scholarly journals THE CURRENT STATE OF ARCHAEOBOTANICAL STUDY IN UKRAINE

2020 ◽  
Vol 37 (4) ◽  
pp. 292-298
Author(s):  
G. O. Pashkevych
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Bronze Age ◽  
East European Plain ◽  
Cultivated Plants ◽  
Radiocarbon Dates ◽  
Hulled Wheat ◽  
Mountainous Regions ◽  
Broomcorn Millet ◽  
Scanning Electron

The territory of Ukraine was the first on the path of the Neolithic tribes to the territory of the East European Plain. These tribes brought here cultivated plants with the skills of their cultivation (hulled wheat, barley, legumes) from the center of origin, from Asia Minor through the Balkan Peninsula. N. I. Vavilov considered that the territory of Ukraine together with Moldova was one of the ancient places of farmers culture. He received confirmation of his assumption about the existence of crops of ancient hulled wheat in the closed mountainous regions of the Carpathians. In 1940 he found a hulled wheat Triticum dicoccum in the vicinity of the village of Putila near Chernivtsi. Recently thanks to modern research and radiocarbon dates on charred broomcorn millet grains Ukraine has a gateway through which millet from China, the birthplace of its origin, has spread to Europe. The earliest radiocarbon date (1631—1455 cal BC) in Europe is coming from the site Vinogradnyi Sad of Sabatynivka culture, Bronze Age. This date was received thanks to the European program «When and Where broomcorn millet arrived in Europe». Reports of much earlier occurrences of millet in Neolithic — Early Bronze Age (6th — early 3rd millennium BC) were almost entirely based on millet-looking impressions in pottery, daub and figurines. A recent re-examination of these impressions on figurines from the Usatovo culture with using a scanning electron microscope excluded millet grains as a source for some of the imprints. European researchers show great interest in archaeobotanical records of the crop from archaeological excavations of the territory of Ukraine. The use of modern research methods such as a scanning electron microscope, stable isotope evidence, modernized radiocarbon dating, chemical analysis of microparticles using a mass spectrometer, and analysis of DNA will allow a new look at the earliest obtained results.

Scanning Electron Microscope Aided Wood Identification of a Bronze Age Wooden Diptych

IAWA Journal ◽  
1990 ◽  
Vol 11 (3) ◽  
pp. 255-260 ◽  
Author(s):  
Michael Pendleton ◽  
Peter Warnock
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Bronze Age ◽  
Anatomical Study ◽  
Wood Identification ◽  
Buxus Sempervirens ◽  
Historical References ◽  
Scanning Electron

A broken wooden diptych was found in 1986 on the 14th century B.C. Ulu Burun, Turkey, shipwreck, with only minute fragments available for anatomical study using scanning electron microscopy. Previously, the earliest known diptychs, considered the oldest books in existence, had been found at Assyrian Nimrud and were constructed of walnut. Using observed features from the wood fragments a computerised wood identification program generated Buxus as a probable candidate. Boxwood (Buxus) is frequently mentioned in historical references, including Assyrian texts, as a wood used for small, durable objects. Comparison of the diptych wood features with those of Buxus sempervirens convinces us that the diptych was constructed from boxwood (Buxus sp.).

scholarly journals Fruit micromorphology of Siberian Apiaceae and its value for taxonomy of the family

Turczaninowia ◽  
2021 ◽  
Vol 24 (2) ◽  
pp. 120-143
Author(s):  
Tatyana A. Ostroumova
Keyword(s):  
Cell Wall ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Cell Surface ◽  
Species Identification ◽  
Relative Position ◽  
Wide Distribution ◽  
Cultivated Plants ◽  
The Family ◽  
Scanning Electron

Using a scanning electron microscope, the fruit micromorphology of the family Apiaceae of Siberia was studied. In total, the study covered 97 species of wild, adventive, and the most important cultivated plants. Within one fruit, micromorphology is heterogeneous; the most informative is the surface of the grooves and the rib bases. Exocarp cells are described (relative position, shape, size, nature of the boundaries between cells, outer walls, and fine relief of the cell wall). Characters most consistent within the species, for example, outgrowths on cell surface and a thin relief of cell wall, are noted. The characteristics of the ridges of the ribs, stomata (their presence, position on the surface of the fruit, and cuticle on the cells adjacent to the stomata), and epicuticular wax are also given. 25 species have hairs, scales, spines or warts on the surface; the shape of these structures and their fine relief are described. The importance of micromorphology for species identification and taxonomy is shown. The wide distribution of parallel variability in the family is noted.

The Alteration of the Pore Spaces in Sandstones

1973 ◽  
Vol 31 ◽  
pp. 210-211
Author(s):  
R. E. Ferrell ◽  
G. G. Paulson
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
The Other ◽  
Coarse Grained ◽  
Depositional Fabric ◽  
Soluble Components ◽  
Scanning Electron ◽  
Shape And Size

The pore spaces in sandstones are the result of the original depositional fabric and the degree of post-depositional alteration that the rock has experienced. The largest pore volumes are present in coarse-grained, well-sorted materials with high sphericity. The chief mechanisms which alter the shape and size of the pores are precipitation of cementing agents and the dissolution of soluble components. Each process may operate alone or in combination with the other, or there may be several generations of cementation and solution.The scanning electron microscope has ‘been used in this study to reveal the morphology of the pore spaces in a variety of moderate porosity, orthoquartzites.

