scholarly journals Dynamic Biasing for Improved On-Orbit Total-Dose Lifetimes of Commercial Electronic Devices

2021 ◽  
Author(s):  
Maximillian Holliday ◽  
Thomas Heuser ◽  
Zachary Manchester ◽  
Debbie Senesky
Keyword(s):  
Total Dose ◽  
Integrated Circuit ◽  
Circuit Complexity ◽  
Low Earth Orbit ◽  
Radiation Environment ◽  
Space Applications ◽  
Spacecraft Design ◽  
Dose Accumulation ◽  
Processor Performance ◽  
Dynamic Biasing

The survivability of microelectronic devices in ionizing radiation environments drives spacecraft design, capability, mission scope, and cost. This work exploits the periodic nature of many space radiation environments to extend device lifetimes without additional shielding or modifications to the semiconductor architecture. We propose a technique for improving component lifetimes through reduced total-dose accumulation by modulating device bias during periods of intense irradiation. Simulation of this ``dynamic biasing" technique applied to single-transistor devices in a typical low-Earth orbit results in an increase of component life from 114 days to 477 days (318% improvement) at the expense of 5% down time (95% duty cycle). The biasing technique is also experimentally demonstrated using gamma radiation to study three commercial devices spanning a range of integrated circuit complexity in 109 rad/min and 256 rad/min dose rate conditions. The demonstrated improvements in device lifetimes using the proposed dynamic biasing technique lays a foundation for more effective use of modern microelectronics for space applications. Analogous to the role real-time temperature monitoring plays in maximizing modern processor performance, the proposed dynamic biasing technique is a means of intelligently responding to the radiation environment and capable of becoming an integral tool in optimizing component lifetimes in space.

scholarly journals Dynamic Biasing for Improved On-Orbit Total-Dose Lifetimes of Commercial Semiconductor Devices

2021 ◽  
Author(s):  
Maximillian Holliday ◽  
Thomas Heuser ◽  
Zachary Manchester ◽  
Debbie Senesky
Keyword(s):  
Total Dose ◽  
Real Time ◽  
Experimental Testing ◽  
Semiconductor Devices ◽  
Radiation Environment ◽  
Electronic Systems ◽  
Dynamic Biasing

This work proposes a "dynamic biasing" technique and uses on-orbit simulations with experimental testing to demonstrate up to a 16x improvement in total-dose lifetimes for COTS devices without additional shielding or modifications to the chip. Building upon this foundation, the dynamic biasing technique offers a unique opportunity for microelectronic systems to begin intelligently responding in real-time to their radiation environment. We believe this fundamental technique can become an integral tool to countless future electronic systems in space.<br>

scholarly journals Dynamic Biasing for Improved On-Orbit Total-Dose Lifetimes of Commercial Semiconductor Devices

2021 ◽  
Author(s):  
Maximillian Holliday ◽  
Thomas Heuser ◽  
Zachary Manchester ◽  
Debbie Senesky
Keyword(s):  
Total Dose ◽  
Real Time ◽  
Experimental Testing ◽  
Semiconductor Devices ◽  
Radiation Environment ◽  
Electronic Systems ◽  
Dynamic Biasing

This work proposes a "dynamic biasing" technique and uses on-orbit simulations with experimental testing to demonstrate up to a 16x improvement in total-dose lifetimes for COTS devices without additional shielding or modifications to the chip. Building upon this foundation, the dynamic biasing technique offers a unique opportunity for microelectronic systems to begin intelligently responding in real-time to their radiation environment. We believe this fundamental technique can become an integral tool to countless future electronic systems in space.<br>

scholarly journals Total Ionizing Dose Effects on a Delay-Based Physical Unclonable Function Implemented in FPGAs

Electronics ◽  
2018 ◽  
Vol 7 (9) ◽  
pp. 163 ◽  
Author(s):  
Honorio Martin ◽  
Pedro Martin-Holgado ◽  
Yolanda Morilla ◽  
Luis Entrena ◽  
Enrique San-Millan
Keyword(s):  
Low Cost ◽  
Ring Oscillator ◽  
Radiation Environment ◽  
Key Generation ◽  
Total Ionizing Dose ◽  
Space Applications ◽  
Physical Unclonable Functions ◽  
Dose Effects ◽  
Total Ionizing Dose Effects

Physical Unclonable Functions (PUFs) are hardware security primitives that are increasingly being used for authentication and key generation in ICs and FPGAs. For space systems, they are a promising approach to meet the needs for secure communications at low cost. To this purpose, it is essential to determine if they are reliable in the space radiation environment. In this work we evaluate the Total Ionizing Dose effects on a delay-based PUF implemented in SRAM-FPGA, namely a Ring Oscillator PUF. Several major quality metrics have been used to analyze the evolution of the PUF response with the total ionizing dose. Experimental results demonstrate that total ionizing dose has a perceptible effect on the quality of the PUF response, but it could still be used for space applications by making some appropriate corrections.

