scholarly journals Integer Codes Correcting Asymmetric Errors in Nand Flash Memory

Mathematics ◽  
2021 ◽  
Vol 9 (11) ◽  
pp. 1269
Author(s):  
Hristo Kostadinov ◽  
Nikolai Manev

Memory devices based on floating-gate transistor have recently become dominant technology for non-volatile storage devices like USB flash drives, memory cards, solid-state disks, etc. In contrast to many communication channels, the errors observed in flash memory device use are not random but of special, mainly asymmetric, type. Integer codes which have proved their efficiency in many cases with asymmetric errors can be applied successfully to flash memory devices, too. This paper presents a new construction and integer codes over a ring of integers modulo A=2n+1 capable of correcting single errors of type (1,2),(±1,±2), or (1,2,3) that are typical for flash memory devices. The construction is based on the use of cyclotomic cosets of 2 modulo A. The parity-check matrices of the codes are listed for n≤10.


Author(s):  
Raja Subramani ◽  
Haritima Swapnil ◽  
Niharika Thakur ◽  
Bharath Radhakrishnan ◽  
Krishnamurthy Puttaiah


2011 ◽  
Vol 50 (10) ◽  
pp. 100204 ◽  
Author(s):  
Myounggon Kang ◽  
Wookghee Hahn ◽  
Il Han Park ◽  
Youngsun Song ◽  
Hocheol Lee ◽  
...  


2018 ◽  
Vol 1 (1) ◽  
pp. 60-67 ◽  
Author(s):  
Jae Woong Yoon ◽  
Seong-Min Ma ◽  
Gun Pyo Kim ◽  
Yoonshik Kang ◽  
Joonseong Hahn ◽  
...  


Author(s):  
Chan-Ching Lin ◽  
Kuei-Shu Chang-Liao ◽  
Tzung-Bin Huang ◽  
Hann-Ping Hwang


MRS Advances ◽  
2016 ◽  
Vol 1 (5) ◽  
pp. 339-348 ◽  
Author(s):  
Noh Yeal Kwak ◽  
Chul Young Ham ◽  
Min Sung Ko ◽  
Sung Chul Shin ◽  
Seung Jin Yeom ◽  
...  

ABSTRACTFeasibility of multiwavelength Raman spectroscopy was studied as a potential in-line monitoring technique for grain size distribution in channel poly-Si used in three dimensional stacked NAND (3D NAND) Flash memory devices. Various channel poly-Si materials in 3D-NAND Flash memory devices, converted from chemical vapor deposition (CVD) grown a-Si, were characterized using non-contact, multiwavelength Raman spectroscopy and high resolution cross-sectional transmission electron microscopy (HRXTEM). The Raman characterization results were compared with HRXTEM images. The correlation between the grain size distribution characterized by multiwavelength Raman spectroscopy and “on current” (ION) of 3D NAND Flash memory devices was investigated. Good correlation between these techniques was seen. Multiwavelength Raman spectroscopy is very promising as a non-destructive in-line monitoring technique for grain size distribution in channel poly-Si used in 3D NAND Flash memory devices.



2020 ◽  
Vol 69 (4) ◽  
pp. 475-488
Author(s):  
Qiao Li ◽  
Liang Shi ◽  
Yufei Cui ◽  
Chun Jason Xue


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