Magnetic Properties of Co-B Nanostructures Prepared via Electroless Deposition

2015 ◽  
Vol 233-234 ◽  
pp. 648-652
Author(s):  
David Richardson ◽  
Fernando M.F. Rhen
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Magnetic Anisotropy ◽  
Electroless Deposition ◽  
Deposition Time ◽  
Magnetic Measurements ◽  
Deposition Process ◽  
Specific Magnetization

We have investigated the magnetic properties of nanostructured Co-B alloys, that were prepared via electroless deposition. The deposition process results in the formation of a nanostructure consisting of nanotubes connected to thin films at both ends. Depending on the deposition time end-open or end-closed nanotubes can be formed. The overall nanostructure of Co-B deposit has a specific magnetization of 65.6 ± 8 JT-1Kg-1 (0.75 ± 0.09 μB per Co atom). We also investigated the anisotropy of the nanostructure by carrying out magnetic measurements with and without the top and base films. We only observed magnetic anisotropy in nanostructures with thin films, which had minimum coercivities of 557 A/m (7 Oe) and 4536 A/m (57 Oe) measured parallel and perpendicular to the nanotube axis. The nanotubes do not show any significant anisotropy with coercivities of 8753 A/m (110 Oe) and 7161 A/m (90 Oe) parallel and perpendicular to the nanotube axis.

scholarly journals Structural and Magnetic Properties of FePd Thin Film Synthesized by Electrodeposition Method

Materials ◽  
2020 ◽  
Vol 13 (6) ◽  
pp. 1454
Author(s):  
Gabriele Barrera ◽  
Federico Scaglione ◽  
Matteo Cialone ◽  
Federica Celegato ◽  
Marco Coïsson ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Magnetic Properties ◽  
Deposition Time ◽  
Magnetic Measurements ◽  
X Ray Diffraction ◽  
X Ray ◽  
Fundamental Properties ◽  
Magnetic Features ◽  
Application Fields

Bimetallic nanomaterials in the form of thin film constituted by magnetic and noble elements show promising properties in different application fields such as catalysts and magnetic driven applications. In order to tailor the chemical and physical properties of these alloys to meet the applications requirements, it is of great importance scientific interest to study the interplay between properties and morphology, surface properties, microstructure, spatial confinement and magnetic features. In this manuscript, FePd thin films are prepared by electrodeposition which is a versatile and widely used technique. Compositional, morphological, surface and magnetic properties are described as a function of deposition time (i.e., film thickness). Chemical etching in hydrochloric acid was used to enhance the surface roughness and help decoupling crystalline grains with direct consequences on to the magnetic properties. X-ray diffraction, SEM/AFM images, contact angle and magnetic measurements have been carried out with the aim of providing a comprehensive characterisation of the fundamental properties of these bimetallic thin films.

Effect of Stress-induced Magnetic Anisotropy on the Properties of Giant Magnetostrictive Single Layer and Multilayer Thin Films

2004 ◽  
Vol 855 ◽  
Author(s):  
J. H. Tan ◽  
V. H. Guerrero ◽  
R. C. Wetherhold ◽  
W. A. Anderson
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Magnetic Anisotropy ◽  
Rf Sputtering ◽  
Single Layer ◽  
Annealing Treatment ◽  
Deposition Process ◽  
Vacuum System ◽  
Internal Stresses ◽  
Sensors And Actuators

ABSTRACTGiant magnetostrictive thin films deposited on nonmagnetic substrates can constitute effective sensors and actuators for microdevices. In this work, we investigated the effects of a stress-induced anisotropy on the magnetic properties of Tb0.4Fe0.6, Fe0.5Co0.5 single layer films and [Tb0.4Fe0.6/Fe0.5Co0.5]n multilayers deposited on Si substrates. The magnetostrictive thin films were fabricated by means of RF sputtering and were subjected to a post-deposition annealing treatment. The uniaxial magnetic anisotropy was induced by bending the substrate before deposition and then allowing it to resume its original flat shape after depositing the film. The heat treatment was performed in a vacuum system with a vacuum of 10−6 Torr. The magnetic properties of the fabricated specimens were measured using a SQUID. SEM and XRD analyses were performed to ensure that the thermal treatment would relax the internal stresses induced during the deposition process without crystallizing the film. The thickness of the single layer thin films studied was between 300 and 800 nm while multilayer samples consisted of 6 layers with each layer thickness ranged from about 20 to 40 nm. Compared to single layer samples, multilayer samples with stress anneal growth exhibited an improvement in magnetic saturation by a factor of two while maintaining a low coercive field. Manipulations of the magnitude and direction of magnetic anisotropy was observed by introducing various values of tensile and compressive stress into the film.

