Solution-Based Deposition of Transparent Eu-Doped Titanium Oxide Thin Films for Potential Security Labeling and UV Screening

Transparent titanium oxide thin films attract enormous attention from the scientific community because of their prominent properties, such as low-cost, chemical stability, and optical transparency in the visible region. In this study, we developed an easy and scalable solution-based process for the deposition of transparent TiOx thin films on glass substrates. We showed that the proposed method is also suitable for the fabrication of metal-doped TiOx thin films. As proof-of-the-concept, europium Eu(III) ions were introduced into TiOx film. A photoluminescence (PL) study revealed that Eu-doped TiOx thin films showed strong red luminescence associated with 5D0→7Fj relaxation transitions in Eu (III). We found that prepared TiOx thin films significantly reduce the transmittance of destructive UV radiation; a feature that can be useful for the protection of photovoltaic devices. In addition, transparent and luminescent TiOx thin films can be utilized for potential security labeling.

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One-Step Electrochemical Deposition of Cu-In-Ga Mixed Oxide Thin Films for Low-Cost CIGS Solar Cells

ECS Meeting Abstracts ◽

10.1149/ma2012-02/47/3355 ◽

2012 ◽

Keyword(s):

Thin Films ◽

Solar Cells ◽

Electrochemical Deposition ◽

Mixed Oxide ◽

Low Cost ◽

Oxide Thin Films ◽

One Step ◽

Cigs Solar Cells

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Synthesis, Crystallography, Microstructure, Crystal Defects, Optical and Optoelectronic Properties of ZnO:CeO2 Mixed Oxide Thin Films

Photonics ◽

10.3390/photonics7040112 ◽

2020 ◽

Vol 7 (4) ◽

pp. 112

Author(s):

Qais M. Al-Bataineh ◽

Mahmoud Telfah ◽

Ahmad A. Ahmad ◽

Ahmad M. Alsaad ◽

Issam A. Qattan ◽

...

Keyword(s):

Thin Film ◽

Thin Films ◽

Refractive Index ◽

Mixed Oxide ◽

Visible Region ◽

Functional Materials ◽

Crystal Defects ◽

Optoelectronic Properties ◽

Oxide Thin Films ◽

Pure Ceo2

We report the synthesis and characterization of pure ZnO, pure CeO2, and ZnO:CeO2 mixed oxide thin films dip-coated on glass substrates using a sol-gel technique. The structural properties of as-prepared thin film are investigated using the XRD technique. In particular, pure ZnO thin film is found to exhibit a hexagonal structure, while pure CeO2 thin film is found to exhibit a fluorite cubic structure. The diffraction patterns also show the formation of mixed oxide materials containing well-dispersed phases of semi-crystalline nature from both constituent oxides. Furthermore, optical properties of thin films are investigated by performing UV–Vis spectrophotometer measurements. In the visible region, transmittance of all investigated thin films attains values as high as 85%. Moreover, refractive index of pure ZnO film was found to exhibit values ranging between 1.57 and 1.85 while for CeO2 thin film, it exhibits values ranging between 1.73 and 2.25 as the wavelength of incident light decreases from 700 nm to 400 nm. Remarkably, refractive index of ZnO:CeO2 mixed oxide-thin films are tuned by controlling the concentration of CeO2 properly. Mixed oxide-thin films of controllable refractive indices constitute an important class of smart functional materials. We have also investigated the optoelectronic and dispersion properties of ZnO:CeO2 mixed oxide-thin films by employing well-established classical models. The melodramatic boost of optical and optoelectronic properties of ZnO:CeO2 mixed oxide thin films establish a strong ground to modify these properties in a skillful manner enabling their use as key potential candidates for the fabrication of scaled optoelectronic devices and thin film transistors.

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Heat sensitive property of sputtered titanium oxide thin films for uncooled IR detector application

Journal of Materials Science Materials in Electronics ◽

10.1007/s10854-011-0570-z ◽

2011 ◽

Vol 23 (6) ◽

pp. 1188-1192 ◽

Cited By ~ 3

Author(s):

Yongfeng Ju ◽

Zhiming Wu ◽

Shibin Li ◽

Lin Li ◽

Yadong Jiang

Keyword(s):

Thin Films ◽

Titanium Oxide ◽

Oxide Thin Films ◽

Ir Detector ◽

Sensitive Property

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Coupled effects of deposition and annealing temperatures on optical, electrical and mechanical properties of titanium oxide thin films

Vacuum ◽

10.1016/j.vacuum.2015.07.005 ◽

2015 ◽

Vol 120 ◽

pp. 155-161 ◽

Cited By ~ 9

Author(s):

Mark J. Miller ◽

Junlan Wang

Keyword(s):

Thin Films ◽

Mechanical Properties ◽

Titanium Oxide ◽

Oxide Thin Films ◽

Annealing Temperatures

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Thermal conversion of CBD grown ZnS thin films to ZnO

Zeitschrift für Naturforschung A ◽

10.1515/zna-2020-0137 ◽

2020 ◽

Vol 0 (0) ◽

Author(s):

Kooliyankal Naseema ◽

Kaniyamkandy Ribin ◽

Nidiyanga Navya ◽

Prasoon Prasannan

Keyword(s):

Thin Films ◽

Low Cost ◽

Thermal Conversion ◽

X Ray Diffraction ◽

Xrd Pattern ◽

Glass Substrates ◽

Anion Substitution ◽

Nano Crystalline ◽

Before And After ◽

Uv Visible

AbstractNano crystalline zinc sulfide thin films were deposited onto glass substrates by chemical bath deposition method. One of the samples was annealed at 300 °C for 2 h in air using a muffle furnace. The prepared thin films were investigated by X-ray diffraction (XRD), UV–visible spectroscopy (UV–vis), photoluminescence spectroscopy (PL), scanning electron microscopy (SEM) and Raman spectroscopy (FT-R) studies before and after annealing. The analysis confirmed the thermal-induced anion substitution and conversion of ZnS crystal to ZnO wurtzite crystal. XRD pattern showed that these films were phase pure and polycrystalline in nature. Optical band gap was found to be 3.86 eV for ZnS and 3.21 eV for ZnO. The films prepared by this simple, low-cost technique are suitable for photovoltaic and optoelectronic applications.

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