Fabrication and Characterization for Innate Super-Hydrophilic SiO2 Thin Films

2013 ◽  
Vol 743-744 ◽  
pp. 377-381
Author(s):  
Kai Bo Shen ◽  
Huan Yang ◽  
Jian Liu ◽  
Wei Wang ◽  
Yue Huang ◽  
...  
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
Acid Base ◽  
Coating Films ◽  
Hydroxyl Content ◽  
Force Microscopy ◽  
Atomic Force ◽  
Inorganic Thin Films ◽  
Ft Ir ◽  
Fabrication And Characterization

Distinguished with photoinduced super-hydrophilic inorganic thin films, non-photoinduced innate super-hydrophilic SiO2 thin films were successfully fabricated in this work. The SiO2 sol was prepared by acid-base two-step sol-gel method. The mix solution containing SiO2 sol and polyethylene glycol (PEG) was coated on glass substrate and then went through thermal treatment to obtain innate super-hydrophilic SiO2 thin films. The films were characterized by atomic force microscopy (AFM), scanning electron microscopy (SEM), Fourier transform infrared spectroscopy (FT-IR) and contact angle meter. The results show that the surface concave-convex microstructure and the hydroxyl content are the factors that endow the SiO2 coating films with innate super-hydrophilic property.

Dielectric Properties of Sol-Gel Derived MgAl2O4 Thin Films

2012 ◽  
Vol 151 ◽  
pp. 314-318
Author(s):  
Ching Fang Tseng ◽  
Cheng Hsing Hsu ◽  
Chun Hung Lai
Keyword(s):  
Thin Films ◽  
Annealing Temperature ◽  
Sol Gel ◽  
Dissipation Factor ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Preheating Temperature ◽  
Surface Morphologies

This paper describes microstructure characteristics of MgAl2O4 thin films were deposited by sol-gel method with various preheating temperatures and annealing temperatures. Particular attention will be paid to the effects of a thermal treatment in air ambient on the physical properties. The annealed films were characterized using X-ray diffraction. The surface morphologies of treatment film were examined by scanning electron microscopy and atomic force microscopy. At a preheating temperature of 300oC and an annealing temperature of 700oC, the MgAl2O4 films with 9 μm thickness possess a dielectric constant of 9 at 1 kHz and a dissipation factor of 0.18 at 1 kHz.

MAGNETIC PROPERTIES OF Co-FERRITE AND SiO2-DOPED Co-FERRITE THIN FILMS AND POWDERS BY SOL–GEL

2004 ◽  
Vol 03 (04n05) ◽  
pp. 463-470
Author(s):  
Y. C. WANG ◽  
J. DING ◽  
B. H. LIU ◽  
Y. SHI
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Sol Gel ◽  
Vibrating Sample Magnetometer ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Structural And Magnetic Properties ◽  
Ferrite Thin Films ◽  
Scanning Electron

Thin films and powders of Co -ferrite and SiO 2-doped Co -ferrite were fabricated via the sol–gel method. The structural and magnetic properties of the films and powders were investigated with X-Ray Diffractometer (XRD), Vibrating Sample Magnetometer (VSM), Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM). VSM measurements showed an enhancement of coercivity by SiO 2-doping for Co -ferrite powders and thin films (coercivity of 3.5 kOe in SiO 2-doped thin films). XRD and SEM investigations revealed a nanostructure of the thin films. Low surface roughness was observed in our AFM study.

scholarly journals Preparation of (Pb,Ba)TiO3 powders and highly oriented thin films by a sol-gel process

2004 ◽  
Vol 19 (5) ◽  
pp. 1492-1498 ◽  
Author(s):  
Stacey W. Boland ◽  
Suresh C. Pillai ◽  
Wein-Duo Yang ◽  
Sossina M. Haile
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
Chelating Agent ◽  
Titanium Isopropoxide ◽  
X Ray Diffraction ◽  
Scanning Calorimetry ◽  
Force Microscopy ◽  
Molar Ratios ◽  
Atomic Force ◽  
Sol Gel Process

