scholarly journals Suppression of the Growth of Intermetallic Compound Layers with the Addition of Graphene Nano-Sheets to an Epoxy Sn–Ag–Cu Solder on a Cu Substrate

Materials ◽  
2019 ◽  
Vol 12 (6) ◽  
pp. 936 ◽  
Author(s):  
Min-Soo Kang ◽  
Do-Seok Kim ◽  
Young-Eui Shin
Keyword(s):  
Intermetallic Compound ◽  
Isothermal Aging ◽  
Solder Joints ◽  
Solder Paste ◽  
Shear Tests ◽  
Sac305 Solder ◽  
Epoxy Solder ◽  
The Relationship ◽  
Bonding Characteristics ◽  
Preventive Effects

This study investigated the suppression of the growth of the intermetallic compound (IMC) layer that forms between epoxy solder joints and the substrate in electronic packaging by adding graphene nano-sheets (GNSs) to 96.5Sn–3.0Ag–0.5Cu (wt %, SAC305) solder whose bonding characteristics had been strengthened with a polymer. IMC growth was induced in isothermal aging tests at 150 °C, 125 °C and 85 °C for 504 h (21 days). Activation energies were calculated based on the IMC layer thickness, temperature, and time. The activation energy required for the formation of IMCs was 45.5 KJ/mol for the plain epoxy solder, 52.8 KJ/mol for the 0.01%-GNS solder, 62.5 KJ/mol for the 0.05%-GNS solder, and 68.7 KJ/mol for the 0.1%-GNS solder. Thus, the preventive effects were higher for increasing concentrations of GNS in the epoxy solder. In addition, shear tests were employed on the solder joints to analyze the relationship between the addition of GNSs and the bonding characteristics of the solder joints. It was found that the addition of GNSs to epoxy solder weakened the bonding characteristics of the solder, but not critically so because the shear force was higher than for normal solder (i.e., without the addition of epoxy). Thus, the addition of a small amount of GNSs to epoxy solder can suppress the formation of an IMC layer during isothermal aging without significantly weakening the bonding characteristics of the epoxy solder paste.

scholarly journals Dynamic Observation of Interfacial IMC Evolution and Fracture Mechanism of Sn2.5Ag0.7Cu0.1RE/Cu Lead-Free Solder Joints during Isothermal Aging

Materials ◽  
2020 ◽  
Vol 13 (4) ◽  
pp. 831 ◽  
Author(s):  
Di Zhao ◽  
Keke Zhang ◽  
Ning Ma ◽  
Shijie Li ◽  
Chenxiang Yin ◽  
...  
Keyword(s):  
Growth Rate ◽  
Fracture Mechanism ◽  
Isothermal Aging ◽  
Solder Joints ◽  
Diffusion Mechanism ◽  
Bulk Diffusion ◽  
Cu Substrate ◽  
Dynamic Observation ◽  
Free Solder ◽  
The Relationship

Dynamic observation of the microstructure evolution of Sn2.5Ag0.7Cu0.1RE/Cu solder joints and the relationship between the interfacial intermetallic compound (IMC) and the mechanical properties of the solder joints were investigated during isothermal aging. The results showed that the original single scallop-type Cu6Sn5 IMC gradually evolved into a planar double-layer IMC consisting of Cu6Sn5 and Cu3Sn IMCs with isothermal aging. In particular, the Cu3Sn IMC grew towards the Cu substrate and the solder seam sides; growth toward the Cu substrate side was dominant during the isothermal aging process. The growth of Cu3Sn IMC depended on the accumulated time at a certain temperature, where the growth rate of Cu3Sn was higher than that of Cu6Sn5. Additionally, the growth of the interfacial IMC was mainly controlled by bulk diffusion mechanism, where the activation energies of Cu6Sn5 and Cu3Sn were 74.7 and 86.6 kJ/mol, respectively. The growth rate of Cu3Sn was slightly faster than that of Cu6Sn5 during isothermal aging. With increasing isothermal aging time, the shear strength of the solder joints decreased and showed a linear relationship with the thickness of Cu3Sn. The fracture mechanism of the solder joints changed from ductile fracture to brittle fracture, and the fracture pathway transferred from the solder seam to the interfacial IMC layer.

Isothermal Aging Affect to the Growth of Sn-Cu-Ni-1 wt.% TiO2 Composite Solder Paste

2016 ◽  
Vol 700 ◽  
pp. 123-131 ◽  
Author(s):  
Rita Mohd Said ◽  
Mohd Arif Anuar Mohd Salleh ◽  
Mohd Nazree Derman ◽  
Mohd Izrul Izwan Ramli ◽  
Norhayanti Mohd Nasir ◽  
...  
Keyword(s):  
Intermetallic Compound ◽  
Solder Joint ◽  
Aging Time ◽  
Isothermal Aging ◽  
Composite Solder ◽  
Solder Paste ◽  
Cu Substrate ◽  
Interfacial Imcs ◽  
Planar Shape ◽  
Interfacial Intermetallic Compound

This work investigated the effects of 1.0 wt. % TiO2 particles addition into Sn-Cu-Ni solder paste to the growth of the interfacial intermetallic compound (IMC) on Cu substrate after isothermal aging. Sn-Cu-Ni solder paste with TiO2 particles were mechanically mixed to fabricate the composite solder paste. The composite solder paste then reflowed in the reflow oven to form solder joint. The reflowed samples were then isothermally aged 75, 125 and 150 ° C for 24 and 240 h. It was found that the morphology of IMCs changed from scallop-shape to a more uniform planar shape in both Sn-Cu-Ni/Cu joints and Sn-Cu-Ni-TiO2 /Cu joint. Cu6Sn5 and Cu3Sn IMC were identified and grew after prolong aging time and temperature. The IMCs thickness and scallop diameter of composite solder paste were reduced and the growth of IMCs thickness after isothermal aging become slower as compared to unreinforced Sn-Cu-Ni solder paste. It is suggested that TiO2 particles have influenced the evolution and retarded the growth of interfacial IMCs.

