Cold Deposition of Zinc Sulfide Optical Waveguides Using Thermoelectric Device

2011 ◽  
Vol 264-265 ◽  
pp. 856-861 ◽  
Author(s):  
Saafie Salleh ◽  
Harvey N. Rutt ◽  
M.N. Dalimin ◽  
Muhamad Mat Salleh
Keyword(s):  
Zinc Sulfide ◽  
Optical Waveguides ◽  
Thermoelectric Device ◽  
Force Microscopy ◽  
Prism Coupler ◽  
Atomic Force ◽  
Propagation Losses ◽  
Evaporation Technique ◽  
Scanning Detection ◽  
Zns Films

Zinc sulfide (ZnS) thin films as the waveguide medium have been deposited onto oxidized silicon wafer substrates at cold temperature (Tcold = –50oC) and ambient temperature (Tambient = 25oC) by thermal evaporation technique. The surface morphology of ZnS films were pictured with an atomic force microscopy (AFM) and the surface roughness were calculated from the AFM images. The propagation losses of the samples were measured using a scanning detection technique attached to a prism coupler. The AFM results revealed that the surface of cold deposited ZnS film is rougher than the surface of ambient deposited ZnS film. The propagation losses of the cold deposited ZnS waveguide are consistently lower than the ambient deposited ZnS waveguide at all measured wavelengths.

Epitaxial BaTiO3 Thin Films on Different Substrates for Optical Waveguide Applications

1999 ◽  
Vol 597 ◽  
Author(s):  
M. Siegert ◽  
Judit G. Lisoni ◽  
C. H. Lei ◽  
A. Eckau ◽  
W. Zander ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Waveguides ◽  
Rutherford Backscattering Spectrometry ◽  
Optical Data ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Ion Channeling ◽  
Atomic Force ◽  
Transmission Electron

AbstractIn the process of developing thin film electro-optical waveguides we investigated the influence of different substrates on the optical and structural properties of epitaxial BaTiO3 thin films. These films are grown by on-axis pulsed laser deposition (PLD) on MgO(100), MgAl2O4(100), SrTiO3(100) and MgO buffered A12O3(1102) substrates. The waveguide losses and the refractive indices were measured with a prism coupling setup. The optical data are correlated to the results of Rutherford backscattering spectrometry/ion channeling (RBS/C). X-ray diffraction (XRD), atomic force microscopy (AFM) and transmission electron microscopy (TEM). BaTiO3 films on MgO(100) substrates show planar waveguide losses of 3 dB/cm and ridge waveguide losses of 5 dB/cm at a wavelength of 633 nm.

Structural, morphology and electrical properties of layered copper selenide thin film

Open Physics ◽  
2009 ◽  
Vol 7 (2) ◽  
Author(s):  
J. Ying Chyi Liew ◽  
Zainal Talib ◽  
W. Mahmood ◽  
M. Yunus ◽  
Zulkarnain Zainal ◽  
...  
Keyword(s):  
Electrical Conductivity ◽  
Surface Roughness ◽  
Grain Size ◽  
Copper Selenide ◽  
Layer By Layer ◽  
Structural Morphology ◽  
Force Microscopy ◽  
Atomic Force ◽  
Average Grain Size ◽  
Evaporation Technique

AbstractThin films of copper selenide (CuSe) were physically deposited layer-by-layer up to 5 layers using thermal evaporation technique onto a glass substrate. Various film properties, including the thickness, structure, morphology, surface roughness, average grain size and electrical conductivity are studied and discussed. These properties are characterized by X-ray diffraction (XRD), atomic force microscopy (AFM), ellipsometer and 4 point probe at room temperature. The dependence of electrical conductivity, surface roughness, and average grain size on number of layers deposited is discussed.

In-situ investigations on the SILAR-growth of ZnS films as studied by tapping mode atomic force microscopy

1997 ◽  
Vol 358 (1-2) ◽  
pp. 80-84 ◽  
Author(s):  
R. Resch ◽  
G. Friedbacher ◽  
M. Grasserbauer ◽  
T. Kanniainen ◽  
S. Lindroos ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Zns Films ◽  
Mode Atomic Force Microscopy

BaTiO3 Waveguides on MgO Buffered-Sapphire Single Crystals

1999 ◽  
Vol 597 ◽  
Author(s):  
Judit G. Lisoni ◽  
M. Siegert ◽  
C. H. Lei ◽  
C. L. Jia ◽  
J. Schubert ◽  
...  
Keyword(s):  
Optical Waveguides ◽  
Ferroelectric Thin Film ◽  
X Ray Diffraction ◽  
Epitaxial Relationship ◽  
Rocking Curve ◽  
Force Microscopy ◽  
Sapphire Substrates ◽  
Atomic Force ◽  
Transmission Electron ◽  
Good Crystalline Quality

AbstractWithin our program to develop ferroelectric thin film optical waveguides, we have studied the growth of epitaxial waveguides BaTiO3 on r-plane sapphire substrates with a MgO buffer layer. The films were prepared by pulsed laser deposition (PLD). Their structural properties were studied by X-ray diffraction (XRD), transmission electron microscopy (TEM), Rutherford backscattering (RBS) in random and channeling (RBS-c) configuration and atomic force microscopy (AFM). They displayed good crystalline quality, characterized by an RBS-c minimum yield of about 4–6%, a full width at half maximum (FWHM) of the XRD rocking curve measurement of the BaTiO3(200) reflection of 0.32° and a rms roughness of 1.2 nm in a film of ∼ 1.0 μm thickness. The epitaxial relationship was found to be BaTiO3(100) // MgO(100) // A12O3(1102). The refractive index, the birefringence and the optical losses have been measured.

