scholarly journals Synthesis and Characterization of PSSA-Polyaniline Composite with an Enhanced Processability in Thin Films

2014 ◽  
Vol 13 (1) ◽  
Author(s):  
Corneliu Sergiu Stan ◽  
Marcel Popa ◽  
Marius Olariu ◽  
Marius Sebastian Secula
Keyword(s):  
Thin Films ◽  
Oxidative Polymerization ◽  
Polymerization Reaction ◽  
Polar Solvents ◽  
Force Microscopy ◽  
Molar Ratios ◽  
Glass Substrates ◽  
Atomic Force

AbstractThis paper reports the synthesis and investigation of a polymer composite based on poly(4-styrenesulfonic acid) (PSSA) and polyaniline (PANI) directly obtained in an aqueous PSSA medium, with improved conductivity and solubility in polar solvents. The oxidative polymerization reaction of aniline takes place in-situ with PSSA as protonating agent. The synthesis was tested at three PSSA/PANI molar ratios, an intense green colored aqueous composite solution being obtained in each case. For comparison purposes, commercially available polyaniline and PSSA were also investigated. PSSA-PANI composites, PANI and PSSA were investigated through thermal analysis, Fourier Transform Infrared Spectroscopy (FTIR) and Raman spectroscopy. Thin films of PSSA/PANI complex were spin coated on glass substrates which were further investigated through Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM). Also, thin films of PSSA-PANI were deposited on interdigitated electrodes for dielectric measurements.

Preparation and Characterization of BiFeO3 Film via Sol-Gel Spin-Coating Process

2011 ◽  
Vol 492 ◽  
pp. 202-205 ◽  
Author(s):  
Xi Wei Qi ◽  
Xiao Yan Zhang ◽  
Xuan Wang ◽  
Hai Bin Sun ◽  
Jian Quan Qi
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Indium Tin Oxide ◽  
Sol Gel ◽  
Secondary Phases ◽  
Force Microscopy ◽  
Glass Substrates ◽  
Atomic Force ◽  
Ito Glass

BiFeO3 thin films were spin-coated on conductive indium tin oxide (ITO)/glass substrates by a simple sol-gel possess annealed at 470-590°C. The crystal structure of as-prepared BiFeO3 thin films annealed at different temperature was determined to be rhombohedral of R3m space and free of secondary phases was also confirmed. Cross section scanning electron microscope (SEM) pictures revealed that the thickness of BiFeO3 thin film was about 320 nm. The double remanent polarization 2Pr of BiFeO3 thin film annealed at 500°C is 2.5 μC/cm2 without applied field at room temperature. Image of atomic force microscopy indicated that the root-mean-square surface roughness value of BiFeO3 thin film was 6.13 nm.

scholarly journals Surface Characterization of Absorbing Polymer Films Deposited on Transparent Glasses

e-Polymers ◽  
2008 ◽  
Vol 8 (1) ◽  
Author(s):  
Débora Gonçalves ◽  
Silmar A. Travain ◽  
José A. Giacometti ◽  
Eugene A. Irene
Keyword(s):  
Polymer Films ◽  
Surface Characterization ◽  
Transparent Glass ◽  
Force Microscopy ◽  
Glass Substrates ◽  
Atomic Force ◽  
Vis Spectroscopy ◽  
Before And After

AbstractPANI films were deposited on glass substrates by in-situ polymerization and characterized by UV-VIS spectroscopy and atomic force microscopy. A method is developed to accurately analyze ellipsometric data obtained for transparent glass substrates before and after modification with absorbing polymer films. Surface modification was made with an overlayer such as polyaniline (PANI), which exhibits different optical properties by varying its oxidation state. First, the issue of using transparent substrates for ellipsometry studies was examined and then, spectroscopic ellipsometry was used to characterize absorbing overlayers on transparent glasses. The same methodologies of data analysis can be also applied to other absorbing films on transparent substrates, and deposited by different techniques

scholarly journals IR and electrochemical synthesis and characterization of thin films of PEDOT grown on platinum single crystal electrodes in [EMMIM]Tf2N ionic liquid

