Microstructural and Magnetic Properties of C/FePt/Ti Films by Facing Sputtering

2012 ◽  
Vol 557-559 ◽  
pp. 1787-1790
Author(s):  
Jia Ling Xu ◽  
Li Yun Jia ◽  
Hong Fan
Keyword(s):  
Particle Size ◽  
Magnetic Properties ◽  
Room Temperature ◽  
Force Microscopy ◽  
Glass Substrates ◽  
Atomic Force ◽  
C 30 ◽  
Ti Films ◽  
Sputtering System

C/FePt/Ti nano-thin films were prepared by DC facing-target magnetron sputtering system onto glass substrates at room temperature and subsequently in situ annealed for 500 °C 30 min in vacuum. The influence of C capping layer on microstructural and magnetic properties of the FePt films were investigated in detail. Atomic force microscopy (AFM) images indicate that C can effectively isolate the particles, refine particle, and distribute; however, the particle size distribution is uneven for too much C. The easy magnetic axial orientation is changed with the C layer thickness.

Stress-induced surface characterization by wavelet and fractal analysis in Ga-doped ZnO thin films

MRS Advances ◽  
2017 ◽  
Vol 2 (53) ◽  
pp. 3105-3110
Author(s):  
Chenlei Jing ◽  
Yang Hu ◽  
Wu Tang
Keyword(s):  
Plane Stress ◽  
Surface Characterization ◽  
Room Temperature ◽  
Force Microscopy ◽  
Glass Substrates ◽  
Atomic Force ◽  
Surface Profiles ◽  
Doped Zno ◽  
Two Parameters ◽  
Irregular Variation

ABSTRACTThe Ga-doped ZnO (GZO) were deposited by magnetron reactive sputtering on glass substrates at room temperature with different deposited times to obtain various thickness. The root-mean-square (RMS) roughness obtained from the atomic force microscopy (AFM) images is observed to shift linearly with the deposited time, the fractal geometry and multi-resolution signal decomposition (MRSD) based on wavelet transform were applied on the surface profiles and the results does not synchronously changes as the thickness, which is related to the profile’s frequency. The calculated compressive in-plane stress of highly c-axis oriented GZO films also shows an irregular variation as the increase of film thickness, what’s more, the in-plane stress and fractal dimension exhibit a polynomial relationship and the two parameters can be used for describing the surface morphology.

Microstructure and Magnetic Properties of the CoTiO2 Thin Films

2012 ◽  
Vol 557-559 ◽  
pp. 661-664
Author(s):  
Li Yun Jia ◽  
Jia Ling Xu ◽  
Jiao Qu
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Room Temperature ◽  
The Other ◽  
Homogeneous Structure ◽  
Ferromagnetic Properties ◽  
Glass Substrates ◽  
Island Type ◽  
Microstructure And Magnetic Properties ◽  
Sputtering System

Co (t nm)/TiO2(200 nm) films were prepared by DC facing-target magnetron reactive sputtering system onto glass substrates at room temperature. The influence of the Co distribution on microstructure and magnetic properties of films was investigated in detail. The results indicate that CoTiO2thin films with t= 2 nm island-type deposited showed a homogeneous structure, and pure ferromagnetic properties of thin films are only attributed to the CoTiO2phases. On the other hand, in case of thin films above t= 2nm, the overall ferromagnetic properties depended on both CoTiO2and CoTi phases.

In Situ Atomic Force Microscopy of Pt/Ti film morphology changes on a microelectronic gas sensor operating at elevated temperatures

1995 ◽  
Vol 53 ◽  
pp. 254-255
Author(s):  
M. DiBattista ◽  
S. V. Patel ◽  
J. F. Mansfield ◽  
J. L. Gland ◽  
J. W. Schwank
Keyword(s):  
Atomic Force Microscopy ◽  
Elevated Temperatures ◽  
Film Surface ◽  
Film Structure ◽  
Film Morphology ◽  
Force Microscopy ◽  
Atomic Force ◽  
Morphology Changes ◽  
Ti Films

Thin film electronic devices that employ resistance change responses of Pt / Ti films to detect gas species have been microfabricated at the University of Michigan. Atomic force microscopy (AFM) is used to investigate morphology of the Pt / Ti sensing films deposited on the microfabricated device. These Pt / Ti sensing films are strongly influenced by many factors, making it difficult to determine the exact relationship between film structure, chemical sensitivity, and selectivity. In-situ AFM investigations of Pt / Ti films on this device at elevated temperatures provides the opportunity for real time observation of film morphology changes under controlled conditions, testing sensing film stability during device operation, and correlating film structure to resistance.Observation of the Pt / Ti film surface and in-situ resistance measurements at elevated temperatures are possible due to the construction of the sensing device. The sensors are based on chemically active thin films deposited on a micromachined silicon window, supported by a 300 μn thick silicon rim.