The Broad Applications of the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 20-21
Author(s):  
C. T. Nightingale ◽  
S. E. Summers ◽  
T. P. Turnbull
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Surface Topography ◽  
Great Depth ◽  
Resolving Power ◽  
Depth Of Field ◽  
Pictorial Representations ◽  
Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

Observability of Very Thick Specimen by Using Transmission Scanning Electron Microscope

1971 ◽  
Vol 29 ◽  
pp. 26-27
Author(s):  
K. Shibatomi ◽  
T. Yamanoto ◽  
H. Koike
Keyword(s):  
Electron Microscope ◽  
Image Quality ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Image Contrast ◽  
Objective Lens ◽  
Thick Specimen ◽  
Transmission Electron ◽  
Scanning Electron

In the observation of a thick specimen by means of a transmission electron microscope, the intensity of electrons passing through the objective lens aperture is greatly reduced. So that the image is almost invisible. In addition to this fact, it have been reported that a chromatic aberration causes the deterioration of the image contrast rather than that of the resolution. The scanning electron microscope is, however, capable of electrically amplifying the signal of the decreasing intensity, and also free from a chromatic aberration so that the deterioration of the image contrast due to the aberration can be prevented. The electrical improvement of the image quality can be carried out by using the fascionating features of the SEM, that is, the amplification of a weak in-put signal forming the image and the descriminating action of the heigh level signal of the background. This paper reports some of the experimental results about the thickness dependence of the observability and quality of the image in the case of the transmission SEM.

Resolution of a Transmitted Electron Image Formed by A Scanning Electron Microscope

1970 ◽  
Vol 28 ◽  
pp. 386-387
Author(s):  
S. Takashima ◽  
H. Hashimoto ◽  
S. Kimoto
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Objective Lens ◽  
Specimen Thickness ◽  
Probe Diameter ◽  
Transmission Electron ◽  
Electron Image ◽  
Conventional Transmission Electron Microscope ◽  
Scanning Electron

The resolution of a conventional transmission electron microscope (TEM) deteriorates as the specimen thickness increases, because chromatic aberration of the objective lens is caused by the energy loss of electrons). In the case of a scanning electron microscope (SEM), chromatic aberration does not exist as the restrictive factor for the resolution of the transmitted electron image, for the SEM has no imageforming lens. It is not sure, however, that the equal resolution to the probe diameter can be obtained in the case of a thick specimen. To study the relation between the specimen thickness and the resolution of the trans-mitted electron image obtained by the SEM, the following experiment was carried out.

Characterization of Sputtered Films using the Scanning Electron Microscope

1973 ◽  
Vol 31 ◽  
pp. 44-45
Author(s):  
R. F. Schneidmiller ◽  
W. F. Thrower ◽  
C. Ang
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
Sputtered Films ◽  
Plasma Sputtering ◽  
Microelectronic Devices ◽  
Control Film ◽  
Scanning Electron

Solid state materials in the form of thin films have found increasing structural and electronic applications. Among the multitude of thin film deposition techniques, the radio frequency induced plasma sputtering has gained considerable utilization in recent years through advances in equipment design and process improvement, as well as the discovery of the versatility of the process to control film properties. In our laboratory we have used the scanning electron microscope extensively in the direct and indirect characterization of sputtered films for correlation with their physical and electrical properties.Scanning electron microscopy is a powerful tool for the examination of surfaces of solids and for the failure analysis of structural components and microelectronic devices.

Field Emission SEM Equipped With Noise Compensator

1973 ◽  
Vol 31 ◽  
pp. 302-303
Author(s):  
S. Saito ◽  
H. Todokoro ◽  
S. Nomura ◽  
T. Komoda
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Low Contrast ◽  
Probe Current ◽  
High Resolution Images ◽  
Scanning Electron

Field emission scanning electron microscope (FESEM) features extremely high resolution images, and offers many valuable information. But, for a specimen which gives low contrast images, lateral stripes appear in images. These stripes are resulted from signal fluctuations caused by probe current noises. In order to obtain good images without stripes, the fluctuations should be less than 1%, especially for low contrast images. For this purpose, the authors realized a noise compensator, and applied this to the FESEM.Fig. 1 shows an outline of FESEM equipped with a noise compensator. Two apertures are provided gust under the field emission gun.

Visualization of Internal Skin Structures with the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 46-47
Author(s):  
Emil Bernstein
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Great Depth ◽  
Hair Follicles ◽  
Depth Of Field ◽  
Pig Skin ◽  
Realistic Picture ◽  
Main Components ◽  
Scanning Electron

An interesting method for examining structures in g. pig skin has been developed. By modifying an existing technique for splitting skin into its two main components—epidermis and dermis—we can in effect create new surfaces which can be examined with the scanning electron microscope (SEM). Although this method is not offered as a complete substitute for sectioning, it provides the investigator with a means for examining certain structures such as hair follicles and glands intact. The great depth of field of the SEM complements the technique so that a very “realistic” picture of the organ is obtained.

Fine structure of the retina of the giant scallop, Placopecten magellanicus

1984 ◽  
Vol 42 ◽  
pp. 312-313
Author(s):  
C.V.L. Powell
Keyword(s):  
Fine Structure ◽  
Electron Microscope ◽  
Light Intensity ◽  
Scanning Electron Microscope ◽  
Eye Development ◽  
Preliminary Observation ◽  
Columnar Epithelium ◽  
Placopecten Magellanicus ◽  
Environmental Light ◽  
Scanning Electron

The overall fine structure of the eye in Placopecten is similar to that of other scallops. The optic tentacle consists of an outer columnar epithelium which is modified into a pigmented iris and a cornea (Fig. 1). This capsule encloses the cellular lens, retina, reflecting argentea and the pigmented tapetum. The retina is divided into two parts (Fig. 2). The distal retina functions in the detection of movement and the proximal retina monitors environmental light intensity. The purpose of the present study is to describe the ultrastructure of the retina as a preliminary observation on eye development. This is also the first known presentation of scanning electron microscope studies of the eye of the scallop.

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