Research on Hartmann principle based on sub-aperture slope scanning detection and error

2019 ◽  
Vol 48 (8) ◽  
pp. 813003
Author(s):  
赵宪宇 Zhao Xianyu ◽  
薛栋林 Xue Donglin ◽  
程 强 Cheng Qiang
Keyword(s):  
1995 ◽  
Vol 61 (11) ◽  
pp. 1599-1603
Author(s):  
Takaharu YOSHIMURA ◽  
Nobuyuki AKIYAMA ◽  
Masahiro YOSHIDA ◽  
Takayuki KOBAYASHI

2019 ◽  
Vol 48 (12) ◽  
pp. 1205002
Author(s):  
彭 波 Peng Bo ◽  
钟 昆 Zhong Kun ◽  
赵 慧 Zhao Hui ◽  
李中云 Li Zhongyun

2011 ◽  
Vol 264-265 ◽  
pp. 856-861 ◽  
Author(s):  
Saafie Salleh ◽  
Harvey N. Rutt ◽  
M.N. Dalimin ◽  
Muhamad Mat Salleh

Zinc sulfide (ZnS) thin films as the waveguide medium have been deposited onto oxidized silicon wafer substrates at cold temperature (Tcold = –50oC) and ambient temperature (Tambient = 25oC) by thermal evaporation technique. The surface morphology of ZnS films were pictured with an atomic force microscopy (AFM) and the surface roughness were calculated from the AFM images. The propagation losses of the samples were measured using a scanning detection technique attached to a prism coupler. The AFM results revealed that the surface of cold deposited ZnS film is rougher than the surface of ambient deposited ZnS film. The propagation losses of the cold deposited ZnS waveguide are consistently lower than the ambient deposited ZnS waveguide at all measured wavelengths.


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