Effect of Thickness on Mechanically Tunable Magnetic Anisotropy of FeGa Thin Films Deposited on Flexible Substrates

2015 ◽  
Vol 815 ◽  
pp. 227-232 ◽  
Author(s):  
Ying Yu ◽  
Shu Hong Xie ◽  
Qing Feng Zhan
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Magnetic Anisotropy ◽  
Effective Strain ◽  
Anisotropy Field ◽  
Saturation Field ◽  
Effective Anisotropy ◽  
Magnetostriction Constant ◽  
The Difference ◽  
Different Strains

A practical way to manipulate the magnetic anisotropy of magnetostrictive FeGa thin films grown on flexible polyethylene terephthalate (PET) substrates is introduced in this study. The effect of film thickness on magnetic properties and magnetostriction constant of polycrystalline FeGa thin films was investigated. The anisotropy field Hk of flexible FeGa films, i.e., the saturation field determined by fitting the hysteresis curves measured along the hard axis, was enhanced with increasing the tensile strain applied along the easy axis of the thin films, but this enhancement via strain became unconspicuous with increasing the thickness of FeGa films. In order to study the magnetic sensitivity of thin films responding to the external stress, we applied different strains on these films and measure the corresponding anisotropy field. Moreover, the effective magnetostriction constant of FeGa films was calculated from the changes of both anisotropy field and external strain based on the Villari effect. A Neel’s phenomenological model was developed to illustrate that the effective anisotropy field of FeGa thin films was contributed from both the constant volume term and the inverse thickness dependent surface term. Therefore, the magnetic properties for the volume and surface of FeGa thin films were different, which has been verified in this work by using vibrating sample magnetometer (VSM) and magneto-optic Kerr effect (MOKE) system. The anisotropy field contributed by the surface of FeGa film and obtained by MOKE is smaller than that contributed by the film volume and measured by VSM. We ascribed the difference in Hk to the relaxation of the effective strain applied on the films with increasing the thickness of films.

scholarly journals Deposition Time induced Structural and Optical Properties of Lead Tin Sulphide Thin Films

2021 ◽  
pp. 455-458
Author(s):  
J. Damisa ◽  
J. O. Emegha ◽  
I. L. Ikhioya
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Optical Properties ◽  
Absorption Coefficient ◽  
Tin Oxide ◽  
Deposition Time ◽  
Deposition Process ◽  
Structural And Optical Properties ◽  
X Ray ◽  
Prepared Material

Lead tin sulphide (Pb-Sn-S) thin films (TFs) were deposited on fluorine-doped tin oxide (FTO) substrates via the electrochemical deposition process using lead (II) nitrate [Pb(NO3)2], tin (II) chloride dehydrate [SnCl2.2H2O] and thiacetamide [C2H5NS] precursors as sources of lead (Pb), tin (Sn) and sulphur (S). The solution of all the compounds was harmonized with a stirrer (magnetic) at 300k. In this study, we reported on the improvements in the properties (structural and optical) of Pb-Sn-S TFs by varying the deposition time. We observed from X-ray diffractometer (XRD) that the prepared material is polycrystalline in nature. UV-Vis measurements were done for the optical characterizations and the band gap values were seen to be increasing from 1.52 to 1.54 eV with deposition time. In addition to this, the absorption coefficient and refractive index were also estimated and discussed.

