Magnetic Properties of Co Thin Films Evaporated under Normal and Oblique Incidence

2014 ◽  
Vol 215 ◽  
pp. 288-291 ◽  
Author(s):  
Ahmed Kharmouche
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Thick Film ◽  
Oblique Incidence ◽  
Magnetic Layer ◽  
Anisotropy Field ◽  
Gradient Field ◽  
Cobalt Films ◽  
20 Nm ◽  
Deposition Angle

We have evaporated series of Co thin films under vacuum onto silicon and glass substrates at a perpendicular and oblique incidence. The thickness of the magnetic layer ranges from 20 to 400 nm. The static magnetic properties have been performed by means of magnetic force microscopy (M.F.M.) and Alternating Gradient Field Magnetometer (A.G.F.M.) techniques. The influence of the magnetic layer thickness and the deposition angle are studied. As results, it is found a decrease of the coercive field from 250 Oe, for t = 20 nm, to 95 Oe, for t = 400 nm. TheseHcvalues for obliquely evaporated cobalt films are larger than those measured for cobalt films evaporated at normal incidence, found to be equal to a few Oe. It is also found a decrease of the anisotropy field, from 1.6 kOe for the 20 nm Co thick film to 0.95 kOe for the 200 nm Co thick film. Furthermore, an increase of these fields with the increase of the deposition angle is found, as well. The easy axis of the saturation magnetization lies in the film plane, irrespective of the substrate nature. These results, and others, are presented and discussed.

Effect of Thickness on Mechanically Tunable Magnetic Anisotropy of FeGa Thin Films Deposited on Flexible Substrates

2015 ◽  
Vol 815 ◽  
pp. 227-232 ◽  
Author(s):  
Ying Yu ◽  
Shu Hong Xie ◽  
Qing Feng Zhan
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Magnetic Anisotropy ◽  
Effective Strain ◽  
Anisotropy Field ◽  
Saturation Field ◽  
Effective Anisotropy ◽  
Magnetostriction Constant ◽  
The Difference ◽  
Different Strains

A practical way to manipulate the magnetic anisotropy of magnetostrictive FeGa thin films grown on flexible polyethylene terephthalate (PET) substrates is introduced in this study. The effect of film thickness on magnetic properties and magnetostriction constant of polycrystalline FeGa thin films was investigated. The anisotropy field Hk of flexible FeGa films, i.e., the saturation field determined by fitting the hysteresis curves measured along the hard axis, was enhanced with increasing the tensile strain applied along the easy axis of the thin films, but this enhancement via strain became unconspicuous with increasing the thickness of FeGa films. In order to study the magnetic sensitivity of thin films responding to the external stress, we applied different strains on these films and measure the corresponding anisotropy field. Moreover, the effective magnetostriction constant of FeGa films was calculated from the changes of both anisotropy field and external strain based on the Villari effect. A Neel’s phenomenological model was developed to illustrate that the effective anisotropy field of FeGa thin films was contributed from both the constant volume term and the inverse thickness dependent surface term. Therefore, the magnetic properties for the volume and surface of FeGa thin films were different, which has been verified in this work by using vibrating sample magnetometer (VSM) and magneto-optic Kerr effect (MOKE) system. The anisotropy field contributed by the surface of FeGa film and obtained by MOKE is smaller than that contributed by the film volume and measured by VSM. We ascribed the difference in Hk to the relaxation of the effective strain applied on the films with increasing the thickness of films.

Microstructure and Properties of (Tb,Sm)CoSi/Cr Series Thin Films for Permanent Magnets

2007 ◽  
Vol 121-123 ◽  
pp. 267-270 ◽  
Author(s):  
X. Wang ◽  
Z.Y. Li ◽  
X. Yu ◽  
S. Su ◽  
J. Li
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Permanent Magnets ◽  
Magnetic Layer ◽  
Lattice Matching ◽  
Microstructure And Properties ◽  
N2 Atmosphere ◽  
Magnetic Layers

The microstructures and properties of (Tb,Sm)CoSi/Cr series films have been investigated. All the samples were sputtered and annealed at 500 °C for 25 min in pure N2 atmosphere, and their microstructures and properties were examined. The effect on the magnetic properties of partial Sm substituted by Tb is discussed. The lattice matching media were examined. And the mechanisms of interactions among the grains and between the magnetic layers have been analyzed by comparing multi magnetic layer with the mono magnetic layer.

