scholarly journals In Situ Creep Behavior Characterization of Single Crystal Superalloy by UV-DIC at 980 °C

Coatings ◽  
2019 ◽  
Vol 9 (10) ◽  
pp. 598
Author(s):  
Yong Shang ◽  
Yali Dong ◽  
Yanling Pei ◽  
Chaoli Ma ◽  
Shusuo Li ◽  
...  
Keyword(s):  
Single Crystal ◽  
Creep Behavior ◽  
Creep Deformation ◽  
Image Correlation ◽  
Surface Pattern ◽  
Full Field ◽  
Uv Imaging ◽  
65 H

High temperature creep resistance is a critical characteristic of Ni-based single crystal (SX) superalloys. In this work, the creep behavior of a Ni-based SX superalloy was in situ characterized at 980 °C by ultraviolet (UV) imaging combined two-dimensional digital image correlation (DIC) in vacuum environment. The surface pattern was fabricated to maintain stable over 65 h at 980 °C. The pattern images captured by UV imaging were analyzed using mean gray value and the full-field strain map of creep deformation was obtained. A laser displacement senor (LDS) was employed for measuring the creep strain on the specimen for comparison. The creep deformation result shows a good agreement between DIC and LDS, the microstructure of the different creep areas on the specimens also demonstrate that the results of DIC are reliable. The in situ creep characterization by UV-DIC shows a great potential for investigating creep behaviors at high temperatures.

scholarly journals Strain Analysis on Electrochemical Failures of Nanoscale Silicon Electrode Based on Three-Dimensional In Situ Measurement

2020 ◽  
Vol 10 (2) ◽  
pp. 468 ◽  
Author(s):  
Zhifeng Qi ◽  
Zhongqiang Shan ◽  
Weihao Ma ◽  
Linan Li ◽  
Shibin Wang ◽  
...  
Keyword(s):  
Silicon Film ◽  
Three Dimensional ◽  
Strain Analysis ◽  
Image Correlation ◽  
Mechanical Parameters ◽  
Stress Strain ◽  
Full Field ◽  
Battery Capacity

Nanoscale silicon film electrodes in Li-ion battery undergo great deformations leading to electrochemical and mechanical failures during repeated charging-discharging cycles. In-situ experimental characterization of the stress/strain in those electrodes still faces big challenges due to remarkable complexity of stress/strain evolution while it is still hard to predict the association between the electrode cycle life and the measurable mechanical parameters. To quantificationally investigate the evolution of the mechanical parameters, we develop a new full field 3D measurement method combining digital image correlation with laser confocal profilometry and propose a strain criterion of the failure based on semi-quantitative analysis via mean strain gradient (MSG). The experimental protocol and results illustrate that the revolution of MSG correlates positively with battery capacity decay, which may inspire future studies in the field of film electrodes.

scholarly journals IN SITU CHARACTERIZATION OF FIBER-MATRIX INTERFACE DEBONDING VIA FULL-FIELD MEASUREMENTS

2021 ◽  
Author(s):  
ROBERT LIVINGSTON ◽  
BEHRAD KOOHBOR
Keyword(s):  
Field Measurements ◽  
Image Correlation ◽  
Interface Debonding ◽  
Matrix Interface ◽  
Full Field ◽  
Transverse Tension ◽  
Fiber Matrix Interface ◽  
Fiber Matrix

Macroscopic mechanical and failure properties of fiber-reinforced composites depend strongly on the properties of the fiber-matrix interface. For example, transverse cracking behavior and interlaminar shear strength of composites can be highly sensitive to the characteristics of the fiber-matrix interface. Despite its importance, experimental characterization of the mechanical behavior of the fibermatrix interface under normal loading conditions has been limited. This work reports on an experimental approach that uses in situ full-field digital image correlation (DIC) measurements to quantify the mechanical and failure behaviors at the fiber-matrix interface. Single fiber model composite samples are fabricated from a proprietary epoxy embedding a single glass rod. These samples are then tested under transverse tension. DIC is used to measure the deformation and strain fields in the glass rod, epoxy, and their interface vicinity. Initiation and propagation of the fiber-matrix debond are discussed. Full-field measurements are shown to facilitate the quantitative analysis of the traction-separation laws at the fiber-matrix interface subjected to transverse tension.

In situ characterization of the functional degradation of a [001¯] oriented Fe-Mn-Al-Ni single crystal under compression using acoustic emission measurements

2021 ◽  
pp. 117333
Author(s):  
Anja Weidner ◽  
Alexei Vinogradov ◽  
Malte Vollmer ◽  
Phillip Krooß ◽  
Mario J. Kriegel ◽  
...  
Keyword(s):  
Acoustic Emission ◽  
Single Crystal ◽  
In Situ Characterization

Synthesis and Characterization of Tetraphenylphosphonium Tetraazidoborate

2002 ◽  
Vol 57 (6) ◽  
pp. 621-624 ◽  
Author(s):  
Wolfgang Fraenk ◽  
Heinrich Nöth ◽  
Thomas M. Klapötke ◽  
Max Suter
Keyword(s):  
Single Crystal ◽  
Synthesis And Characterization ◽  
X Ray Diffraction ◽  
X Ray

