Enhanced Electrochromic Performance of Sol-Gel Derived WO3 Thin Films Assisted by Electrospun PVA Nanofibers

2012 ◽  
Vol 528 ◽  
pp. 249-253
Author(s):  
K. Paipitak ◽  
J. Rattanarak ◽  
D. Pakdeeyingyong ◽  
W. Techitdheera ◽  
S. Porntheeraphat ◽  
...  
Keyword(s):  
Thin Films ◽  
Spin Coating ◽  
Emission Spectroscopy ◽  
Tungsten Powder ◽  
Sol Gel ◽  
Xrd Analysis ◽  
X Ray ◽  
Electrochromic Properties ◽  
Wo3 Thin Films ◽  
Scanning Electron

The paper describes the results obtained on the enhanced electrochromic performance of Tungsten oxide (WO3) thin films assisted by electrospun PVA nanofibers. WO3 was fabricated by spin coating technique with tungsten powder as starting precursor. The effect of electrospun-PVA nanofibers layer on structural, chemical composition, surface morphology and electrochromic properties of the films were characterized by X-ray diffractometer (XRD), X-ray photo-emission spectroscopy (XPS), scanning electron microscope (SEM) and UV-VIS spectrophotometer. The XRD analysis suggested that the crystalline of WO3 can be identified as a monoclinic WO3 structure. XPS investigations also confirmed the existence of characteristic peaks of W. The significant enhancement of electrochromic properties of the films is achieved by additive electrospun-PVA nanofiber layer.

A Study on (K, Na) NbO3 Thin Films with Optimized Layer: Effect on Physical and Electrical Properties

2016 ◽  
Vol 694 ◽  
pp. 120-124 ◽  
Author(s):  
Nurul Azuwa Azmi ◽  
Umar Al Amani Azlan ◽  
Maziati Akmal Mohd Hatta ◽  
Mohd Asyadi' Azam Mohd Abid ◽  
Mohd Warikh Ab Rashid
Keyword(s):  
Thin Films ◽  
Spin Coating ◽  
Sol Gel ◽  
Inhomogeneous Distribution ◽  
X Ray ◽  
Number Of Layers ◽  
Layer Deposition ◽  
Layer Effect ◽  
Gel Technique ◽  
Scanning Electron

(K, Na)NbO3 (KNN) thin films were prepared by sol-gel technique. Spin coating deposition and rapid thermal annealing (RTP) process were applied to produce the KNN thin films. The films obtained demonstrated that highly crystallographic orientation was produced at five layer deposition with increase (preferred orientation) peak at (1 1 1). The thickness of five layers thin films observed by field emission scanning electron microscopy (FE-SEM) was determined to be ~200nm. However, the inhomogeneous distribution of KNN particles was detected in KNN thin films. The distribution of KNN elements was confirmed by energy-dispersive X-ray (EDX) spectra. Improvement was observed in resistivity (2.71-7.81x106 Ω.cm) and dielectric loss (0.35%-0.21%) following the increasing number of layers.

Sol-Gel derived Bi4-xNdxTi3O12 Thin Films and Their Characterization

2002 ◽  
Vol 737 ◽  
Author(s):  
R.E. Melgarejo ◽  
M.S. Tomar ◽  
A. Hidalgo ◽  
R.S. Katiyar
Keyword(s):  
Thin Films ◽  
Spin Coating ◽  
Bismuth Titanate ◽  
Sol Gel ◽  
X Ray Diffraction ◽  
X Ray ◽  
Complete Solid Solution ◽  
Sol Gel Process ◽  
Ferroelectric Memory ◽  
Initial Results

ABSTRACTNd substituted bismuth titanate Bi4-xNdxTi3O12 were synthesized by sol-gel process and thin films were deposited on Pt substrate (Pt/TiO2/SiO2/Si) by spin coating. Thin films, characterized by X-ray diffraction and Raman spectroscopy, shows complete solid solution up to the composition x < 1. Initial results indicate that the ferroelectric polarization increases with increasing Nd content in the film with 2Pr = 50μC/cm2 for x = 0.46, which may have application in non-volatile ferroelectric memory devices.

Synthesis and Characterizations of Strontium Substituted Hydroxyapatite Thin Films

2010 ◽  
Vol 93-94 ◽  
pp. 231-234
Author(s):  
B. Hongthong ◽  
Satreerat K. Hodak ◽  
Sukkaneste Tungasmita
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Chemical Composition ◽  
Spin Coating ◽  
Phase Structure ◽  
Sol Gel ◽  
Cross Linking ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sol Gel Process

Strontium substituted hydroxyapatite(SrHAp) were fabricated both in the form of powder as reference and thin film by using inorganic precursor reaction. The sol-gel process has been used for the deposition of SrHAp layer on stainless steal 316L substrate by spin coating technique, after that the films were annealed in air at various temperatures. The chemical composition of SrHAp is represented (SrxCa1-x)5(PO4)3OH, where x is equal to 0, 0.5 and 1.0. Investigations of the phase structure of SrHAp were carried out by using X-ray diffraction technique (XRD). The results showed that strontium is incorporated into hydroxyapatite where its substitution for calcium increases in the lattice parameters, and Sr3(PO4)2 can be detected at 900°C. The SEM micrographs showed that SrHAp films exhibited porous structure before develop to a cross-linking structure.

