Generation of Ultrahigh Pressure and Application of Ultrahigh Pressure to Formation of Diamond from Graphite Powder

2011 ◽  
Vol 673 ◽  
pp. 275-278 ◽  
Author(s):  
Akio Kira ◽  
Yoshiaki Tsutsumi ◽  
Akio Tasaka ◽  
Ryuichi Tomoshige ◽  
Kazuyuki Hokamoto ◽  
...  
Keyword(s):  
Graphite Powder ◽  
Powdered Material ◽  
Scanning Transmission Electron Microscope ◽  
Ultrahigh Pressure ◽  
X Ray Diffraction ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Metal Jet ◽  
Impulsive Pressure ◽  
Pressure Phase

The purpose of our research is to generate the ultrahigh pressure by using high explosive and to transform a phase of a material. The extremely high impulsive pressure generator that has been developed by us uses the head-on collision between metal jets. Because the velocity of the metal jet is very high, the ultrahigh pressure will generate. If a powdered material is mixed to metal jets, it is expected that the material is transformed to a high pressure phase by this ultrahigh pressure. A graphite powder was used to synthesize a diamond. The existence of the diamond was confirmed by X-ray diffraction (XRD). In this paper, the mechanism of the generation of the ultrahigh pressure is explained and the results of the observation of the powder by using scanning transmission electron microscope (STEM) are reported.

Phase Transformation of Powdered Material by Using Metal Jet

2012 ◽  
Vol 706-709 ◽  
pp. 741-744 ◽  
Author(s):  
Akio Kira ◽  
Ryuichi Tomoshige ◽  
Kazuyuki Hokamoto ◽  
Masahiro Fujita
Keyword(s):  
Phase Transformation ◽  
Powdered Material ◽  
Scanning Transmission Electron Microscope ◽  
Ultrahigh Pressure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Metal Jet ◽  
Very High

The various techniques of phase transformation of the material have been proposed by many researchers. We have developed several devices to generate the ultrahigh pressure by using high explosive. One of them uses metal jets. It is expected that the ultrahigh pressure occurs by the head-on collision between metal jets, because the velocity of the metal jet is very high. By mixing a powdered material with metal jets, the pressure of the material becomes high. The purpose of this study is to transform the phase of the powdered material by using this high pressure. The powders of the graphite and hBN were applied. The synthesis to the diamond and cBN was confirmed by X-ray diffraction (XRD). In this paper, the mechanism of the generation of the ultrahigh pressure is explained and the results of the observation of the powder by using scanning transmission electron microscope (STEM) are reported.

Analytical Microscopic Analysis of Precipitates in Hastelloy Alloy C-276

1981 ◽  
Vol 39 ◽  
pp. 280-281
Author(s):  
M. Raghavan ◽  
B. J. Berkowitz ◽  
J. C. Scanlon
Keyword(s):  
Microscopic Analysis ◽  
Scanning Transmission Electron Microscope ◽  
Second Phase ◽  
Precipitation Reaction ◽  
X Ray Diffraction ◽  
Corrosion Properties ◽  
X Ray ◽  
Transmission Electron ◽  
Second Phase Particles ◽  
Scanning Transmission

The present investigation was conducted to characterize the second phase particles in Hastelloy C-276 using an analytical Scanning Transmission Electron Microscope in order to understand their effect on the mechanical and Stress Corrosion properties of the alloy. Investigation in our 1aboratoryO) and previous published reports(2-4) have identified two types of precipitation reactions in this alloy. At temperatures in the range of 300-650°C, the alloy precipitates an ordered phase of the type Ni2(Cr, Mo)(1,2). This precipitation reaction is homogeneous with no preferential precipitation at the grain boundaries or twin boundaries. At temperatures above 650°C, several precipitate phases were observed to nucleate heterogeneously at boundaries and using X-ray diffraction techniques, the precipitates were previously identified as the μ, M6C and P phases(3-4). The present investigation was carried out to determine the composition of these second phase particles and this article describes the characterization of these precipitates using X-ray microanalysis and microdiffraction techniques.