AbstractTetraphenylphosphonium tetraazidoborate, [P(C6H5)4][B(N3)4], was obtained from B(N3)3 - in situ prepared from BH3 · O(C2H5)2 and HN3 - and [P(C6H5)4][N3]. Recrystallization from an acetonitrile / hexane mixture yielded colorless crystals in 60% yield. The molecular structurewas determined by single crystal X-ray diffraction and the [B(N3)4]- anionwas shown to possess S4 symmetry.

scholarly journals Applications with a brighter X-ray source and new detectors from Agilent

2014 ◽  
Vol 70 (a1) ◽  
pp. C1734-C1734
Author(s):  
Zoltan Gal ◽  
Tadeusz Skarzynski ◽  
Fraser White ◽  
Oliver Presly ◽  
Adrian Jones ◽  
...  
Keyword(s):  
Data Quality ◽  
Single Crystal ◽  
Measurement System ◽  
Single Crystal Diffraction ◽  
X Ray ◽  
Vacuum Technology ◽  
Intelligent Measurement ◽  
Wide Range

Agilent Technologies develop and supply X-ray systems for single-crystal diffraction research, including the SuperNova; a compact, highly reliable and very low maintenance instrument providing X-ray data of the highest quality; and the PX Scanner for testing and characterization of protein crystals in their original crystallization drops (in-situ). The SuperNova and PX Scanner are constantly improving, with recent enhancements including a new range of detectors using an Intelligent Measurement System. The Eos S2, Atlas S2 and Titan S2 detector range employs a smart sensitivity control of the electronic gain and is capable of instantaneously switching its binning modes thus providing unprecedented flexibility in tuning every exposure to provide the highest data quality for a wide range of experiments. We have also developed a completely new micro-focus X-ray source based on Gradient Vacuum technology, with novel filament and target designs. This novel source is an integral part of the new Agilent GV1000 X-ray diffractometer, which has been designed for applications that require even higher brightness of the X-ray beam.

Growth and Characterization of Single Crystal Epitaxial CoGa on MBE Grown III-V Semiconductors

1988 ◽  
Vol 144 ◽  
Author(s):  
K. C. Garrison ◽  
C. J. Palmstrøm ◽  
R. A. Bartynski
Keyword(s):  
Substrate Temperature ◽  
Single Crystal ◽  
Single Crystals ◽  
Structural Quality ◽  
High Quality ◽  
Auger Analysis ◽  
Post Deposition

ABSTRACTWe have demonstrated growth of high quality single crystal CoGa films on Ga1−xAlxAs. These films were fabricated in-situ by codeposition of Co and Ga on MBE grown Ga1−xAlxAs(100) surfaces. The elemental composition of the films was determined using Rutherford Backscattering (RBS) and in-situ Auger analysis. The structural quality of the films' surfaces was studied using RHEED (during deposition) and LEED (post deposition). RBS channeling was used to determine the bulk crystalline quality of these films.For ∼500 Å CoGa films grown at ∼450°C substrate temperature, channeling data showed good quality epitaxial single crystals [χmin ∼7%] with minimal dechanneling at the interface.

scholarly journals Study on the Creep Behavior of a Ni3Al-Based Single Crystal Alloy at 850°C/450 MPa

2020 ◽  
Vol 2020 ◽  
pp. 1-7
Author(s):  
Liwu Jiang ◽  
Yu Yang ◽  
Meiling Wu ◽  
Min Cai
Keyword(s):  
Fracture Surface ◽  
Single Crystal ◽  
Creep Behavior ◽  
Creep Deformation ◽  
Fracture Mechanism ◽  
Crystal Orientation ◽  
Fracture Morphology ◽  
Cutting Mechanism ◽  
Single Crystal Alloy ◽  
Fracture Morphologies

The creep behaviors of Ni3Al-based single crystal alloy IC6SX with [001] and [111] orientations under the condition of 850°C/450 MPa were investigated. The effect of crystal orientation on the creep lives, fracture morphology, fracture mechanism, and dislocation evolution of the alloys with different orientations was analyzed systematically. The results showed that the creep lives of the alloy were closely related to the crystal orientation under the condition of 850°C/450 MPa. The creep lives of the single crystal alloys with [001] and [111] orientations were 56.3 h and 126.9 h, respectively. Moreover, the fracture morphologies of the two alloys with [001] and [111] orientations were different. The results showed that some holes formed at the fracture surface of the alloy with [111] rather than [001] orientation. Furthermore, the surface near the fracture of the two alloys with [001] and [111] orientations was serrated. Therefore, the fracture mechanism of the single crystal alloys with [001] and [111] orientations was ductile fracture. In addition, a large number of dislocations cut into the γ ′ phase. Therefore, the cutting mechanism of dislocations in the alloys with [001] and [111] orientations was the creep deformation mechanism.

scholarly journals In situ, 3D characterization of the deformation mechanics of a superelastic NiTi shape memory alloy single crystal under multiscale constraint

2018 ◽  
Vol 144 ◽  
pp. 748-757 ◽  
Author(s):  
Harshad M. Paranjape ◽  
Partha P. Paul ◽  
Behnam Amin-Ahmadi ◽  
Hemant Sharma ◽  
Darren Dale ◽  
...  
Keyword(s):  
Shape Memory Alloy ◽  
Single Crystal ◽  
Shape Memory ◽  
Alloy Single Crystal ◽  
Niti Shape Memory Alloy ◽  
Deformation Mechanics
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