Effect of Isothermal Aging on Microstructure and Creep Properties of SAC305 Solder: A Micromechanics Approach

2013 ◽  
Author(s):  
Preeti Chauhan ◽  
Subhasis Mukherjee ◽  
Michael Osterman ◽  
Abhijit Dasgupta ◽  
Michael Pecht
Keyword(s):  
Isothermal Aging ◽  
Solder Joints ◽  
Volume Fraction ◽  
Coarse Grained ◽  
Creep Model ◽  
Secondary Creep ◽  
Dispersion Strengthening ◽  
Sac305 Solder ◽  
Particle Spacing ◽  
Cu6sn5 Imcs

SnAgCu (SAC) solders undergo continuous micro structural coarsening during both storage and service. In this study, we use cross-sectioning and image processing techniques to periodically quantify the effect of isothermal aging quantitatively on phase coarsening and evolution, in SAC305 (Sn3.0Ag0.5Cu) solder. SAC305 alloy is aged for (24–1000) hours at 100°C (∼ 0.7–0.8Tmelt). The characteristic parameters monitored during isothermal aging include size, volume fraction, and inter-particle spacing of both nanoscale Ag3Sn intermetallic compounds (IMCs) and micronscale Cu6Sn5 IMCs, as well as the volume fraction of pure tin dendrites in SAC305 solder. Effects of above microstructural evolution on secondary creep constitutive response of SAC305 interconnects were modeled using a mechanistic multiscale creep model. The mechanistic phenomena modeled include: (1) dispersion strengthening by coarsened nanoscale Ag3Sn IMCs and reinforcement strengthening by micronscale Cu6Sn5 IMCs, respectively; and (2) load sharing between pure Sn dendrites and the surrounding eutectic Sn-Ag phase. The coarse-grained polycrystalline Sn micro structure in SAC305 solder was not captured in the above model because isothermal aging did not appear to cause any significant change in the initial grain morphology of SAC305 solder joints. The above model is shown to predict the drop in creep resistance due to the influence of isothermal aging on SAC305 solder joints.

Grain Morphology of Intermetallic Compounds at Solder Joints

2002 ◽  
Vol 17 (3) ◽  
pp. 597-599 ◽  
Author(s):  
Won Kyoung Choi ◽  
Se-Young Jang ◽  
Jong Hoon Kim ◽  
Kyung-Wook Paik ◽  
Hyuck Mo Lee
Keyword(s):  
Intermetallic Compound ◽  
Intermetallic Compounds ◽  
Rough Surface ◽  
Solder Joints ◽  
Grain Morphology ◽  
Solid Metal ◽  
Metal Substrates ◽  
Cu Substrates ◽  
The Relationship

The grain morphology of the intermetallic compound (IMC) that forms at the interface between liquid solders and solid-metal substrates was observed at solder joints. Cu6Sn5 grains on Cu substrates were rough or rounded, and Ni3Sn4 grains on Ni substrates were faceted. Through the energy-based calculations, the relationship between the IMC grain morphology and Jackson's parameter α was explained. The Jackson's parameter of the IMC grain with a rough surface is smaller than 2 while it is larger than 2 for faceted grains.

Reliability of PCB Solder Joints Assembled with SACm™ Solder Paste

2014 ◽  
Vol 2014 (1) ◽  
pp. 000367-000373 ◽  
Author(s):  
Arnab Dasgupta ◽  
Fengying Zhou ◽  
Christine LaBarbera ◽  
Weiping Liu ◽  
Paul Bachorik ◽  
...  
Keyword(s):  
Solder Joint ◽  
Thermal Aging ◽  
Test Performance ◽  
Solder Joints ◽  
Ductile Failure ◽  
Drop Test ◽  
Bulk Property ◽  
Solder Paste ◽  
Fatigue Reliability ◽  
Sac305 Solder

The solder alloy SACm™0510 has been reported to be a superior alloy when used as BGA balls, exhibiting not only an outstanding drop test performance when compared to SAC105, but also as having high thermal fatigue reliability when compared to high Ag SAC solders. In this study, SACm0510 solder was evaluated as a solder paste. The voiding behavior of SGA solder joints was comparable for SACm0510, SAC105, and SC305. When evaluating SGA assemblies on a customized drop test, SACm0510 outperformed SAC105 considerably, which in turn was much better than SAC305. The drop test performance was found to improve upon thermal aging at 150°C, and the difference between the alloys reduced significantly. This was explained by the speculated grain coarsening which resulted in a softened solder joint, and consequently, a shift of fracture mode from brittle failure toward ductile failure. This model was supported by the observation of the fractured surface moving away from the interface upon thermal aging. The improvement in drop test performance upon thermal aging can be further explained by the large solder joint size of the SGA employed in this study, where the bulk property of solder weighed more than a small solder joint. When the assembled chip resistors were evaluated with a −55°C/+125°C TCT test, no failure was observed after 369 cycles for all three alloys. SAC305 appeared to be the best in maintaining the integrity of the interfacial IMC layer. SACm0510 showed a few crack lines, but less than that of SAC105. SACm0510 solder paste was found to be very compatible with BGAs with SAC305 solder joints, and no abnormal microstructure was observed after thermal aging at 150°C for 1000 hours.

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