Three-Dimensional Characterization of Morphology and Crystallography of a Gold Nanoisland Film

2021 ◽  
Vol 1016 ◽  
pp. 1778-1783
Author(s):  
Wan Guan Zhu ◽  
Gui Lin Wu ◽  
Tian Lin Huang ◽  
Soeren Schmidt ◽  
Ling Zhang ◽  
...  
Keyword(s):  
Grain Boundaries ◽  
Three Dimensional ◽  
Mapping Technique ◽  
Transmission Electron ◽  
Orientation Mapping ◽  
Crystallographic Characteristics ◽  
3D Shapes ◽  
Nanoisland Film ◽  
Crystallographic Orientations

The morphological and crystallographic characteristics of noble metal nanoisland films play an important role in determining their properties, performance, and reliability. In this work we have applied a rapid three-dimensional orientation mapping technique in the transmission electron microscope (3D-OMiTEM) in the characterization of a gold nanoisland film. A volume of 200×1024×1024 nm3 has been analyzed, generating a 3D orientation map composed of more than 500 nanoislands and 7000 grains constituting the islands. The 3D shapes and sizes of individual islands and grains have been analyzed, revealing their true 3D morphological features and the correlation between the number of grains within individual islands and the size of the islands. The crystallographic orientations of the grains and the misorientations across the grain boundaries have been quantified, revealing a weak texture but a preferential presence of Σ3 and Σ9 grain boundaries in the gold nanoisland film.

convergent-beam diffraction from surfaces

1987 ◽  
Vol 45 ◽  
pp. 30-33
Author(s):  
J. A. Eades ◽  
A. E. Smith ◽  
D. F. Lynch
Keyword(s):  
Reciprocal Lattice ◽  
Three Dimensional ◽  
Grazing Incidence ◽  
Three Dimensions ◽  
Plane Figure ◽  
Transmission Electron ◽  
Convergent Beam ◽  
Beam Patterns ◽  
Beam Diffraction

It is quite simple (in the transmission electron microscope) to obtain convergent-beam patterns from the surface of a bulk crystal. The beam is focussed onto the surface at near grazing incidence (figure 1) and if the surface is flat the appropriate pattern is obtained in the diffraction plane (figure 2). Such patterns are potentially valuable for the characterization of surfaces just as normal convergent-beam patterns are valuable for the characterization of crystals.There are, however, several important ways in which reflection diffraction from surfaces differs from the more familiar electron diffraction in transmission.GeometryIn reflection diffraction, because of the surface, it is not possible to describe the specimen as periodic in three dimensions, nor is it possible to associate diffraction with a conventional three-dimensional reciprocal lattice.

scholarly journals A Tool for Local Thickness Determination and Grain Boundary Characterization by CTEM and HRTEM Techniques

2015 ◽  
Vol 21 (2) ◽  
pp. 422-435 ◽  
Author(s):  
Ákos K. Kiss ◽  
Edgar F. Rauch ◽  
Béla Pécz ◽  
János Szívós ◽  
János L. Lábár
Keyword(s):  
Grain Boundaries ◽  
Software Tool ◽  
Hexagonal Crystal ◽  
Electron Microscopic ◽  
Orientation Data ◽  
New Approach ◽  
Polycrystalline Thin Films ◽  
Transmission Electron ◽  
Transmission Electron Microscopic

AbstractA new approach for measurement of local thickness and characterization of grain boundaries is presented. The method is embodied in a software tool that helps to find and set sample orientations useful for high-resolution transmission electron microscopic (HRTEM) examination of grain boundaries in polycrystalline thin films. The novelty is thesimultaneoustreatment of the two neighboring grains and orienting both grains and the boundary planesimultaneously. The same metric matrix-based formalism is used for all crystal systems. Input into the software tool includes orientation data for the grains in question, which is determined automatically for a large number of grains by the commercial ASTAR program. Grain boundaries suitable for HRTEM examination are automatically identified by our software tool. Individual boundaries are selected manually for detailed HRTEM examination from the automatically identified set. Goniometer settings needed to observe the selected boundary in HRTEM are advised by the software. Operation is demonstrated on examples from cubic and hexagonal crystal systems.

