Extrinsic Resonance Effects in a Subresonant Mechanical Spectrometer
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Extrinsic resonance effects observed in a low-frequency subresonant mechanical spectrometer are reported. High resolution of the mechanical spectrometer enables precise measurement of small values of the mechanical loss tangent ( tanϕ = 1- 2 × 10-4) and the apparent high values of the loss tangent detected for extrinsic resonance effects in the vicinity of the eigen frequencies of the spectrometer. Forced oscillations can be used as a ‘signal quality test’ to validate the quality of exponentially damped harmonic oscillations in the resonant mode.
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2007 ◽
Vol 104
(5)
◽
pp. 1150-1153
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2011 ◽
Vol 403-408
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pp. 1817-1822
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