Facile Electrospinning Preparation of Y3Al5O12 Nanobelts

2013 ◽  
Vol 448-453 ◽  
pp. 3041-3045
Author(s):  
Fei Bi ◽  
Xiang Ting Dong ◽  
Jin Xian Wang ◽  
Gui Xia Liu ◽  
Wen Sheng Yu
Keyword(s):  
Sol Gel ◽  
Xrd Analysis ◽  
Sem Analysis ◽  
Ftir Analysis ◽  
X Ray ◽  
Novel Structure ◽  
Group I ◽  
Sol Gel Process ◽  
Composite Nanobelts ◽  
Scanning Electron

PVP/[Y(NO3)3+Al (NO3)3] composite nanobelts were fabricated via electrospinning combined with sol-gel process and novel structure of Y3Al5O12(denoted as YAG for short) nanobelts have been obtained after calcination of the relevant composite nanobelts. The structural properties were characterized by X-ray diffractometry (XRD), Fourier transform infrared spectroscopy (FTIR) and scanning electron microscopy (SEM). XRD analysis indicated that the composite nanobelts were amorphous, and YAG nanobelts were cubic in structure with space group Ia3d. FTIR analysis manifested that pure YAG nanobelts were formed at 900oC. SEM analysis and histograms revealed that the width of the composite nanobelts and YAG nanobelts were 3.5 μm and 2.4 μm, and the thickness were 240 nm and 112 nm, respectively, under the 95% confidence level. The formation mechanism of YAG nanobelts was discussed in detail.

Effect of Dip-Coating Cycle on Some Physical Properties of Cu2NiSnS4 Thin Films for Photovoltaic Applications

2021 ◽  
Author(s):  
Ahmed ZITI ◽  
Bouchaib HARTITI ◽  
Amine BELAFHAILI ◽  
Hicham LABRIM ◽  
Salah FADILI ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Sol Gel ◽  
Dip Coating ◽  
Visible Spectroscopy ◽  
X Ray ◽  
Uv Visible ◽  
The Impact ◽  
Scanning Electron

Abstract Quaternary semiconductor Cu2NiSnS4 thin film was made by the sol-gel method associated to dip-coating technique on ordinary glass substrates. In this paper, we have studied the impact of dip-coating cycle at different cycles: 4, 5 and 6 on the structural, compositional, morphological, optical and electrical characteristics. CNTS thin films have been analyzed by various characterization techniques including: X-ray diffractometer (XRD), Raman measurements, scanning electron microscope (SEM), energy dispersive X-ray spectroscope (EDS), UV-visible spectroscopy and four-point probe method. XRD spectra demonstrated the formation of cubic Cu2NiSnS4 with privileged orientation at (111) plane. Crystallite size of cubic CNTS thin films increase with from 6.30 to 9.52 with dip-coating cycle augmented. Raman scattering confirmed the existence of CNTS thin films by Raman vibrational mode positioned at 332 cm− 1. EDS investigations showed near-stoichiometry of CNTS sample deposited at 5 cycles. Scanning electron microscope showed uniform surface morphologies without any crack. UV-visible spectroscopy indicated that the optical absorption values are larger than 104 cm− 1, Estimated band gap energy of CNTS absorber layers decrease from 1.64 to 1.5 eV with dip-coating cycle increased. The electrical conductivity of CNTS thin films increase from 0.19 to 4.16 (Ω cm)-1. These characteristics are suitable for solar cells applications.

SiO2ZrO2 Thin Films as Low Temperature NO2 and O3 Sensors

2015 ◽  
Vol 1088 ◽  
pp. 81-85 ◽  
Author(s):  
T.N. Myasoedova ◽  
Victor V. Petrov ◽  
Nina K. Plugotarenko ◽  
Dmitriy V. Sergeenko ◽  
Galina Yalovega ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Low Temperature ◽  
Annealing Temperature ◽  
Sol Gel ◽  
X Ray Diffraction ◽  
X Ray ◽  
Operating Temperatures ◽  
Scanning Electron

Thin SiO2ZrO2films were prepared, up to 0.2 μm thick, by means of the sol–gel technology and characterized by a Scanning electron microscopy and X-ray diffraction. It is shown the presence of monoclinic, cubic and tetragonal phases of ZrO2in the SiO2matrix. The crystallites sizes depend on the annealing temperature of the film and amount to 35 and 56 nm for the films annealed at 773 and 973 K, respectively. The films resistance is rather sensitive to the presence of NO2and O3impurity in air at lower operating temperatures in the range of 30-60°C.