Residual Stresses and Magnetoelastic Coupling in Ultrathin Fe Films Deposited on GaAs(001)

2000 ◽  
Vol 615 ◽  
Author(s):  
P. Gergaud ◽  
C. Lallaizon ◽  
M. Putero ◽  
B. Lépine ◽  
O. Thomas ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Anisotropy ◽  
Magnetic Measurements ◽  
Strain Tensor ◽  
Magnetic Thin Films ◽  
Lattice Parameter ◽  
Parameter Mismatch ◽  
Magnetoelastic Coupling ◽  
Small Lattice ◽  
Open Question

ABSTRACTThe growing interest in the behavior of magnetic thin films on semiconductor substrates is due in part to their potential application in spin-sensitive heterostructure devices. High-quality epitaxial Fe(001) thin films can be grown on GaAs(001) substrates because of the small lattice parameter mismatch (−1.4%). Magnetic measurements performed on Fe films thinner than 3 nm have shown that such films exhibit an in-plane uniaxial magnetic anisotropy although an ideal bcc Fe(001) film should have fourfold symmetry. The source of this uniaxial component remains an open question and one of the mechanisms which may contribute to this is the epitaxial strain, through magnetoelastic coupling. Very small strains anisotropies are able to modify the magnetic anisotropy of iron thin films. Moreover the sign and magnitude of the magnetoelastic coupling seem to depend on the film thickness or film strain [1]. In this study, the strain tensor components in two Fe thin films (1.7 and 3.0 nm thick) has been measured by XRD. The magnetic free energy has been derived, using the strain tensor components.

ELECTRONIC STRUCTURES AND REORIENTATION OF PERPENDICULAR MAGNETIC ANISOTROPY OF Co/Au(111) and Co/Pd(111)

2002 ◽  
Vol 09 (02) ◽  
pp. 865-869
Author(s):  
M. SAWADA ◽  
K. HAYASHI ◽  
A. KAKIZAKI
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Binding Energy ◽  
Film Thickness ◽  
Magnetic Anisotropy ◽  
Photoelectron Spectroscopy ◽  
Electronic Structures ◽  
Perpendicular Magnetic Anisotropy ◽  
Magnetization Direction ◽  
Electronic And Magnetic Properties

We have investigated electronic and magnetic properties of Co thin films epitaxially grown on Au(111) and Pd(111) substrates by spin- and angle-resolved photoelectron spectroscopy. In the Co/Au(111) system, the magnetization direction of Co changes from perpendicular to parallel to the surface at about 6 ML. The origin of the reorientation is qualitatively explained by the increasing contribution of Co 3d orbitals perpendicular to the surface. In the Co/Pd(111) system, the reorientation of the magnetization direction occurs at about 4 ML, the origin of which is explained as being due to the contribution of the upper Λ3 band of Co with increase of film thickness as in the case of the Co/Au(111) system. The stronger hybridization between Co 3d and Pd 4d states in the Co/Pd(111) system causes larger binding energy shifts of the Λ3 states than in the Co/Au(111) system.

scholarly journals Surface roughness minimum: Ag thin layer deposited on a glass

2001 ◽  
Vol 66 (7) ◽  
pp. 483-490 ◽  
Author(s):  
R. Petrovic ◽  
S. Strbac ◽  
N. Bundaleski ◽  
Z. Rakocevic
Keyword(s):  
Thin Films ◽  
Surface Roughness ◽  
Thin Layer ◽  
Layer Thickness ◽  
Deposition Rate ◽  
Turning Point ◽  
Deposition Time ◽  
Substrate Surface ◽  
Deposition Process ◽  
Silver Thin Films

In this paper the results of an examination of the surface roughness and morphology dependence of silver thin films up to 100 nm thick deposited on a microscope glass on the deposition rate and on the deposition time are presented. It was found that, for a constant deposition rate, the surface roughness exhibits minimum at a certain layer thickness. This coincides with the turning point when the influence of the substrate surface on the deposition process becomes negligible, i.e., to the change in the nature of the system substrate/deposit from Ag/glass to Ag/Ag. For a constant layer thickness, sthe surface roughness minimum, achieved at a certain deposition rate, coincides to the turning point when the average free path for vertical adatom mobility becomes zero.

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