3D Analysis of Microstructure Changes Occurring during Creep Tests of Ultra-Fine Grained Materials
2013 ◽
Vol 753
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pp. 46-49
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Keyword(s):
Ion Beam
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Experiments were conducted to determine microstructure changes occurring during thermal exposure in metals processed by equal-channel angular pressing (ECAP). The ECAP pressing was performed at room temperature by route Bc. Static annealing and constant load creep tests in tension were conducted at 0.3-0.5 Tm. The microstructure was examined by scanning electron microscope combined with focus ion beam - TESCAN LYRA 3 equipped with electron back scatter diffraction (EBSD). It was found that creep behaviour is influenced by synergetic effect of additional creep mechanisms like grain boundary sliding, more intensive diffusion processes or recrystallization.