Effects of ZnO layer on anisotropy magnetoresistance of Ni81Fe19 films

2014 ◽  
Vol 28 (06) ◽  
pp. 1450043 ◽  
Author(s):  
Shuyun Wang ◽  
Yuanmei Gao ◽  
Tiejun Gao ◽  
Yuan He ◽  
Hui Zhang ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Magnetron Sputtering ◽  
Substrate Temperature ◽  
Layer Thickness ◽  
Magnetic Thin Films ◽  
Anisotropic Magnetoresistance ◽  
Experimental Conditions ◽  
Method Effects ◽  
20 Nm

A series of Ta (4 nm)/ ZnO (t nm )/ Ni 81 Fe 19 (20 nm)/ ZnO (t nm )/ Ta (3 nm) magnetic thin films were prepared on lower experimental conditions by magnetron sputtering method. Effects of ZnO layer thickness and substrate temperature on anisotropic magnetoresistance and magnetic properties of these Ni 81 Fe 19 films have been investigated. The experiment results show that the anisotropic magnetoresistance value of the Ni 81 Fe 19 film is enhanced with the increasing of the inserted ZnO layer thickness. When the ZnO thickness is 2 nm, the anisotropic magnetoresistance value achieves the maximum. In addition, the anisotropic magnetoresistance of the Ni 81 Fe 19 film is also enhanced with the increasing of substrate temperature, and when the temperature is 450°C, the anisotropic magnetoresistance reaches the maximum. The anisotropic magnetoresistance value of 20 nm Ni 81 Fe 19 films with 2 nm ZnO layer can achieve 3.63% at 450°C which is enhanced 11.6% compare with the films without ZnO layer.

Co3Pt Nanocomposite Films for Perpendicular Magnetic Recording Media

2010 ◽  
Vol 123-125 ◽  
pp. 27-30 ◽  
Author(s):  
Chih Long Shen ◽  
Po Cheng Kuo ◽  
S.C. Chen ◽  
C.D. Chen ◽  
S.L. Hsu ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Process Parameters ◽  
Magnetic Recording ◽  
Magnetic Layer ◽  
Nanocomposite Films ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
Perpendicular Magnetic Recording ◽  
Significant Potential

The Co3Pt magnetic layer with thickness of 7~28 nm was deposited onto the Pt underlayer. The as-deposited Co3Pt/Pt double-layered films with or without a 5 nm Pt capped layer were annealed at temperatures between 275 and 375 °C in vacuum of 1 mTorr. The influences of process parameters on perpendicular magnetic properties of Co3Pt thin films were investigated. The Co3Pt film with perpendicular coercivity (Hc⊥) value of 3620 Oe and the perpendicular squareness (S⊥) of 0.7 could be achieved from the Co3Pt(18 nm)/Pt(100 nm) double-layered films by annealing at 300°C. Further added Tb30Co70 film on the Co3Pt/Pt double-layered film could greatly enhance the perpendicular magnetic properties of the film. The Hc⊥ and S⊥ of the Tb30Co70/Co3Pt/Pt film were as high as 6560 Oe and 0.88, respectively, which has significant potential to be applied in perpendicular magnetic recording media.