Features of Surface Morphology and Magnetic Properties of Sm0.5R0.5Fe2 (R = Tb, Gd) Compounds

2020 ◽  
Vol 312 ◽  
pp. 261-269
Author(s):  
Galina Aleksandrovna Politova ◽  
Tatiana P. Kaminskaya ◽  
Alexey Karpenkov ◽  
Nikolay Yu. Pankratov ◽  
Maksim Ganin ◽  
...  
Keyword(s):  
Magnetic Properties ◽  
Magnetic Force Microscopy ◽  
Room Temperature ◽  
Magnetic Force ◽  
Magnetic Domain ◽  
Surface Topology ◽  
Partial Replacement ◽  
Force Microscopy ◽  
Atomic Force ◽  
Comprehensive Study

A comprehensive study of the structure and phase composition, magnetostrictive and magnetic properties of the (Sm0.5R0.5)Fe2 (R = Gd, Tb) compounds was performed. The effect of partial replacement of samarium by gadolinium and terbium on the microstructure of the surface, the temperature of phase transitions, the magnitude of magnetostrictive deformations and magnetization was studied. Using atomic force and magnetic force microscopy, the surface topology at the micro and nanoscale was established, and information on the magnetic domain structure at room temperature was obtained.

In Situ Monitoring of Dispersion Film Formation Using Tapping-Mode Atomic Force Microscopy

2004 ◽  
Vol 838 ◽  
Author(s):  
Jing Li ◽  
Wenbin Liang ◽  
Steve Chum
Keyword(s):  
Particle Size ◽  
Atomic Force Microscopy ◽  
Film Formation ◽  
Formation Temperature ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Poly Ethylene ◽  
Mode Atomic Force Microscopy

ABSTRACTThe coalescence process of poly (ethylene-co-vinyl acetate) (EVA) and poly (ethylene-co-octene) (EO) dispersion particles was monitored in situ using tapping-mode atomic force microscopy (TMAFM) equipped with a miniature hot stage. This work describes the effect of particle size on the film formation temperature based on direct experimental observation, clarifying further the debate about particle size effect on minimum film formation temperature (MFFT). The results suggest that semicrystalline polyolefin particles have similar deformation temperature dependence. Smaller particles tend to deform faster than larger particles, which is attributed to their smaller mass. Furthermore, morphology changes and mechanical property development associated with the film formation process are also discussed. The TMAFM technique is shown to be very useful in gaining insight into the film formation mechanism, which will provide guidance in future practical applications with polyolefin dispersions.

Structure and Hydrophobicity of Fe2O3-TiO2 Coatings

2016 ◽  
Vol 721 ◽  
pp. 394-398 ◽  
Author(s):  
Anzelms Zukuls ◽  
Gundars Mezinskis
Keyword(s):  
Room Temperature ◽  
Sol Gel ◽  
Water Concentration ◽  
Glass Slide ◽  
Distilled Water ◽  
X Ray ◽  
Force Microscopy ◽  
Glass Substrates ◽  
Atomic Force ◽  
Chloride Hexahydrate

Fe2O3–TiO2 coatings were successfully prepared on glass slide substrates using sol–gel method for wettability applications. The microstructure and surface properties of the coatings were extensively characterized by using X-ray diffractometry (XRD), scanning electron microscopy (SEM) and atomic force microscopy (AFM). Different solutions were prepared by adding distilled water to sol solution. Glass substrates were coated by solutions of Ti-alkoxide, Fe-chloride hexahydrate, ethylene glycol, acetic acid, isopropanol and glycerol. The obtained gel films were dried at room temperature for 15 min in air. The oxide thin films were annealed at 500 ºC for 1h. The influence of distilled water concentration and withdraw speed on contact angle of the films was established. In addition, XRD results revealed that Fe2O3–TiO2 films composed of anatase, rutile, brookite and hematite phases. The purpose of this contribution was the investigation of different preparation parameters during the synthesis of iron oxide rich Fe2O3–TiO2 thin hydrophobic films on glass substrate. SEM and AFM observations revealed leaf-like structure formation on a coating surface.