On the Role of Characterization in the Design of Interfaces in Nanoscale Materials Technology

2004 ◽  
Vol 10 (3) ◽  
pp. 324-335 ◽  
Author(s):  
S.P. Ringer ◽  
K.R. Ratinac
Keyword(s):  
Three Dimensional ◽  
Atom Probe ◽  
Turbine Rotor ◽  
Clay Nanocomposites ◽  
Multimodal Approach ◽  
Transmission Electron ◽  
Different Types ◽  
And Control

This work reviews recent research on the design and control of interfaces in engineering nanomaterials. Four case studies are presented that demonstrate the power of a multimodal approach to the characterization of different types of interfaces. We have used a combination of conventional, high resolution, and analytical transmission electron microscopy, microbeam electron diffraction, and three-dimensional atom probe to study polymer–clay nanocomposites, turbine rotor steels used for power generation, multicomponent aluminum alloys, and nanocrystalline magnetic materials.

scholarly journals Three-dimensional Characterization of Precipitates at Grain Boundaries of N-added Austenitic Steel

Materia Japan ◽  
2018 ◽  
Vol 57 (12) ◽  
pp. 618-618
Author(s):  
M. Ochi ◽  
K. Sato ◽  
R. Teranishi ◽  
Y. Sato ◽  
K. Kaneko ◽  
...  
Keyword(s):  
Grain Boundaries ◽  
Austenitic Steel ◽  
Three Dimensional

Characterization Of APB's In GaP

1996 ◽  
Vol 442 ◽  
Author(s):  
Dov Cohen ◽  
C. Barry Carter
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
Convergent Beam Electron Diffraction ◽  
Antiphase Boundaries ◽  
Beam Electron ◽  
Transmission Electron ◽  
Convergent Beam ◽  
Crystallographic Orientations

AbstractAntiphase boundaries in GaP crystals epitactically grown on Si (001) have been characterized using transmission electron microscopy. Convergent-beam electron diffraction was used to identify the antiphase-related grains. The antiphase boundaries were observed to adopt facets parallel to specific crystallographic orientations. Furthermore, stacking-fault-like contrast was observed along the interface suggesting that the domains may be offset from one another by a rigid-body lattice translation.

Characterization of ultrathin Ge epilayers on (100) Si

1991 ◽  
Vol 69 (3-4) ◽  
pp. 246-254 ◽  
Author(s):  
J. -M. Baribeau ◽  
D. J. Lockwood ◽  
T. E. Jackman ◽  
P. Aebi ◽  
T. Tyliszczak ◽  
...  
Keyword(s):  
Strain Relaxation ◽  
Three Dimensional ◽  
Raman Scattering Spectroscopy ◽  
X Ray ◽  
Transmission Electron ◽  
Short Period ◽  
Short Period Superlattices ◽  
Direct Band ◽  
X Ray Absorption

The understanding of the epitaxy of pure Ge layers on Si is an important step towards the synthesis of SimGen (m, n < 10 monolayers) short-period superlattices. The possibility of a direct band-gap character makes these structures extremely attractive. We have grown thin buried Gen ([Formula: see text] monolayers) films on (100) Si by molecular beam epitaxy and studied their structural properties by a variety of techniques including Raman scattering spectroscopy, glancing incidence X-ray reflection, Rutherford backscattering, transmission electron microscopy, and extended X-ray absorption fine structure analysis. All these techniques allowed detection of the thin Ge layers and provided information about the thickness, morphology, strain distribution, and interface sharpness of these heterostructures. The Ge„ films with [Formula: see text] had a two-dimensional nature and showed no sign of strain relaxation. Intermixing at the Si–Ge interfaces was present in all these films and estimated to be not more than two monolayers. This smearing at the interfaces may have contributed to the maintenance of that pseudomorphicity. A thicker Ge layer (n = 12) showed evidence of strain relaxation and clustering in three-dimensional islands.

Characterization of Grain Boundaries in Electronic Ceramics by Transmission Electron Microscopy

1981 ◽  
Vol 5 ◽  
Author(s):  
David R. Clarke
Keyword(s):  
Electron Microscopy ◽  
Boundary Layer ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Grain Boundaries ◽  
Electronic Ceramics ◽  
Transmission Electron ◽  
Zno Varistors ◽  
Microscopy Techniques

ABSTRACTThe principal high resolution transmission electron microscopy techniques used in characterizing grain boundaries in electronic ceramics are described, including those recently developed for detecting the presence of extremely thin (∼10Å) intergranular phases. The capabilities of the techniques are illustrated with examples drawn from studies of ZnO varistors, PTC BaTiO3 devices and boundary layer capacitors.

scholarly journals Atom Scale Characterization of the Near Apex Region of an Atomic Force Microscope Tip

2010 ◽  
Vol 16 (5) ◽  
pp. 636-642 ◽  
Author(s):  
Christopher J. Tourek ◽  
Sriram Sundararajan
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Atom Probe ◽  
Material Structure ◽  
Atomic Force ◽  
Transmission Electron ◽  
Afm Tips ◽  
Scale Characterization

AbstractThree-dimensional atom probe tomography (APT) is successfully used to analyze the near-apex regions of an atomic force microscope (AFM) tip. Atom scale material structure and chemistry from APT analysis for standard silicon AFM tips and silicon AFM tips coated with a thin film of Cu is presented. Comparison of the thin film data with that observed using transmission electron microscopy indicates that APT can be reliably used to investigate the material structure and chemistry of the apex of an AFM tip at near atomic scales.

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