Growth and Characterization of PZT Thin Films

2008 ◽  
Author(s):  
Daqun Bao ◽  
Yi Zhang ◽  
Hang Guo
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
Xrd Analysis ◽  
Annealing Process ◽  
Pzt Thin Films ◽  
X Ray ◽  
Crystallographic Structures ◽  
Strain Equation

This paper presents the growth and characterization of PZT thin films by using the sol-gel technology. In this paper, we study the influences of annealing process and different substrates on the orientation and crystalline quality of PZT thin films. The crystallographic structures are tested by using X-ray diffractometer (XRD), and the residual stresses of PZT thin films are obtained by calculation from a derived stress-strain equation in XRD analysis. Moreover, surface morphology and microstructure of the films are investigated by using AFM and SEM, and the polarization hysteresis of PZT thin films is measured by using a Sawyer Tower circuit. The results show that PZT thin films prepared by using the sol-gel method have good properties and can be used for developing PZT-based micro and nano devices.

scholarly journals Lead ethyl dithiocarbamates: efficient single-source precursors to PbS nanocubes

2019 ◽  
Vol 6 (10) ◽  
pp. 190943 ◽  
Author(s):  
S. A. Saah ◽  
N. O. Boadi ◽  
D. Adu-Poku ◽  
C. Wilkins
Keyword(s):  
Thin Films ◽  
Spin Coating ◽  
Band Gaps ◽  
Single Source ◽  
Single Source Precursors ◽  
X Ray ◽  
Annealing Temperatures ◽  
Optical Band Gaps ◽  
Microscopy Images ◽  
Scanning Electron

Lead ethyl dithiocarbamates have been successfully used as single-source precursors for the deposition of PbS using spin coating followed by annealing at moderate temperatures. The thin films were characterized using a powder X-ray diffractometer and were found to be face-centred cubic with the (200) plane being the most preferred orientation. Scanning electron microscopy images showed the formation of well-defined cubes. Optical band gaps of PbS thin films were estimated using Tauc plots as 0.72, 0.73 and 0.77 eV at annealing temperatures of 250, 300 and 400°C. These band gaps were all blue shifted from the bulk value of 0.41 eV. Energy-dispersive X-ray analysis was used to determine the composition of the thin films which showed an approximately 1 : 1 Pb to S ratio.

Preparation and Properties of TiO2/SiO2 Thin Films on Enamel Substrates

2016 ◽  
Vol 848 ◽  
pp. 717-721
Author(s):  
Li Yun Chen ◽  
Xiao Ping Liao ◽  
Wei Zhong Jiang ◽  
Jia Yi Ye ◽  
Hui Le Jin ◽  
...  
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
Ccd Camera ◽  
Dip Coating ◽  
Micro Structure ◽  
X Ray ◽  
Hydrophilic Property ◽  
Coating Method ◽  
Dip Coating Method ◽  
Scanning Electron

nanosize TiO2/SiO2 thin films were deposited by sol-gel dip-coating method on enamel substrates. Crystal structure, micro-structure, hydrophilic property, gloss property was investigated by X-ray diffract meter, scanning electron microscope, CCD camera, enamel gloss meter. The results show that the hydrophilic property of the enamel was greatly increased by heating the enamel with coating TiO2/SiO2 film; the gloss property of the enamel surface greatly increased after the enamel coated with TiO2/SiO2 film. The main crystals in TiO2/SiO2 film on the enamel were anatase when the baking temperature was below the 700°C.

MAGNETIC PROPERTIES OF Co-FERRITE AND SiO2-DOPED Co-FERRITE THIN FILMS AND POWDERS BY SOL–GEL

2004 ◽  
Vol 03 (04n05) ◽  
pp. 463-470
Author(s):  
Y. C. WANG ◽  
J. DING ◽  
B. H. LIU ◽  
Y. SHI
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Sol Gel ◽  
Vibrating Sample Magnetometer ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Structural And Magnetic Properties ◽  
Ferrite Thin Films ◽  
Scanning Electron

Thin films and powders of Co -ferrite and SiO 2-doped Co -ferrite were fabricated via the sol–gel method. The structural and magnetic properties of the films and powders were investigated with X-Ray Diffractometer (XRD), Vibrating Sample Magnetometer (VSM), Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM). VSM measurements showed an enhancement of coercivity by SiO 2-doping for Co -ferrite powders and thin films (coercivity of 3.5 kOe in SiO 2-doped thin films). XRD and SEM investigations revealed a nanostructure of the thin films. Low surface roughness was observed in our AFM study.

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