Surface Roughness Measurements of a Narrow Borehole — Development of Stylus with Cylindrical Mirror and Lensed Fiber

In various industrial fields, it is frequently necessary to measure surface roughness in confined spaces such as boreholes and grooves. However, using a small stylus, the surface roughness of a narrow borehole can be directly measured only a few millimeters from its end; alternatively, destructive measurements must be performed. This major disadvantage of conventional stylus-based surface profilometers is mainly due to an inductive pick-up that is connected to the stylus used to detect the surface roughness. In this paper, we propose a novel surface roughness measurement sensor. To make the surface roughness sensor small, we used a stylus with a cylindrical mirror and a lensed fiber instead of a conventional inductive pick-up. The proposed sensor converts the signal obtained by measuring the surface roughness of a borehole into an optical signal, which is transferred outside the borehole by an optical fiber. Experimental results demonstrate that this system has a measurement range of 8 μm and a sensitivity of 19 nm. Surface profiles were measured by the proposed sensor and by a conventional surface profiler and the results were found to be very similar.

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Development of a Surface Roughness Measurement System in a Narrow Borehole

International Journal of Automation Technology ◽

10.20965/ijat.2016.p0821 ◽

2016 ◽

Vol 10 (5) ◽

pp. 821-826

Author(s):

Eiki Okuyama ◽

◽

Yuichi Suzuki ◽

Masahiro Morikawa ◽

Yuma Suzuki ◽

...

Keyword(s):

Surface Roughness ◽

Conventional Method ◽

Degrees Of Freedom ◽

Optical Signal ◽

Measurement Range ◽

Standard Test ◽

Roughness Measurement ◽

Surface Roughness Measurement ◽

Test Pieces ◽

Large Measurement

In industrial fields, it is frequently necessary to measure surface roughness in confined spaces such as boreholes and grooves in workpieces. However, the surface roughness of a narrow borehole can be measured only up to a few millimeters from its end when using a small stylus. Alternatively, destructive measurements must be performed. We previously proposed a novel surface roughness measurement sensor. To make the sensor sufficiently small, we used a stylus with a cylindrical mirror and a lensed fiber instead of a conventional inductive pick-up. The proposed sensor converts the signal used for measuring the surface roughness of a borehole into an optical signal, which is transferred outside the borehole by an optical fiber. The experimental results demonstrate that this system has a measurement range of 8 μm and a sensitivity of 19 nm. In this paper, we propose a carriage that supports the stylus when measuring the surface roughness in a small borehole. The proposed carriage has two degrees of freedom: displacement along the borehole axis and rotation around the borehole axis. In experiments, the surface roughness of standard test pieces was measured using the proposed method and the conventional method. The measurement results obtained by these methods were found to be very similar. Furthermore, a borehole with 2.4 mm diameter was measured. The measurement result included the characteristic wave that was obtained by the conventional method in places. The experiments also revealed some problems of the proposed system. For example, the setting procedure of the measured surface in the 8 μm measurement range was difficult. Consequently, a large measurement range or a null method is required.

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Determination of Hurst exponent by optical signal processing applied on surface roughness measurements

10.1117/12.845799 ◽

2009 ◽

Author(s):

José Antonio Marbán Salgado ◽

Oscar Sarmiento Martínez ◽

Darwin Mayorga Cruz ◽

Jorge Uruchurtu Chavarín

Keyword(s):

Surface Roughness ◽

Signal Processing ◽

Hurst Exponent ◽

Optical Signal Processing ◽

Optical Signal ◽

Roughness Measurements

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A Novel Measurement Standard for Surface Roughness on Involute Gears

Applied Sciences ◽

10.3390/app112110303 ◽

2021 ◽

Vol 11 (21) ◽

pp. 10303

Author(s):

Felix Steinmeyer ◽

Dorothee Hüser ◽

Rudolf Meeß ◽

Martin Stein

Keyword(s):

Surface Roughness ◽

Physical Measurement ◽

Roughness Measurement ◽

Measurement Standard ◽

Coordinate Measurement ◽

Measurement Systems ◽

Planar Surfaces ◽

Involute Gears ◽

Material Measure ◽

Roughness Measurements

Although manufacturers of coordinate measurement systems and gear measurement systems already provide instruments that enable an end-of-line-monitoring of the roughness properties of gears, the roughness measurement on gear flanks still lacks traceability with respect to the standardised SI-units. There is still a gap between well standardised roughness measurements on planar surfaces and gear measurements on involutes. This gap is bridged by a novel physical measurement standard (PMS), also referred to as material measure, for roughness measurements on involute gears that has been developed at the Physikalisch-Technische Bundesanstalt (PTB). The necessary transformations between the systems of roughness and gear measurements have been implemented. The measurement standard itself represents calibrated roughness values for the parameters Ra, Rz, Rq, Rk, Rpk and Rvk and Mr1 and Mr2. Furthermore, the PMS can be measured both with classic profilometers as well as gear measurement systems with integrated roughness probes.