scholarly journals Proton Induced Single Event Effect Characterization on a Highly Integrated RF-Transceiver

Electronics ◽  
2019 ◽  
Vol 8 (5) ◽  
pp. 519 ◽  
Author(s):  
Jan Budroweit ◽  
Mattis Paul Jaksch ◽  
Maciej Sznajder
Keyword(s):  
Radio Frequency ◽  
Integrated Circuit ◽  
Digital Signal ◽  
Single Event ◽  
Rf Transceiver ◽  
Space Applications ◽  
Radio System ◽  
Filter Bandwidth ◽  
Single Event Effect ◽  
High Level

Radio frequency (RF) systems in space applications are usually designed for a single task and its requirements. Flexibility is mostly limited to software-defined adaption of the signal processing in digital signal processors (DSP) or field-programmable gate arrays (FPGA). RF specifications, such as frequency band selection or RF filter bandwidth are thereby restricted to the specific application requirements. New radio frequency integrated circuit (RFIC) devices also allow the software-based reconfiguration of various RF specifications. A transfer of this RFIC technology to space systems would have a massive impact to future radio systems for space applications. The benefit of this RFIC technology allows a selection of different RF radio applications, independent of their RF parameters, to be executed on a single unit and, thus, reduces the size and weight of the whole system. Since most RF application sin space system require a high level of reliability and the RFIC is not designed for the harsh environment in space, a characterization under these special environmental conditions is mandatory. In this paper, we present the single event effect (SEE) characterization of a selected RFIC device under proton irradiation. The RFIC being tested is immune to proton induced single event latch-up and other destructive events and shows a very low response to single failure interrupts. Thus, the device is defined as a good candidate for future, highly integrated radio system in space applications.

scholarly journals Vectorized magnetometer for space applications using electrical readout of atomic scale defects in silicon carbide

2016 ◽  
Vol 6 (1) ◽  
Author(s):  
Corey J. Cochrane ◽  
Jordana Blacksberg ◽  
Mark A. Anders ◽  
Patrick M. Lenahan
Keyword(s):  
Solid State ◽  
Large Scale ◽  
Atomic Scale ◽  
Radiation Environment ◽  
Optically Pumped ◽  
Space Applications ◽  
Viable Solution ◽  
Jovian System ◽  
Induced Changes ◽  
Venusian Surface

Abstract Magnetometers are essential for scientific investigation of planetary bodies and are therefore ubiquitous on missions in space. Fluxgate and optically pumped atomic gas based magnetometers are typically flown because of their proven performance, reliability, and ability to adhere to the strict requirements associated with space missions. However, their complexity, size, and cost prevent their applicability in smaller missions involving cubesats. Conventional solid-state based magnetometers pose a viable solution, though many are prone to radiation damage and plagued with temperature instabilities. In this work, we report on the development of a new self-calibrating, solid-state based magnetometer which measures magnetic field induced changes in current within a SiC pn junction caused by the interaction of external magnetic fields with the atomic scale defects intrinsic to the semiconductor. Unlike heritage designs, the magnetometer does not require inductive sensing elements, high frequency radio, and/or optical circuitry and can be made significantly more compact and lightweight, thus enabling missions leveraging swarms of cubesats capable of science returns not possible with a single large-scale satellite. Additionally, the robustness of the SiC semiconductor allows for operation in extreme conditions such as the hot Venusian surface and the high radiation environment of the Jovian system.

Total-Dose Hardness Assurance for Low Earth Orbit

1987 ◽  
Vol 34 (6) ◽  
pp. 1757-1762 ◽  
Author(s):  
R. H. Maurer ◽  
J. J. Suter
Keyword(s):  
Total Dose ◽  
Low Earth Orbit ◽  
Earth Orbit

Space Environment Effect on Fluorinated Polymers

2003 ◽  
Vol 792 ◽  
Author(s):  
M. Chipara ◽  
D. L. Edwards ◽  
J. Zaleski ◽  
B. Hoang ◽  
B. Przewoski ◽  
...  
Keyword(s):  
Atomic Oxygen ◽  
Low Earth Orbit ◽  
Space Environment ◽  
Fluorinated Polymers ◽  
Space Applications ◽  
Environment Effect ◽  
Low Altitude ◽  
Low Earth Orbits ◽  
Degradation Of Materials ◽  
Earth Orbits

ABSTRACTThe effects of the space environment on polytetrafluorethylene and some fluorinated polymers, copolymers, and blends are critically reviewed. It is shown that in low altitude orbits such as Low Earth Orbit and Geostationary Orbit the presence of both ionizing radiation and atomic oxygen triggers a synergetic degradation of materials based on fluorinated polymers. The behavior is due to the lability of the in-chain alkyl radical to oxygen attack. It is concluded that fluorinated polymers should not be used as materials for space applications, as long as the mission implies low Earth orbits.

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