Solid solution Pb1-xBaxTiO3, with particular emphasis on Pb0.5Ba0.5TiO3, was prepared using a sol-gel process incorporating lead acetate trihydrate, barium acetate, and titanium isopropoxide as precursors, acetylacetone (2,4 pentanedione) as a chelating agent, and ethylene glycol as a solvent. The synthesis procedure was optimized by systematically varying acetylacetone: Ti and H2O:Ti molar ratios and calcination temperature. The resulting effects on sol and powder properties were studied using thermogravimetric analysis/differential scanning calorimetry, Fourier transform infrared spectroscopy, Brunauer-Emmett-Teller analysis, and x-ray diffraction (XRD). Crystallization of the perovskite structure occurred at a temperature as low as 450 °C. Thin films were prepared by spin coating on (100) MgO. Pyrolysis temperature and heating rate were varied, and the resultant film properties investigated using field-emission scanning electron microscopy, atomic force microscopy, and XRD. Under optimized conditions, highly oriented films were obtained at a crystallization temperature of 600 °C.

scholarly journals Synthesis and characterization of polyimide thin films obtained by thermal evaporation and solid state reaction

2016 ◽  
Vol 34 (1) ◽  
pp. 132-136 ◽  
Author(s):  
Ikram Atta Al-Ajaj ◽  
Aseel A. Kareem
Keyword(s):  
Thin Films ◽  
Solid State ◽  
Solid State Reaction ◽  
Physical Vapor Deposition ◽  
Amic Acid ◽  
Surface Topology ◽  
Polyimide Films ◽  
Force Microscopy ◽  
Atomic Force ◽  
Ft Ir

AbstractIn this research polyimide films were prepared by physical vapor deposition (PVD), using solid state reaction of pyromellitic dianhydride (PMDA) and p-phenylene diamine (PDA) to form poly(amic acid) (PAA) films. The resultant films were converted to polyimide by thermal treatment, usually below 300 °C. For this study, a FT-IR spectrometer has been used to measure the effect of imidization temperature on the chemical structure of the vapor-deposited thin films of aromatic PI. When temperature increased, an increase in all absorption peaks was observed. This suggests that residual PAA monomers continued to be converted into PI. The surface topology of the PI films obtained at imidization temperatures of 150, 200, 250 °C for 1 hour was further examined by using AFM atomic force microscopy. It can be clearly seen that the surface became rougher with increasing imidization temperature. The thermal stability of polyimide was also studied by using thermogravimetric analysis (TGA).

Physical Characterization of BST with Different (x’) Ratios

2014 ◽  
Vol 487 ◽  
pp. 106-109
Author(s):  
Nurhafizah Ramli ◽  
Zaliman Sauli ◽  
Vithyacharan Retnasamy ◽  
They Yee Chin ◽  
K. Anwar ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Roughness ◽  
Strontium Titanate ◽  
Barium Strontium Titanate ◽  
Sol Gel ◽  
Force Microscopy ◽  
Atomic Force ◽  
Fields Of Study ◽  
Barium Strontium

Nowdays Barium strontium titanate (BST) can be applied into many fields of engineering. Its properties attracted more researchers to research and apply it into many fields of study. In this work, sol-gel method of preparing barium strontium titanate (BST) has been used. This work was done with 4 different ratio of x with 4 different deposition layers. The main purpose of this work is to investigate the relation between the ratio of barium (Ba) with different deposition layer and the surface of the substrate. Atomic force microscopy (AFM) was used in whole work to investigate the crystalline structure and surface roughness of the BST thin films.

Surface Morphological Study of Lead Titanate Thin Films Prepared on ITO Glass Substrate

2015 ◽  
Vol 1109 ◽  
pp. 466-470 ◽  
Author(s):  
Nurbaya Zainal ◽  
Mohamad Rusop
Keyword(s):  
Thin Films ◽  
Surface Morphology ◽  
Glass Substrate ◽  
Lead Titanate ◽  
Sol Gel ◽  
Electrical Characterization ◽  
Force Microscopy ◽  
Atomic Force ◽  
Ito Glass ◽  
Coating Method

The most important thing in preparing thin films ceramic material such lead titanate, PbTiO3 is the behavioral of microstructural changes due to the applying heat treatment during crystallization process. In general, the imperfection of PbTiO3 surface morphology such as porosity, grain boundaries, existence of microcrack films, films out-diffusion and others are caused by this factor, heat transfer element and found very interesting to be discussed towards next electrical characterization. However, the present study only focuses on the surface morphology of PbTiO3 thin films that observed by both field emissions scanning electron microscopy (FESEM) and atomic force microscopy (AFM). The details of measurement for observation will be explained later. The preparation of PbTiO3 thin films were done trough simple sol-gel spin coating method deposited on ITO coated glass substrate.

