Design of X-Ray Fluorescence Spectrum Software Based on Linux

Sample Analysis ◽

Analysis Software ◽

X Ray ◽

System A ◽

Fluorescent Spectrum ◽

Fluorescence Analyzer

According to the research on analysis software of X fluorescent spectrum under the Linux system, a new algorithm of X fluorescence analyzer has been brought up: use the method of energy dispersive X fluorescence analysis, based on the software that can analyze the material composition under the control of ARM - Linux touch screen. This paper fixes on developing software of X fluorescence analyzer; realize the collection and analysis of multi-channel spectrum data, data storage, sample analysis, qualitative and quantitative analysis of the on-site samples, and the research and implementation of corresponding algorithm.

The qualitative and quantitative analysis of renal stones by X-ray diffraction and electron-probe techniques

Acta Crystallographica Section A ◽

10.1107/s0567739480000290 ◽

1980 ◽

Vol 36 (1) ◽

pp. 156-156

Author(s):

M. Modlin

Keyword(s):

Quantitative Analysis ◽

Electron Probe ◽

Renal Stones ◽

X Ray Diffraction ◽

X Ray ◽

Qualitative And Quantitative

Pulse-Height Selection in X-Ray Fluorescence

10.1154/s037603080000121x ◽

1960 ◽

Vol 4 ◽

pp. 370-381

Author(s):

Kurt F.J. Heinrich

Keyword(s):

Energy Levels ◽

Pulse Height ◽

Fluorescence Analysis ◽

Higher Order ◽

Pulse Height Analyzer ◽

X Ray ◽

Systematic Application ◽

Pulse Height Analysis ◽

Qualitative Work

AbstractPulse-height analysis is a valuable tool in X-ray fluorescence analysis, both for qualitative and quantitative purposes. The elimination of higher order interferences permits determinations that would otherwise be very difficult or impossible, The systematic application of pulse-height analysis in qualitative work greatly simplifies the interpretation of complex spectra. In certain cases one can apply nondispersive analysis, relying on the pulse-height analyzer alone for separating energy levels of X-ray photons. Technique and limitations of pulse-height analysis will be discussed.

Requirement Analysis and Preliminary Design for Energy Dispersive X-ray Fluorescence Analysis Software

10.1154/s0376030800014415 ◽

1990 ◽

Vol 34 ◽

pp. 149-156

Author(s):

Zhaogui Liu

Keyword(s):

Fluorescence Analysis ◽

Energy Dispersive ◽

Requirement Analysis ◽

Preliminary Design ◽

Sequence Structure ◽

X Ray ◽

Complex Information ◽

Software Packages ◽

Quantitative Analyses

AbstractThe rapid progress of x-ray fluorescence analysis spectrometers has been closely associated with advances in computers. Due to the power of computers, it is possible to acquire the data automatically and interpret complex information accurately and quickly, so as to provide both qualitative and quantitative analyses. It is now about thirty years that computers have been applied to X-Ray Fluorescence Analysis (XRFA). Few workers have discussed the style of the various approaches, although many different software packages have been used for XRFA. Requirement analysis has been performed for Energy Dispersive (ED) XRFA, and preliminary designs are given for three types of structures: i. Sequence structure, ii. Tree structure, and iii. Net structure.

X-Ray Fluorescence in Cotton Modification Research

10.1154/s0376030800003347 ◽

1964 ◽

Vol 8 ◽

pp. 456-461

Author(s):

Donald Mitcham ◽

Biagio Piccolo ◽

Verne W. Tripp ◽

Robert T. O’Connor

Keyword(s):

Quantitative Analysis ◽

Cotton Textile ◽

X Ray ◽

Textile Materials ◽

Chemically Modified ◽

Elapsed Time

AbstractThe application of X-ray fluorescence to the qualitative and quantitative analysis of chemically modified cotton textile materials is described. The scope and flexibility of the technique have permitted the determination of more than 20 elements with, greatly reduced elapsed time compared with the corresponding spectroscopic or wet methods. Precautions to be observed in preparing standards are discussed. Results of the analysis of typical modifications and their significance in the development of cottons for specific uses are described.

Comparison of Dual-Channel Wavelength and Secondary-Target Energy-Dispersive X-Ray Spectrometers

10.1154/s0376030800021327 ◽

1986 ◽

Vol 30 ◽

pp. 225-236

Author(s):

John F. Croke ◽

Joseph A. Nicolosi

Keyword(s):

List Type ◽

X Ray ◽

The Past ◽

Dual Channel ◽

Target Energy ◽

Overall Performance ◽

Channel Wavelength ◽

Speed Accuracy

Over the past 30 years, X-ray fluorescence spectrometry has become one of the more valuable methods for the qualitative and quantitative analysis of materials. Today, there are many methods of instrumental analysis available, and among the factors that will be taken into account in the method of selection are: -Accuracy-Range of application-Speed-Sensitivity-ReliabilityNo one technique can provide all of the features that a given analyst requires. XRF does offer good overall performance over the widest range of elements. Speed, accuracy, and versatility are among the features that have made XRF the method of choice for over 15,000 laboratories worldwide.

Computed Tomography Experiments on a Laboratory Multipurpose Diffractometer

Key Engineering Materials ◽

10.4028/www.scientific.net/kem.742.666 ◽

2017 ◽

Vol 742 ◽

pp. 666-670

Author(s):

Natalia Dadivanyan ◽

Detlev J. Götz ◽

Detlef Beckers ◽

Fabio Masiello

Keyword(s):

Computed Tomography ◽

Heavy Element ◽

High Energy ◽

Low Energy ◽

X Ray ◽

Energy Application ◽

Solid Compounds ◽

3D Information

Applications of soft (Co and Cu X-ray tube) and hard (Ag X-ray tube) radiation in computed tomography experiments on a laboratory X-ray diffractometer are presented. Using low energy (<10 keV) X-ray sources provide the possibility to investigate objects made of light (organic) materials in more detail compared to the high energy application. In case of metal or heavy element containing composites high energy (~20 keV) X-ray sources allow to obtain full 3D information on the samples without destroying them. These measurements allow both qualitative and quantitative analysis of porous materials, samples with oriented components, and solid compounds.

Qualitative and Quantitative Analysis of Stacking Disorder in α-and β-SiC by X-ray Diffraction and Structure Modeling

MRS Proceedings ◽

10.1557/proc-410-235 ◽

1995 ◽

Vol 410 ◽

Cited By ~ 4

Author(s):

Bogdan Palosz ◽

Svetlana Stel'makh ◽

Stanislaw Gierlotka

Keyword(s):

Quantitative Analysis ◽

Model Parameters ◽

X Ray Diffraction ◽

X Ray ◽

Poisson Function ◽

Diffraction Patterns ◽

Computer Generation ◽

Stacking Disorder

ABSTRACTA method of analysis of disordering in α- and β-SiC polycrystals by numerical modeling, and a simulation of X-ray diffraction profiles are presented. The diffraction patterns of nonperiodic structures were simulated for models of 2000 layer fragments of the structure. Computer generation of the models was based on the Poisson function describing the size distribution of the domains of basic polytypes and faults. The models were quantified by a set of input probability parameters describing relative frequencies of the occurrence of the domains of polytypes and faults. Implementation of a correlation parameter that characterizes coherence of sequential domains of a given polytype assures a good reproducibility of the simulated diffraction profiles obtained for the same set of the model parameters. Based on this method, a quantitative analysis of disordering in polycrystals of SiC annealed in the temperature range 1100–2200 °C was performed.