DIGITAL ZENITH CAMERA FOR VERTICAL DEFLECTION DETERMINATION

2012 ◽  
Vol 38 (4) ◽  
pp. 123-129 ◽  
Author(s):  
Māris Abele ◽  
Jānis Balodis ◽  
Inese Janpaule ◽  
Ieva Lasmane ◽  
Augusts Rubans ◽  
...  
Keyword(s):  
Data Processing ◽  
Digital Imaging ◽  
High Accuracy ◽  
Reference Star ◽  
Research Groups ◽  
Vertical Deflection ◽  
Digital Imaging Technology ◽  
Prototype Instrument ◽  
Automated Determination

Recent accomplishments in advancement of accurate astrometric reference star catalogues, development of digital imaging technology, high accuracy tiltmeter technology, and geocentric coordinate availability provided by GNSS, have made possible accurate, fast and automated determination of vertical deflections using astrometric methods. Zenith cameras for this kind of measurements have been developed or are being developed by several research groups. The paper describes a research project by Institute of Geodesy and Geoinformation, intended to design a portable digital zenith camera for vertical deflection determination with 0.1” expected accuracy. Camera components are described, proposed data processing algorithm and preliminary results, obtained with prototype instrument, are presented.

The bright future of digital imaging in scanning electron microscopy

1993 ◽  
Vol 51 ◽  
pp. 768-769
Author(s):  
M. T. Postek ◽  
A. E. Vladar
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Digital Imaging ◽  
High Speed ◽  
High Performance ◽  
Mass Storage ◽  
Analog To Digital ◽  
Central Processing ◽  
Digital Imaging Technology ◽  
Scanning Electron

One of the major advancements applied to scanning electron microscopy (SEM) during the past 10 years has been the development and application of digital imaging technology. Advancements in technology, notably the availability of less expensive, high-density memory chips and the development of high speed analog-to-digital converters, mass storage and high performance central processing units have fostered this revolution. Today, most modern SEM instruments have digital electronics as a standard feature. These instruments, generally have 8 bit or 256 gray levels with, at least, 512 × 512 pixel density operating at TV rate. In addition, current slow-scan commercial frame-grabber cards, directly applicable to the SEM, can have upwards of 12-14 bit lateral resolution permitting image acquisition at 4096 × 4096 resolution or greater. The two major categories of SEM systems to which digital technology have been applied are:In the analog SEM system the scan generator is normally operated in an analog manner and the image is displayed in an analog or "slow scan" mode.

An Automated Procedure for the Determination of Ammonia in Tobacco

1972 ◽  
Vol 6 (4) ◽  
Author(s):  
P.F. Collins ◽  
W.W. Lawrence ◽  
J.F. Williams
Keyword(s):  
Standard Deviation ◽  
Relative Standard Deviation ◽  
Distillation Method ◽  
Relative Standard ◽  
Tobacco Sample ◽  
Automated Determination

AbstractA procedure for the automated determination of ammonia in tobacco has been developed. Ammonia is extracted from the ground tobacco sample with water and is determined with a Technicon Auto Analyser system which employs separation of the ammonia through volatilization followed by colourimetry using the phenate-hypochlorite reaction. The procedure has been applied to a variety of tobaccos containing from 0.02 to 0.5 % ammonia with an overall relative standard deviation of 2 %. The accuracy of the procedure as judged by recovery tests and by comparison to a manual distillation method is considered adequate

Accurate, fully automated determination of the initial settling rate of flocculated suspensions

2021 ◽  
Vol 164 ◽  
pp. 106823
Author(s):  
Cuong V. Nguyen ◽  
Emma Dinh ◽  
Andrew Doi ◽  
Thuong V. Nguyen ◽  
Anh V. Nguyen
Keyword(s):  
Settling Rate ◽  
Automated Determination

scholarly journals The Degree of Oxidation of Graphene Oxide

Nanomaterials ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 560
Author(s):  
Alexandra Carvalho ◽  
Mariana C. F. Costa ◽  
Valeria S. Marangoni ◽  
Pei Rou Ng ◽  
Thi Le Hang Nguyen ◽  
...  
Keyword(s):  
Graphene Oxide ◽  
Ab Initio ◽  
State Of The Art ◽  
High Accuracy ◽  
Precise Determination ◽  
Photoemission Spectroscopy ◽  
Pristine Graphene ◽  
X Ray ◽  
Degree Of Oxidation

We show that the degree of oxidation of graphene oxide (GO) can be obtained by using a combination of state-of-the-art ab initio computational modeling and X-ray photoemission spectroscopy (XPS). We show that the shift of the XPS C1s peak relative to pristine graphene, ΔEC1s, can be described with high accuracy by ΔEC1s=A(cO−cl)2+E0, where c0 is the oxygen concentration, A=52.3 eV, cl=0.122, and E0=1.22 eV. Our results demonstrate a precise determination of the oxygen content of GO samples.

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