High-Aspect Ratio Planarization using Self-Leveling Materials

2012 ◽  
Vol 2012 (DPC) ◽  
pp. 002567-002586
Author(s):  
Michelle Fowler ◽  
Dongshun Bai ◽  
Curt Planje ◽  
Xie Shao

There are an increasing number of applications in the microelectronics industry that require materials that can fill and planarize high-aspect ratio topography. These applications call for the formation of a flat coating surface without the use of high bake temperatures or high-pressure processes. Potential device markets include MEMS, 3D-ICs, LEDs, semiconductors, flat panel displays and related microelectronic and optoelectronic devices. Various polymeric coating materials have been developed that have intrinsic self-leveling properties and are able to fill deep trenches and holes found on microelectronic substrates without forming voids. These new materials are able to reflow at modest baking temperatures (50–100 °C) and can fill high-aspect ratio features (10:1) by spin coating single or multiple layers of material over the topography. Several of these polymeric materials remain soluble in TMAH (and other aqueous bases), some are photosensitive, and all materials are compatible with industry-accepted solvents. Results from extended process development work on self-leveling polymeric materials will be discussed and comparisons made to industry-accepted practices.

Author(s):  
Chad Rue

Abstract FIB column performance can be difficult to evaluate, and the traditional metrics of imaging resolution and minimum spot size give little indication of how a FIB system will perform its intended daily tasks. A series of supplemental FIB performance tests is proposed to quantify “milling acuity” under real-world conditions. A quantitative measuring scheme for evaluating the quality of High Aspect Ratio (HAR) vias is proposed, and an example is shown in which the HAR measuring scheme can be used for process development.


Open Physics ◽  
2012 ◽  
Vol 10 (5) ◽  
Author(s):  
Stefan Brzeziński ◽  
Tomasz Rybicki ◽  
Iwona Karbownik ◽  
Grażyna Malinowska ◽  
Katarzyna Śledzińska

AbstractStudies have been carried out aimed at the development of structures and technology for making special multi-layer textile-polymeric systems of shielding electromagnetic field (EMF). The use of textiles as EMF shielding materials is commonly known, however the EMF attenuation obtained practically exclusively results from the reflection of EMF, while the materials used for this purpose as a rule, show poor EMF absorption abilities. The basic assumption for a new solution is the exploitation of the multiple internal reflection of incident EMF either in textile-polymeric coating materials containing fine-particle electromagnetic materials or in special textile structures. This paper presents the results of investigating the EMF shielding effectiveness of several selected and developed textile-polymeric materials in respect of both their practical applications (protective clothing elements, technical materials, masking elements, etc.) and the structure and content of components with various EMF reflection and absorption properties. The measurement method for independent determination of reflection and transmission coefficients with a wavequide applicator was used. The results obtained with the 2.5 GHz to 18 GHz frequency range show a low value of transmission coefficient (min. −35 dB) and accepted reflection attenuation from about −4 dB to −15 dB for higher frequencies.


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