Electrochemical Formation of Elemental Boron in LiCl–KCl–KBF4 at 723 K

2021 ◽  
Author(s):  
Yumi Katasho ◽  
Tetsuo Oishi
Keyword(s):  
Photoelectron Spectroscopy ◽  
Scanning Transmission Electron Microscope ◽  
X Ray Diffraction ◽  
Recycling Process ◽  
Reduction Behavior ◽  
X Ray ◽  
Selected Area Electron Diffraction ◽  
Elemental Boron ◽  
Transmission Electron ◽  
Scanning Transmission

Abstract The electrochemical reduction behavior of B(III) ions was investigated in LiCl–KCl–KBF4 at 723 K. The results of cyclic voltammetry using Mo, Ag, and Ni electrodes suggested the reduction of B(III) to B(0) at potentials of 1.5 V or at a more negative potential (vs. Li+/Li). Spherical electrodeposits were observed after potentiostatic electrolysis at 1.1–1.5 V. From the results of X-ray photoelectron spectroscopy, scanning transmission electron microscope/energy-dispersive X-ray spectroscopy (STEM/EDX), and selected area electron diffraction, it was concluded that the spherical electrodeposits obtained at 1.1 V were elemental amorphous boron. The purity of the products was 85 wt% boron, as determined by STEM/EDX analysis. The current efficiency of elemental B electrodeposition was 96.2% in this system. The formation of Ni2B at 1.1–1.9 V was indicated by X-ray diffraction, although it was not the main product. These results indicate that the presence of B(III) ions in a melt causes a fatal adverse effect on the recycling process of Nd–Fe–B magnets due to the reduction of B(III) ions. Further, the possibility of reducing the energy and cost of the elemental boron production process was discussed.

The High Resolution Scanning Transmission Electron Microscope

1974 ◽  
Vol 32 ◽  
pp. 316-317
Author(s):  
A. V. Crewe
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
High Vacuum ◽  
Scanning Transmission Electron Microscope ◽  
Ultra High Vacuum ◽  
Resolving Power ◽  
Imaging Characteristics ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
The Moment

The high resolution STEM is now a fact of life. I think that we have, in the last few years, demonstrated that this instrument is capable of the same resolving power as a CEM but is sufficiently different in its imaging characteristics to offer some real advantages.It seems possible to prove in a quite general way that only a field emission source can give adequate intensity for the highest resolution^ and at the moment this means operating at ultra high vacuum levels. Our experience, however, is that neither the source nor the vacuum are difficult to manage and indeed are simpler than many other systems and substantially trouble-free.

Resolution Attainable With the Present Day STEM

1973 ◽  
Vol 31 ◽  
pp. 230-231 ◽  
Author(s):  
J. S. Wall ◽  
J. P. Langmore ◽  
H. Isaacson ◽  
A. V. Crewe
Keyword(s):  
Spherical Aberration ◽  
Focal Length ◽  
Incident Beam ◽  
Scanning Transmission Electron Microscope ◽  
Aperture Size ◽  
Magnetic Lens ◽  
Peak Intensity ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Half Angle

The scanning transmission electron microscope (STEM) constructed by the authors employs a field emission gun and a 1.15 mm focal length magnetic lens to produce a probe on the specimen. The aperture size is chosen to allow one wavelength of spherical aberration at the edge of the objective aperture. Under these conditions the profile of the focused spot is expected to be similar to an Airy intensity distribution with the first zero at the same point but with a peak intensity 80 per cent of that which would be obtained If the lens had no aberration. This condition is attained when the half angle that the incident beam subtends at the specimen, 𝛂 = (4𝛌/Cs)¼

Enhancement of Contrast in the CEM and STEM Using Bumpy Specimens and Employing the “Dappled Field” Mode of Operation

1974 ◽  
Vol 32 ◽  
pp. 552-553 ◽  
Author(s):  
L. Gandolfi ◽  
J. Reiffel
Keyword(s):  
Operating Mode ◽  
Scanning Transmission Electron Microscope ◽  
Dark Field ◽  
Specimen Preparation ◽  
Field Mode ◽  
Preparation Methods ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Mode Of Operation ◽  
Scanning Transmission

Calculations have been performed on the contrast obtainable, using the Scanning Transmission Electron Microscope, in the observation of thick specimens. Recent research indicates a revival of an earlier interest in the observation of thin specimens with the view of comparing the attainable contrast using both types of specimens.Potential for biological applications of scanning transmission electron microscopy has led to a proliferation of the literature concerning specimen preparation methods and the controversy over “to stain or not to stain” in combination with the use of the dark field operating mode and the same choice of technique using bright field mode of operation has not yet been resolved.

