Virtual Manipulation of Multi-Wall Carbon Nanotubes with Atomic Force Microscope

This paper describes a virtual reality (VR) simulator for the manipulation of carbon multi-wall nanotubes with atomic force microscope (AFM). Major challenges in interfacing a human operator with tasks of manipulating nanotubes via a haptic VR interface are outlined. After a review of our previous efforts, we present the current state of our VR simulator for multi-wall nanotube manipulation. The collision detection, interaction force modeling, deformation simulation and haptic rendering of nanotubes are then discussed. Results of virtual manipulation of carbon nanotubes are presented within an immersive VR set-up.

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Electrostatic displacement of multiwalled carbon nanotubes by scanning a voltage-applied tip of an atomic force microscope

The European Physical Journal Applied Physics ◽

10.1051/epjap:2004199 ◽

2004 ◽

Vol 28 (3) ◽

pp. 301-304 ◽

Cited By ~ 3

Author(s):

D.-H. Kim ◽

J.-Y. Koo ◽

J.-J. Kim

Keyword(s):

Carbon Nanotubes ◽

Atomic Force Microscope ◽

Multiwalled Carbon Nanotubes ◽

Multiwalled Carbon ◽

Atomic Force

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Set-up of a high-resolution 300 mK atomic force microscope in an ultra-high vacuum compatible 3He/10 T cryostat

Review of Scientific Instruments ◽

10.1063/1.4955448 ◽

2016 ◽

Vol 87 (7) ◽

pp. 073702 ◽

Cited By ~ 3

Author(s):

H. von Allwörden ◽

K. Ruschmeier ◽

A. Köhler ◽

T. Eelbo ◽

A. Schwarz ◽

...

Keyword(s):

High Resolution ◽

Atomic Force Microscope ◽

High Vacuum ◽

Ultra High Vacuum ◽

Atomic Force ◽

Set Up

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Nano-machining of highly oriented pyrolytic graphite using conductive atomic force microscope tips and carbon nanotubes

Nanotechnology ◽

10.1088/0957-4484/18/40/405306 ◽

2007 ◽

Vol 18 (40) ◽

pp. 405306 ◽

Cited By ~ 25

Author(s):

Jin Gyu Park ◽

Chuck Zhang ◽

Richard Liang ◽

Ben Wang

Keyword(s):

Carbon Nanotubes ◽

Atomic Force Microscope ◽

Pyrolytic Graphite ◽

Highly Oriented Pyrolytic Graphite ◽

Atomic Force

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Fabrication of Nanoelectrodes by Cutting Carbon Nanotubes Assembled by Di-Electrophoresis Based on Atomic Force Microscope

Nanotechnology ◽

10.4018/978-1-4666-5125-8.ch065 ◽

2014 ◽

pp. 1403-1412

Author(s):

Zengxu Zhao ◽

Xiaojun Tian ◽

Zaili Dong ◽

Ke Xu

Keyword(s):

Carbon Nanotubes ◽

Atomic Force Microscope ◽

Electrochemical Sensors ◽

Fabrication Method ◽

Atomic Force

Presented is a new fabrication method for CNT (Carbon NanoTubes) nanoelectrode pairs by combining the DEP (Di-electrophoresis) and AFM (Atomic Force Microscope) lithography. The single CNT is driven and electrically connected with the microeletrodes by the DEP force,then cut into nanoeletrode pairs with AFM tip. The fabricated CNT nanoeletrode pairs can be used as probes to detect species in micro-environment and applied in electrochemical sensors.

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Design and Construction of Low Temperature Attachment for Commercial AFM

Solid State Phenomena ◽

10.4028/www.scientific.net/ssp.209.137 ◽

2013 ◽

Vol 209 ◽

pp. 137-142

Author(s):

Abrarkhan M. Pathan ◽

Dhawal H. Agrawal ◽

Pina M. Bhatt ◽

Hitarthi H. Patel ◽

U.S. Joshi

Keyword(s):

Atomic Force Microscope ◽

Cryogenic Temperature ◽

Low Cost ◽

Perovskite Manganite ◽

Atomic Force ◽

Structure Of Nanomaterials ◽

Negative Bending ◽

Set Up ◽

Free Environment ◽

Repulsive Forces

With the rapid advancements in the field of nanoscience and nanotechnology, scanning probe microscopy has become an integral part of a typical R&D lab. Atomic force microscope (AFM) has become a familiar name in this category. The AFM measures the forces acting between a fine tip and a sample. The tip is attached to the free end of a cantilever and is brought very close to a surface. Attractive or repulsive forces resulting from interactions between the tip and the surface will cause a positive or negative bending of the cantilever. The bending is detected by means of a laser beam, which is reflected from the backside of the cantilever. Atomic force microscopy is currently applied to various environments (air, liquid, vacuum) and types of materials such as metal semiconductors, soft biological samples, conductive and non-conductive materials. With this technique size measurements or even manipulations of nano-objects may be performed. An experimental setup has been designed and built such that a commercially available Atomic Force Microscope (AFM) (Nanosurf AG, Easyscan 2) can be operated at cryogenic temperature under vacuum and in a vibration-free environment. The design also takes care of portability and flexibility of AFM i.e. it is very small, light weight and AFM can be used in both ambient and cryogenic conditions. The whole set up was assembled in-house at a fairly low cost. It is used to study the surface structure of nanomaterials. Important perovskite manganite Pr0.7Ca0.3MnO3thin films were studied and results such as morphology, RMS area and line roughness as well as the particle size have been estimated at cryogenic temperature.

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