2015 ◽  
Vol 11 ◽  
pp. 348-357 ◽  
Author(s):  
Andrea P Sandoval ◽  
Marco F Suárez-Herrera ◽  
Juan M Feliu
Keyword(s):  
Thin Films ◽  
Ionic Liquid ◽  
Redox Reactions ◽  
Charge Carriers ◽  
In Situ Ftir Spectroscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Platinum Single Crystal

Thin films of PEDOT synthesized on platinum single electrodes in contact with the ionic liquid 1-ethyl-2,3-dimethylimidazolium triflimide ([EMMIM]Tf2N) were studied by cyclic voltammetry, chronoamperometry, infrared spectroscopy and atomic force microscopy. It was found that the polymer grows faster on Pt(111) than on Pt(110) or Pt(100) and that the redox reactions associated with the PEDOT p-doping process are much more reversible in [EMMIM]Tf2N than in acetonitrile. Finally, the ion exchange and charge carriers’ formation during the p-doping reaction of PEDOT were studied using in situ FTIR spectroscopy.

CHARACTERIZATION OF CHEMICALLY-DEPOSITED SILVER SULFIDE THIN FILMS

2009 ◽  
Vol 23 (30) ◽  
pp. 5695-5704 ◽  
Author(s):  
M. Z. MOLLA ◽  
M. R. I. CHOWDHURY ◽  
G. MUSTAFA ◽  
S. HUSSAIN ◽  
K. S. HOSSAIN ◽  
...  
Keyword(s):  
Thin Films ◽  
Stoichiometric Composition ◽  
Compositional Analysis ◽  
Silver Sulfide ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Glass Substrates ◽  
Atomic Force ◽  
Cbd Method

Ag 2 S thin films have been deposited onto fluorinated tin oxide (FTO)-coated conducting glass substrates using chemical bath deposition (CBD) method. Photoelectrochemical (PEC) cell, optical properties, surface morphology, structural properties, compositional analysis and electrical properties of Ag 2 S thin films have been investigated. The PEC measurements indicate that the deposited Ag 2 S layers are n-type in electrical conduction. The transmittance of deposited layer is obtained to be about 13–87%. The absorbance of the films is found to decrease with increasing wavelength. The band gap of the Ag 2 S thin film is estimated to be 1.8 eV. It is observed from scanning electron microscopy (SEM) and atomic force microscopy (AFM) measurements that the substrates are well-covered with the deposited Ag 2 S layers without cracks and pinholes. The grain size of Ag 2 S thin films is estimated from SEM measurements to be in the range 100–210 nm. The mean roughness of Ag 2 S films is found from AFM measurements to be in the range 7.20–15 nm. X-ray diffraction shows that the films are well-crystallized and the deposited layers are mainly consisting of Ag 2 S phase with (-103) preferential plane. EDX analysis shows that a nearly stoichiometric composition of Ag 2 S is obtained. The resistivity is estimated to be in the range 3.5–7.0 Ω-cm.

In-Situ AFM Corrosion Study of Ti and Mg Thin Films

2014 ◽  
Author(s):  
Svitlana Fialkova ◽  
Ruben Kotoka ◽  
Sergey Yarmolenko ◽  
Jagannathan Sankar
Keyword(s):  
Thin Films ◽  
Pure Water ◽  
Dc Magnetron Sputtering ◽  
Biodegradable Metal ◽  
Force Microscopy ◽  
Glass Substrates ◽  
Atomic Force ◽  
Phosphate Buffered Saline ◽  
Nm Range

Atomic force microscopy (AFM) is powerful technique to study surface properties and processes in the μm- and nm-range. In-situ liquid AFM measurements were conducted to evaluate the surface degradation of two biocompatible metals: Ti as the most bio-inert (bio-stable) and Mg as the promising biodegradable metal. The pure Mg and Ti thin films were deposited using DC magnetron sputtering on glass substrates. The corrosion resistances of the samples were evaluated in in pure water and phosphate buffered saline (PBS). The results showed exponential decay of film thickness in water.

