorganic interaction and the actual state of the art of lasers and light emitting diodes based on hybrid active materials.

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