Development of 200 kV Scanning-Transmission Electron Microscope

1974 ◽  
Vol 32 ◽  
pp. 410-411
Author(s):  
H. Koike ◽  
S. Sakurai ◽  
K. Ueno ◽  
M. Watanabe
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Scanning Transmission Electron Microscope ◽  
The Other ◽  
Morphological Observation ◽  
Magnetic Domains ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Backscattered Electron ◽  
Increasing Demand

In recent years, there has been increasing demand for higher voltage SEMs, in the field of surface observation, especially that of magnetic domains, dislocations, and electron channeling patterns by backscattered electron microscopy. On the other hand, the resolution of the CTEM has now reached 1 ∼ 2Å, and several reports have recently been made on the observation of atom images, indicating that the ultimate goal of morphological observation has beem nearly achieved.

A Magnetic Spectrometer for a Scanning Transmission Electron Microscope

1974 ◽  
Vol 32 ◽  
pp. 436-437
Author(s):  
A. Kosiara ◽  
J. W. Wiggins ◽  
M. Beer
Keyword(s):  
Scanning Transmission Electron Microscope ◽  
Magnetic Spectrometer ◽  
Fringe Field ◽  
Curvature Radius ◽  
Magnetic Pole ◽  
Quadrupole Field ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Under Construction ◽  
Image Position

A magnetic spectrometer to be attached to the Johns Hopkins S. T. E. M. is under construction. Its main purpose will be to investigate electron interactions with biological molecules in the energy range of 40 KeV to 100 KeV. The spectrometer is of the type described by Kerwin and by Crewe Its magnetic pole boundary is given by the equationwhere R is the electron curvature radius. In our case, R = 15 cm. The electron beam will be deflected by an angle of 90°. The distance between the electron source and the pole boundary will be 30 cm. A linear fringe field will be generated by a quadrupole field arrangement. This is accomplished by a grounded mirror plate and a 45° taper of the magnetic pole.

To What Extent are Inelastically Scattered Electrons Useful in the Stem?

1973 ◽  
Vol 31 ◽  
pp. 286-287 ◽  
Author(s):  
H. Rose
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Electron Correlation ◽  
Quantum Noise ◽  
Collection Efficiency ◽  
Scanning Transmission Electron Microscope ◽  
Electron Cloud ◽  
Scanning Time ◽  
Transmission Electron ◽  
Scanning Transmission

The scanning transmission electron microscope offers the possibility of utilizing inelastically scattered electrons. Use of these electrons in addition to the elastically scattered electrons should reduce the scanning time (dose) Which is necessary to keep the quantum noise below a certain level. Hence it should lower the radiation damage. For high resolution, Where the collection efficiency of elastically scattered electrons is small, the use of Inelastically scattered electrons should become more and more favorable because they can all be detected by means of a spectrometer. Unfortunately, the Inelastic scattering Is a non-localized interaction due to the electron-electron correlation, occurring predominantly at the circumference of the atomic electron cloud.

Description of a New High Resolution Scanning Transmission EM

1972 ◽  
Vol 30 ◽  
pp. 418-419
Author(s):  
Michael Beer ◽  
J. W. Wiggins ◽  
David Woodruff ◽  
Jon Zubin
Keyword(s):  
High Resolution ◽  
Field Emission ◽  
Energy Dispersive Spectrometer ◽  
Scanning Transmission Electron Microscope ◽  
Objective Lens ◽  
Condenser Lens ◽  
Transmission Electron ◽  
Pattern Size ◽  
Scanning Transmission ◽  
Under Construction

A high resolution scanning transmission electron microscope of the type developed by A. V. Crewe is under construction in this laboratory. The basic design is completed and construction is under way with completion expected by the end of this year.The optical column of the microscope will consist of a field emission electron source, an accelerating lens, condenser lens, objective lens, diffraction lens, an energy dispersive spectrometer, and three electron detectors. For any accelerating voltage the condenser lens function to provide a parallel beam at the entrance of the objective lens. The diffraction lens is weak and its current will be controlled by the objective lens current to give an electron diffraction pattern size which is independent of small changes in the objective lens current made to achieve focus at the specimen. The objective lens demagnifies the image of the field emission source so that its Gaussian size is small compared to the aberration limit.

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