Morphological Analysis of Particles in Transmission Electron Microscopy Image Using Image Processing

2013 ◽  
Vol 774-776 ◽  
pp. 1262-1266
Author(s):  
Manop Phankokkruad ◽  
Wacharawichanant Sirirat

The analysis of material particles in the transmission electron microscopy (TEM) image is the most important in the development and synthesis of the new materials for application in many fields. Manual identification is the hard work, spent a lot of time and inaccurate method. To solve this problem, the image processing is proposed for automatically identifies the material particles boundary and size in TEM images in or order to extract the useful data. The image processing method has been experimented on variety of TEM images and very promising results have been achieved given more accuracy. Experimental results show that the proposed method gave the high adaptability, more accurate and rapidly than the manual method.

2013 ◽  
Vol 750-752 ◽  
pp. 2267-2270
Author(s):  
Zhi Min Cui ◽  
Rong Li Sang ◽  
Yuan Liang Li ◽  
Qing Jun Zhang

Multifractal spectrums of sinter with different alkalinity were analyzed by multifractal software. The results show that sinter pore structure change from uniform to non-uniform with the improvement of alkalinity, Δα increases from 0.53 to 0.55. The structure of sinter pore is mainly microscopic by competition between macropores and micropores, Δf changes from 0.14 to-0.44. The distribution of sinter pores is quantitatively characterized by multi-fractal spectrum, which is consistent with transmission electron microscopy image.


Author(s):  
L. F. Fu ◽  
Y. C. Wang ◽  
B. Jiang ◽  
F. Shen ◽  
M. Strauss ◽  
...  

Abstract Recent developments in aberration-corrected transmission electron microscopy have drawn much attention from the semiconductor characterization community. Two new developments in transmission electron microscopy, image aberration correctors and probe aberration correctors, are discussed in term of their applications in characterizing gate oxide dielectrics for the IC industry.


Sign in / Sign up

Export Citation Format

Share Document