Atomic force microscopy of in situ deformed nickel thin films

1999 ◽  
Vol 353 (1-2) ◽  
pp. 194-200 ◽  
Author(s):  
C. Coupeau ◽  
J.F. Naud ◽  
F. Cleymand ◽  
P. Goudeau ◽  
J. Grilhé
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Nickel Thin Films ◽  
Atomic Force

In Situ Characterization of the Mechanical Behavior of Gecko's Spatulae by Atomic Force Microscopy

2013 ◽  
Vol 22 ◽  
pp. 85-93
Author(s):  
Shuang Yi Liu ◽  
Min Min Tang ◽  
Ai Kah Soh ◽  
Liang Hong
Keyword(s):  
Mechanical Behavior ◽  
Hierarchical Level ◽  
Intrinsic Properties ◽  
In Situ Characterization ◽  
Force Microscopy ◽  
Atomic Force ◽  
Theoretical Predictions ◽  
Multi Mode

In-situ characterization of the mechanical behavior of geckos spatula has been carried out in detail using multi-mode AFM system. Combining successful application of a novel AFM mode, i.e. Harmonix microscopy, the more detail elastic properties of spatula is brought to light. The results obtained show the variation of the mechanical properties on the hierarchical level of a seta, even for the different locations, pad and stalk of the spatula. A model, which has been validated using the existing experimental data and phenomena as well as theoretical predictions for geckos adhesion, crawling and self-cleaning of spatulae, is proposed in this paper. Through contrast of adhesive and craw ability of the gecko on the surfaces with different surface roughness, and measurement of the surface adhesive behaviors of Teflon, the most effective adhesion of the gecko is more dependent on the intrinsic properties of the surface which is adhered.

In Situ Atomic Force Microscopy Tip-Induced Deformations and Raman Spectroscopy Characterization of Single-Wall Carbon Nanotubes

Nano Letters ◽  
2012 ◽  
Vol 12 (8) ◽  
pp. 4110-4116 ◽  
Author(s):  
P. T. Araujo ◽  
N. M. Barbosa Neto ◽  
H. Chacham ◽  
S. S. Carara ◽  
J. S. Soares ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Single Wall Carbon Nanotubes ◽  
Single Wall Carbon ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals The Physicochemical and Antibacterial Properties of Chitosan-Based Materials Modified with Phenolic Acids Irradiated by UVC Light

2021 ◽  
Vol 22 (12) ◽  
pp. 6472
Author(s):  
Beata Kaczmarek-Szczepańska ◽  
Marcin Wekwejt ◽  
Olha Mazur ◽  
Lidia Zasada ◽  
Anna Pałubicka ◽  
...  
Keyword(s):  
Thin Films ◽  
Antimicrobial Activity ◽  
Ferulic Acid ◽  
Phenolic Acid ◽  
Food Packaging ◽  
Antibacterial Properties ◽  
Force Microscopy ◽  
Atomic Force ◽  
Before And After

This paper concerns the physicochemical properties of chitosan/phenolic acid thin films irradiated by ultraviolet radiation with wavelengths between 200 and 290 nm (UVC) light. We investigated the preparation and characterization of thin films based on chitosan (CTS) with tannic (TA), caffeic (CA) and ferulic acid (FA) addition as potential food-packaging materials. Such materials were then exposed to the UVC light (254 nm) for 1 and 2 h to perform the sterilization process. Different properties of thin films before and after irradiation were determined by various methods such as Fourier transform infrared spectroscopy (FTIR), scanning electron microscopy (SEM), atomic force microscopy (AFM), differential scanning calorimeter (DSC), mechanical properties and by the surface free energy determination. Moreover, the antimicrobial activity of the films and their potential to reduce the risk of contamination was assessed. The results showed that the phenolic acid improving properties of chitosan-based films, short UVC radiation may be used as sterilization method for those films, and also that the addition of ferulic acid obtains effective antimicrobial activity, which have great benefit for food packing applications.

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