scholarly journals Surface Characterization of Absorbing Polymer Films Deposited on Transparent Glasses

e-Polymers ◽  
2008 ◽  
Vol 8 (1) ◽  
Author(s):  
Débora Gonçalves ◽  
Silmar A. Travain ◽  
José A. Giacometti ◽  
Eugene A. Irene
Keyword(s):  
Polymer Films ◽  
Surface Characterization ◽  
Transparent Glass ◽  
Force Microscopy ◽  
Glass Substrates ◽  
Atomic Force ◽  
Vis Spectroscopy ◽  
Before And After

AbstractPANI films were deposited on glass substrates by in-situ polymerization and characterized by UV-VIS spectroscopy and atomic force microscopy. A method is developed to accurately analyze ellipsometric data obtained for transparent glass substrates before and after modification with absorbing polymer films. Surface modification was made with an overlayer such as polyaniline (PANI), which exhibits different optical properties by varying its oxidation state. First, the issue of using transparent substrates for ellipsometry studies was examined and then, spectroscopic ellipsometry was used to characterize absorbing overlayers on transparent glasses. The same methodologies of data analysis can be also applied to other absorbing films on transparent substrates, and deposited by different techniques

scholarly journals Synthesis and Characterization of PSSA-Polyaniline Composite with an Enhanced Processability in Thin Films

2014 ◽  
Vol 13 (1) ◽  
Author(s):  
Corneliu Sergiu Stan ◽  
Marcel Popa ◽  
Marius Olariu ◽  
Marius Sebastian Secula
Keyword(s):  
Thin Films ◽  
Oxidative Polymerization ◽  
Polymerization Reaction ◽  
Polar Solvents ◽  
Force Microscopy ◽  
Molar Ratios ◽  
Glass Substrates ◽  
Atomic Force

AbstractThis paper reports the synthesis and investigation of a polymer composite based on poly(4-styrenesulfonic acid) (PSSA) and polyaniline (PANI) directly obtained in an aqueous PSSA medium, with improved conductivity and solubility in polar solvents. The oxidative polymerization reaction of aniline takes place in-situ with PSSA as protonating agent. The synthesis was tested at three PSSA/PANI molar ratios, an intense green colored aqueous composite solution being obtained in each case. For comparison purposes, commercially available polyaniline and PSSA were also investigated. PSSA-PANI composites, PANI and PSSA were investigated through thermal analysis, Fourier Transform Infrared Spectroscopy (FTIR) and Raman spectroscopy. Thin films of PSSA/PANI complex were spin coated on glass substrates which were further investigated through Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM). Also, thin films of PSSA-PANI were deposited on interdigitated electrodes for dielectric measurements.

STRUCTURAL AND MAGNETIC PROPERTIES OF EPITAXIAL Ni80Fe20 THIN FILMS ON Cu/Si

1995 ◽  
Vol 02 (04) ◽  
pp. 427-437 ◽  
Author(s):  
I. HASHIM ◽  
H.S. JOO ◽  
H.A. ATWATER
Keyword(s):  
Magnetic Properties ◽  
Domain Walls ◽  
High Energy ◽  
Ex Situ ◽  
Misfit Dislocations ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Crystal Films

Single-crystal films of permalloy ( Ni 80 Fe 20) were grown on Cu (001) seed layers oriented epitaxially with Si (001). The microstructural properties were measured using in-situ reflection high-energy electron diffraction, and ex-situ transmission electron microscopy, x-ray diffraction, and atomic force microscopy, whereas the magnetic properties were probed using in-situ magneto-optic Kerr effect and ex-situ vibrating sample magnetometry. Anisotropic magnetoresistance and resistivity for some of the samples were also measured. The coercivity for thinner (≤5 nm) Ni 80 Fe 20 was significantly higher (10–20 Oersteds) than polycrystalline films deposited on SiO 2/ Si , and was also higher than films deposited on lattice-matched Cu x Ni 1–x alloys. These magnetic properties were explained using a theoretical model involving interaction of domain walls with defects such as misfit dislocations and coherent islands, due to the mismatch between Ni 80 Fe 20 and Cu .

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