Phase separation in SiO2–TiO2 gel and glassy films studied by atomic force microscopy and transmission electron microscopy

2001 ◽  
Vol 16 (6) ◽  
pp. 1626-1631 ◽  
Author(s):  
A. Karthikeyan ◽  
Rui M. Almeida
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Phase Separation ◽  
Sol Gel ◽  
Force Microscopy ◽  
Pure Silica ◽  
Atomic Force ◽  
Transmission Electron

An investigation of phase separation phenomena in gel and glassy thin films of silica–titania, with TiO2 contents of 20 and 40 mol%, has been carried out by atomic force microscopy (AFM) and transmission electron microscopy (TEM). The thin films were prepared by spin coating of a precursor sol on silicon wafers. Both the TEM measurements (carried out on scrapped thin film flakes) and the AFM measurements (carried out on films coated on the silicon substrates) for samples with different heat treatments suggest that spinodal-like structural inhomogeneities occur in these samples, unlike the corresponding observations in pure silica films, which are known to be homogeneous. Changes in the microstructure of the films have been noticed with the thermal treatment, in agreement with earlier x-ray photoemission studies. The finer characteristic dimensions of the phase separated regions reveal that silica–titania samples prepared by sol-gel processing exhibit a more intimate mixing of the phases.

Comparison between the optical and surface properties of TiO2 and Ag/TiO2 thin films prepared by sol-gel process

2011 ◽  
Vol 1352 ◽  
Author(s):  
Marcelo M. Viana ◽  
Nelcy D. S. Mohallem
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
Refraction Index ◽  
Titanium Isopropoxide ◽  
X Ray Diffraction ◽  
Tio2 Thin Films ◽  
Force Microscopy ◽  
Atomic Force ◽  
Vis Spectroscopy ◽  
Sol Gel Process

ABSTRACTColloidal precursor solutions, obtained from a mixture of titanium isopropoxide, isopropyl alcohol and silver nitrate, were used to fabricate amorphous TiO2 and Ag/TiO2 thin films by sol-gel process. The films were deposited on borosilicate substrates, which were heated at 400 °C for 30 minutes and cooled rapidly to the formation of amorphous coatings. The films were investigated by X-ray diffraction, scanning electron microscopy, atomic force microscopy and UV-vis spectroscopy. The thickness, roughness, refraction index, and particle size of the TiO2 and Ag/TiO2 films were determined and compared. Finally, hydrophobic-hydrophilic property was evaluated to the thin films produced.

Effect of Molar Concentration on Electrically Resistive Lead Titanate Thin Films by Simple Sol-Gel Method

2013 ◽  
Vol 832 ◽  
pp. 379-383 ◽  
Author(s):  
Nurbaya Zainal ◽  
Habibah Zulkefle ◽  
Mohamad Rusop
Keyword(s):  
Thin Films ◽  
Lead Titanate ◽  
Sol Gel ◽  
Physical Property ◽  
Molar Concentration ◽  
Solar Simulator ◽  
Gel Method ◽  
Sol Gel Method ◽  
Force Microscopy ◽  
Atomic Force

Lead titanate thin films were successfully prepared using a simple sol-gel method. In the present study extra Pb excess was not taken into consideration in such a way that the ratio of Pb:Ti is 1:1. Different molar concentration (0.1, 0.2, 0.3, 0.4, and 0.5) involved in this study and it was found that the solutions increased in acidic level by the increment of molar concentration that being measured by pH and conductivity meter (JENWAY-3540). It also indicated that the solutions were electrically resistive at low concentration which might due to the existence of lead and oxygen ionic bonding. The solutions were then deposited onto cleaned glass substrate by spin coating technique indeed to have better thin film homogeneity at room temperature. The prepared thin films were characterized on electrical property considering the resistivity measured by solar simulator (BUKOH KEIKI EP-2000). After that structural and physical property of thin films were observed by atomic force microscopy (Park System, XE-100).

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