Magnetic Properties of Sm-Co Thin Films Prepared by Oblique Incidence

1982 ◽  
Vol 21 (Part 2, No. 10) ◽  
pp. L619-L620 ◽  
Author(s):  
Takao Tanaka ◽  
Makoto Yoshida ◽  
Seiichi Takahashi ◽  
Akira Tasaki
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Oblique Incidence

Adjacent Layer Composition Effects on Fetbco Thin Film Magnetic Properties

1995 ◽  
Vol 384 ◽  
Author(s):  
Michael B. Hintz
Keyword(s):  
Magnetic Properties ◽  
Ion Beam ◽  
Magnetic Layer ◽  
Magnetic Behavior ◽  
Relative Magnitude ◽  
Adjacent Layer ◽  
Energy Product ◽  
Magnetic Layers ◽  
20 Nm ◽  
Layer Composition

ABSTRACTThe magneto-optical (MO) layer in current rare earth-transition metal (RE-TM) based MO recording media is typically 20 nm to 60 nm thick. It has been suggested, however, that media structures employing a multiplicity of thinner MO layers may be advantageous, e.g., for multilevel recording applications [1] or media noise reduction [2]. As magnetic layer thickness is reduced, interactions among magnetic layers and adjacent materials can have an increasingly large influence on magnetic properties; in many instances, these interactions can dominate the observed magnetic behavior.As a means of studying MO layer - adjacent layer interactions, we have used thin (≈3 nm) films of several materials to separate single 24 nm thick ion-beam-deposited FeTbCo layers into N thinner layers of 24/N nm thickness (N × 24/N). As N increases, the FeThCo magnetic properties generally change; however, the relative magnitude of the changes is strongly dependent upon the adjacent layer composition. Magnetization (Ms), energy product (MsHc) at 30 C and Curie temperature data for 1 × 24 nm structures and 6 × 4 nm structures are compared and discussed for specimens employing SiCx, Six, YOx, HfOx, Si and SiOx adjacent layer materials.

scholarly journals Nanocrystallization in FINEMET-Type Fe73.5Nb3Cu1Si13.5B9 and Fe72.5Nb1.5Mo2Cu1.1Si14.2B8.7 Thin Films

Materials ◽  
2020 ◽  
Vol 13 (2) ◽  
pp. 348 ◽  
Author(s):  
Evgeniya A. Mikhalitsyna ◽  
Vasiliy A. Kataev ◽  
Aitor Larrañaga ◽  
Vladimir N. Lepalovskij ◽  
Galina V. Kurlyandskaya
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Magnetic Thin Films ◽  
X Ray Diffraction ◽  
Magnetic Field Sensors ◽  
X Ray ◽  
Plasma Sputtering ◽  
Microelectronic Devices ◽  
Low Dimensional ◽  
20 Nm

A growing variety of microelectronic devices and magnetic field sensors as well as a trend of miniaturization demands the development of low-dimensional magnetic materials and nanostructures. Among them, soft magnetic thin films of Finemet alloys are appropriate materials for sensor and actuator devices. Therefore, one of the important directions of the research is the optimization of thin film magnetic properties. In this study, the structural transformations of the Fe73.5Nb3Cu1Si13.5B9 and Fe72.5Nb1.5Mo2Cu1.1Si14.2B8.7 films of 100, 150 and 200 nm thicknesses were comparatively analyzed together with their magnetic properties and magnetic anisotropy. The thin films were prepared using the ion-plasma sputtering technique. The crystallization process was studied by certified X-ray diffraction (XRD) methods. The kinetics of crystallization was observed due to the temperature X-ray diffraction (TDX) analysis. Magnetic properties of the films were studied by the magneto-optical Kerr microscopy. Based on the TDX data the delay of the onset crystallization of the films with its thickness decreasing was shown. Furthermore, the onset crystallization of the 150 and 200 nm films began at the temperature of about 400–420 °C showing rapid grain growth up to the size of 16–20 nm. The best magnetic properties of the films were formed after crystallization after the heat treatment at 350–400 °C when the stress relaxation took place.