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Polymer-Based Capacity Micromachined Ultrasonic Transducer for Surface Roughness Measurement

Key Engineering Materials ◽

10.4028/www.scientific.net/kem.661.22 ◽

2015 ◽

Vol 661 ◽

pp. 22-28 ◽

Cited By ~ 3

Author(s):

Gia Thinh Bui ◽

Yi Ze Chen ◽

Da-Chen Pang

Keyword(s):

Surface Roughness ◽

Ultrasonic Transducer ◽

Roughness Measurement ◽

Surface Roughness Measurement ◽

Measure Surface Roughness ◽

Capacitive Micromachined Ultrasonic Transducer ◽

Signal Output ◽

Good Signal ◽

Reception Mode ◽

Maximum Signal

A polymer-based capacitive micromachined ultrasonic transducer (CMUT) is developed to measure surface roughness. The transducer is designed with two groups in a ratio of two to one. By using air-coupled ultrasound, the transducer can evaluate surface roughness in five modes: full transmission/ full reception, majority transmission/ majority reception, majority transmission/ minority reception, minority transmission/ majority reception, and minority transmission/ minority reception. Experimentation shows the CMUT can identify the surface roughness using a sample of sandpaper with surface roughness Rrms ranging from 11.4μm to 179.8μm. The results indicate that the full transmission/ full reception mode has maximum signal output and the minority transmission/ majority reception mode can obtain a good signal output with a better energy efficiency rating.

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How levelling and scan line corrections ruin roughness measurement and how to prevent it

Scientific Reports ◽

10.1038/s41598-020-72171-8 ◽

2020 ◽

Vol 10 (1) ◽

Author(s):

David Nečas ◽

Miroslav Valtr ◽

Petr Klapetek

Keyword(s):

Thin Films ◽

Surface Roughness ◽

Material Science ◽

Mean Square ◽

Roughness Measurement ◽

Force Microscopy ◽

Atomic Force ◽

Scan Line ◽

Scale Roughness ◽

Roughness Measurements

Abstract Surface roughness plays an important role in various fields of nanoscience and nanotechnology. However, the present practices in roughness measurements, typically based on some Atomic Force Microscopy measurements for nanometric roughness or optical or mechanical profilometry for larger scale roughness significantly bias the results. Such biased values are present in nearly all the papers dealing with surface parameters, in the areas of nanotechnology, thin films or material science. Surface roughness, most typically root mean square value of irregularities Sq is often used parameter that is used to control the technologies or to link the surface properties with other material functionality. The error in estimated values depends on the ratio between scan size and roughness correlation length and on the way how the data are processed and can easily be larger than 10% without us noting anything suspicious. Here we present a survey of how large is the problem, detailed analysis of its nature and suggest methods to predict the error in roughness measurements and possibly to correct them. We also present a guidance for choosing suitable scan area during the measurement.

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Roughness Measurements with Polychromatic Speckles on Tilted Surfaces

Nanomanufacturing and Metrology ◽

10.1007/s41871-020-00093-0 ◽

2021 ◽

Author(s):

Johannes Stempin ◽

Andreas Tausendfreund ◽

Dirk Stöbener ◽

Andreas Fischer

Keyword(s):

Surface Roughness ◽

Experimental Investigations ◽

Sensor Surface ◽

Roughness Measurement ◽

Surface Alignment ◽

Evaluation Approach ◽

Speckle Patterns ◽

Speed Up ◽

Scattering Centre ◽

Roughness Measurements

AbstractSurface light scattering enables contactless and fast measurements of surface roughness. A surface inclination alters the direction of the scattering beam and thus the measured surface roughness is calculated from the detected intensity distribution. Hence, an accurate sensor–surface alignment is necessary. In order to achieve tilt-independent roughness measurements, a model-based evaluation approach for polychromatic speckle patterns is presented. By evaluating the shape of the superposed speckles, which occur for polychromatic illumination, with regard to the distance to the scattering centre, surfaces with an Sa roughness value in the range of 0.8–3.2 μm are measurable. Experimental investigations demonstrate that the influence of a surface tilt up to ± 1.25° on the roughness measurement is reduced by 90%. As a result, the robustness of the polychromatic speckle roughness measurement is improved, which allows to speed up the adjustment of the measurement system or the surface sample, respectively.

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Surface roughness measurements of vanadium-contaminated fluidized cracking catalysts by atomic force microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100166798 ◽

1996 ◽

Vol 54 ◽

pp. 866-867

Author(s):

H. Kinney ◽

M.L. Occelli ◽

S.A.C. Gould

Keyword(s):

Surface Roughness ◽

Zeolite Y ◽

Atomic Level ◽

Microporous Structure ◽

Contact Mode ◽

Force Microscopy ◽

Atomic Force ◽

Before And After ◽

Roughness Measurements ◽

Cracking Catalysts

For this study we have used a contact mode atomic force microscope (AFM) to study to topography of fluidized cracking catalysts (FCC), before and after contamination with 5% vanadium. We selected the AFM because of its ability to well characterize the surface roughness of materials down to the atomic level. It is believed that the cracking in the FCCs occurs mainly on the catalysts top 10-15 μm suggesting that the surface corrugation could play a key role in the FCCs microactivity properties. To test this hypothesis, we chose vanadium as a contaminate because this metal is capable of irreversibly destroying the FCC crystallinity as well as it microporous structure. In addition, we wanted to examine the extent to which steaming affects the vanadium contaminated FCC. Using the AFM, we measured the surface roughness of FCCs, before and after contamination and after steaming.We obtained our FCC (GRZ-1) from Davison. The FCC is generated so that it contains and estimated 35% rare earth exchaged zeolite Y, 50% kaolin and 15% binder.

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