Structural and Optical Properties of Nanophotonic LiNbO3 under Stirrer Time Effect

2018 ◽  
Vol 39 (3) ◽  
pp. 297-306 ◽  
Author(s):  
Makram A. Fakhri ◽  
Y. Al-Douri ◽  
A. Bouhemadou ◽  
M. Ameri
Keyword(s):  
Optical Waveguides ◽  
Time Effect ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Optical Dielectric Constant ◽  
Optical Dielectric ◽  
Uv Visible

Abstract Lithium niobate (LiNbO3) nanostructures are synthesized on n-silicon substrate by spin coating technique with stirrer times; 8 h, 24 h and 48 h. LiNbO3 is characterized and analyzed by Scanning Electron Microscope (SEM), Atomic Force Microscopy (AFM), X-ray diffraction (XRD) and UV-visible and Photoluminescence (PL). The measurements show that as stirrer time increases, the structures start to crystallize to become more regular distribution, which helps to apply in optical waveguides. In addition, the calculated refractive index and optical dielectric constant are in agreement with experimental data.

scholarly journals Study of crystallographic, optical and sensing properties of Na2WO4 films deposited by thermal evaporation with several thickness

2019 ◽  
Vol 37 (4) ◽  
pp. 590-598
Author(s):  
B. Abdallah ◽  
M. Kakhia ◽  
S. Abou Shaker
Keyword(s):  
Film Thickness ◽  
Photoelectron Spectroscopy ◽  
Near Infrared ◽  
Thermal Evaporation ◽  
Infrared Range ◽  
Sensing Properties ◽  
Force Microscopy ◽  
Atomic Force ◽  
Average Transmittance ◽  
Evaporation Technique

AbstractNa2WO4 films have been grown at 400 °C using thermal evaporation technique. Their structural properties were characterized by XRD, while their chemical composition was verified by both EDX and X-ray photoelectron spectroscopy (XPS). The evolution of crystallinity was studied as a function of film thickness that ranged from 500 nm to 3000 nm. The grain size increased with increasing film thickness. The surface morphology of the prepared films was studied using scanning electron microscope (SEM) and atomic force microscopy (AFM). It has been observed that the average transmittance of samples in the visible and near infrared range has varied from 90 % to 78 % with the film thickness. The optical band gap of the Na2WO4 films varied from 3.8 eV to 4.1 eV. The crystalline size increased with increasing thickness and showed better sensing response to gases. Thus, this study confirmed the possibility of using Na2WO4 thick films as a sensor element for detection of ethanol (C2H5OH), acetone (C3H6O) methanol (CH3OH) and ammonia hydroxide (NH4OH) vapor at room temperature, where thicker films exhibited sensing properties with a maximum sensitivity at 25 °C in air, especially for NH4OH.

scholarly journals Raman spectroscopy of optical properties in CdS thin films

2015 ◽  
Vol 47 (2) ◽  
pp. 145-152 ◽  
Author(s):  
J. Trajic ◽  
M. Gilic ◽  
N. Romcevic ◽  
M. Romcevic ◽  
G. Stanisic ◽  
...  
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Optical Properties ◽  
Effective Permittivity ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surface Optical ◽  
Cds Thin Films ◽  
Evaporation Technique

Properties of CdS thin films were investigated applying atomic force microscopy (AFM) and Raman spectroscopy. CdS thin films were prepared by using thermal evaporation technique under base pressure 2 x 10-5 torr. The quality of these films was investigated by AFM spectroscopy. We apply Raman scattering to investigate optical properties of CdS thin films, and reveal existence of surface optical phonon (SOP) mode at 297 cm-1. Effective permittivity of mixture were modeled by Maxwell - Garnet approximation.

Growth of zinc sulfide thin films on (100)Si with the successive ionic layer adsorption and reaction method studied by atomic force microscopy

1998 ◽  
Vol 136 (1-2) ◽  
pp. 131-136 ◽  
Author(s):  
Mika P Valkonen ◽  
Seppo Lindroos ◽  
Roland Resch ◽  
Markku Leskelä ◽  
Gernot Friedbacher ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Zinc Sulfide ◽  
Reaction Method ◽  
Force Microscopy ◽  
Atomic Force ◽  
Layer Adsorption ◽  
Ionic Layer

scholarly journals Preparation of Poly(L,L-Lactide) Microparticles via Pickering Emulsions Using Chitin Nanocrystals

2018 ◽  
Vol 2018 ◽  
pp. 1-8 ◽  
Author(s):  
T. S. Demina ◽  
Yu. S. Sotnikova ◽  
A. V. Istomin ◽  
Ch. Grandfils ◽  
T. A. Akopova ◽  
...  
Keyword(s):  
Chemical Structure ◽  
Total Yield ◽  
Crab Shell ◽  
Pickering Emulsions ◽  
Water Emulsion ◽  
Force Microscopy ◽  
Aspect Ratios ◽  
Atomic Force ◽  
Evaporation Technique ◽  
Oil Water

The aim of the present study was to investigate an ability of chitin nanocrystals to be used as stabilizing components for fabrication of poly(L,L-lactide) microparticles via the Pickering oil/water emulsion solvent evaporation technique. The anisometric chitin nanocrystals were extracted from two different samples of crab shell chitin via acetic hydrolysis and analyzed using atomic force microscopy, dynamic light scattering, and FTIR spectroscopy. The extracted nanocrystals showed no difference in the chemical structure but possessed different morphology and aspect ratios as a function of raw chitin used. The effect of chitin nanocrystals characteristics and concentration in the aqueous phase on the total yield, size distribution, and shape and surface morphology of the prepared polylactide microparticles was evaluated.

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