Soft Magnetic Properties of [Fe80Ni20-O/NiZn-Ferrite]n Multilayer Thin Films for High Frequency Application

2014 ◽  
Vol 488-489 ◽  
pp. 174-177
Author(s):  
Rui Xu ◽  
Lai Sen Wang ◽  
Xiao Long Liu ◽  
Meng Lei ◽  
Qing Luo ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Layer Thickness ◽  
High Frequency ◽  
Anisotropy Field ◽  
Soft Magnetic Properties ◽  
Multilayer Thin Films ◽  
Insulation Layer ◽  
Soft Magnetic ◽  
Measured Resistivity

In this research, a series of [Fe80Ni20-O/NiZn-ferritn multilayer thin films with different insulation layer thickness were prepared by magnetron sputtering at room temperature. The high frequency soft magnetic properties of [Fe80Ni20-O/NiZn-ferritn multilayer thin films were investigated. It was found that the in-plane magnetic anisotropy field (Hk) and saturation magnetizations (4πMs) can be adjusted by changing the insulation layer thickness, and the optimal Hk and 4πMs can be obtained as the insulation layer thickness of 2.5 nm. The adjustment of insulation layer thickness is essential to obtain low coercivity (Hc) and high permeability (μ) of the multilayer thin films. The measured resistivity (ρ) of [Fe80Ni20-O/NiZn-ferritn multilayer thin films was increased from 211 to 448 μΩcm with increasing the insulation layer thickness.

Structural and Magnetic Properties of Annealed Vapor Deposited CoxCr1-x Thin Films

2015 ◽  
Vol 233-234 ◽  
pp. 709-712
Author(s):  
Ahmed Kharmouche
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Rutherford Backscattering Spectrometry ◽  
Gradient Field ◽  
Cell Parameters ◽  
Glass Substrates ◽  
Stiffness Constant ◽  
Structural And Magnetic Properties ◽  
Hcp Structure ◽  
Deposited Films

Abstract. We prepared, under vacuum and onto monocrystalline silicone and glass substrates, series of CoxCr1-x thin films, with x ranging from 0.80 to 0.88. The structural and magnetic properties of the as deposited films have been performed using Rutherford backscattering spectrometry (R.B.S.), X-ray diffraction (X.R.D.), Alternating Gradient Field Magnetometer (A.G.F.M.), and Brillouin Light Spectrometry (B.L.S.) techniques. Once the films being annealed under vacuum, for 1 h at 700°C, in a pre-heated furnace, their structural and magnetic properties have been performed, by these tools, as well. Significant results have been found. The as deposited films present only an HCP structure and show a preferred orientation. The annealed films present both HCP and FCC structures. The annealed films possess cell parameters greater than the bulk ones which infer that they are under a tensile stress. The cell parameters of the as deposited films are lower than the bulk ones which infer that they are under a compressive stress. Up to the annealing temperature the films are still ferromagnetic and some decrease of the magnetic moment is noticed. In addition, coercivity and squareness have been strongly improved in the annealed films comparatively to the as deposited films. Moreover, the stiffness constant, computed using Brillouin light scattering measurements and after adjustment of theoretical and experimental results, is found to be far lesser than pure Co one. These results and others will be presented and discussed.

Effect of Thicknesses on the Microstructure and Magnetic Properties of CoPt Thin Films

2010 ◽  
Vol 123-125 ◽  
pp. 655-658 ◽  
Author(s):  
Chih Long Shen ◽  
Po Cheng Kuo ◽  
G.P. Lin ◽  
Y.S. Li ◽  
Sin Liang Ou ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Magnetic Properties ◽  
Glass Substrate ◽  
Signal To Noise Ratio ◽  
Energy Difference ◽  
Continuous Film ◽  
High Density Magnetic Recording ◽  
20 Nm ◽  
Nano Size

The microstructures and magnetic properties of CoPt thin films with thicknesses between 1 and 20 nm deposited on amorphous glass substrate and post-annealing at 600°C for 30 min were investigated. The morphology of CoPt thin film would change from a discontinuous nano-size CoPt islands into a continuous film gradually as the film thickness was increased from 1 to 20 nm. The formation mechanism of the CoPt islands may be due to the surface energy difference between the glass substrate and CoPt alloy. Each CoPt island could be a single domain particle. This discontinuous nano-island CoPt recording film may increase the recording density and enhance the signal to noise ratio while comparing with the continuous film. The as-deposited 5 nm CoPt film revealed the separated islands morphology after annealing at 600°C for 30 min. This nano-size CoPt thin film may be a candidate for ultra-high density magnetic recording media due to its discontinuous islanded nanostructure.

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